-
Patent Agency Ranking
公开(公告)号：US08455821B2
公开(公告)日：2013-06-04
申请号：US12446387
申请日：2007-10-22
Applicant: Jason Arjavac , Pei Zou , David James Tasker , Maximus Theodorus Otten , Gerhard Daniel
Inventor： Jason Arjavac , Pei Zou , David James Tasker , Maximus Theodorus Otten , Gerhard Daniel
CPC classification number: G01N1/28 , G01N1/06 , G01N1/08 , G01N1/32 , G01N23/04 , H01J37/06 , H01J37/18 , H01J37/20 , H01J37/26 , H01J37/28 , H01J37/3056 , H01J2237/063 , H01J2237/182 , H01J2237/204 , H01J2237/208 , H01J2237/2802 , H01J2237/31745 , H01J2237/31749
Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (
Abstract translation: 一种用于S / TEM样品制备和分析的改进方法和装置。 本发明的优选实施例提供用于TEM样品制备的改进方法，特别是对于小几何（<100nm厚）TEM薄片。 本发明的优选实施例还通过提供部分或全部自动化TEM样品制作的方法来提供在诸如集成电路或半导体晶片上制造的其它结构的物体上的基于S / TEM的测量的在线方法，以使得创建过程 并分析TEM样品减少劳动密集度，并提高TEM分析的产量和再现性。
-
2.发明授权公开(公告)号：US07485397B2
公开(公告)日：2009-02-03
申请号：US11183575
申请日：2005-07-18
Applicant: Wolfgang Eck , Martin Gutfleisch , Gerhard Daniel Peiter , Matthias Schlörholz
Inventor： Wolfgang Eck , Martin Gutfleisch , Gerhard Daniel Peiter , Matthias Schlörholz
CPC classification number: B41N3/038 , C07F9/3808
Abstract: A reusable printing plate, in particular for use both in wet offset printing and in dry offset printing, includes a printing area and a metal oxide surface treated with at least one fluorinated phosphonic acid. A printing press and a printing unit having the printing plate, a process for imaging the printing plate and a process for preparation of a fluorinated organic phosphonic acid are also provided.
Abstract translation: 特别是用于湿胶版印刷和干胶版印刷的可重复使用的印版包括用至少一种氟化膦酸处理的印刷区域和金属氧化物表面。 还提供了一种印刷机和具有该印版的印刷单元，一种印版成像方法和一种制备氟化有机膦酸的方法。
-
公开(公告)号：US08357913B2
公开(公告)日：2013-01-22
申请号：US12446376
申请日：2007-10-20
Applicant: Enrique Agorio , James Edgar Hudson , Michael Tanguay , Jason Arjavac , Gerhard Daniel
Inventor： Enrique Agorio , James Edgar Hudson , Michael Tanguay , Jason Arjavac , Gerhard Daniel
CPC classification number: H01J37/20 , G01N1/286 , G01N1/32 , G01N2001/2873 , G01N2001/2886 , G01R31/2893 , H01J37/26 , H01J37/28 , H01J37/285 , H01J37/31 , H01J2237/202 , H01J2237/2802 , H01J2237/2812 , H01J2237/3109 , H01J2237/3114 , H01J2237/31745
Abstract: An improved method and apparatus for extracting and handling samples for STEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput.
Abstract translation: 一种用于提取和处理STEM分析样品的改进方法和装置。 本发明的优选实施例利用显微操纵器和使用真空压力的中空微探针探针将微针尖附着到样品上。 通过通过微针尖向薄片施加小的真空压力，可以比通过单独使用静电力更牢固地保持薄片并且其布置更准确。 通过使用具有倾斜尖端并且也可围绕其长轴旋转的探针，所提取的样品可以平放放置在样品架上。 这样可以精确控制样品放置和取向，从而大大提高分析和产量的可预测性。
-
公开(公告)号：US20110006207A1
公开(公告)日：2011-01-13
申请号：US12446387
申请日：2007-10-22
Applicant: Jason Arjavac , Pei Zou , David James Tasker , Maximus Theodorus Otten , Gerhard Daniel
Inventor： Jason Arjavac , Pei Zou , David James Tasker , Maximus Theodorus Otten , Gerhard Daniel
CPC classification number: G01N1/28 , G01N1/06 , G01N1/08 , G01N1/32 , G01N23/04 , H01J37/06 , H01J37/18 , H01J37/20 , H01J37/26 , H01J37/28 , H01J37/3056 , H01J2237/063 , H01J2237/182 , H01J2237/204 , H01J2237/208 , H01J2237/2802 , H01J2237/31745 , H01J2237/31749
Abstract: An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry (
Abstract translation: 一种用于S / TEM样品制备和分析的改进方法和装置。 本发明的优选实施例提供用于TEM样品制备的改进方法，特别是对于小几何（<100nm厚）TEM薄片。 本发明的优选实施例还通过提供部分或全部自动化TEM样品制作的方法来提供在诸如集成电路或半导体晶片上制造的其它结构的物体上的基于S / TEM的测量的在线方法，以使得创建过程 并分析TEM样品减少劳动密集度，并提高TEM分析的产量和再现性。
-
公开(公告)号：US20100305747A1
公开(公告)日：2010-12-02
申请号：US12446376
申请日：2007-10-20
Applicant: Enrique Agorio , James Edgar Hudson , Gerhard Daniel , Michael Tanguay , Jason Arjavac
Inventor： Enrique Agorio , James Edgar Hudson , Gerhard Daniel , Michael Tanguay , Jason Arjavac
CPC classification number: H01J37/20 , G01N1/286 , G01N1/32 , G01N2001/2873 , G01N2001/2886 , G01R31/2893 , H01J37/26 , H01J37/28 , H01J37/285 , H01J37/31 , H01J2237/202 , H01J2237/2802 , H01J2237/2812 , H01J2237/3109 , H01J2237/3114 , H01J2237/31745
Abstract: An improved method and apparatus for extracting and handling samples for S/TEM analysis. Preferred embodiments of the present invention make use of a micromanipulator and a hollow microprobe probe using vacuum pressure to adhere the microprobe tip to the sample. By applying a small vacuum pressure to the lamella through the microprobe tip, the lamella can be held more securely and its placement controlled more accurately than by using electrostatic force alone. By using a probe having a beveled tip and which can also be rotated around its long axis, the extracted sample can be placed down flat on a sample holder. This allows sample placement and orientation to be precisely controlled, thus greatly increasing predictability of analysis and throughput
Abstract translation: 一种用于提取和处理样品用于S / TEM分析的改进方法和装置。 本发明的优选实施例利用显微操纵器和使用真空压力的中空微探针探针将微针尖附着到样品上。 通过通过微针尖向薄片施加小的真空压力，可以比通过单独使用静电力更牢固地保持薄片并且其布置更准确。 通过使用具有倾斜尖端并且也可围绕其长轴旋转的探针，所提取的样品可以平放放置在样品架上。 这样可以精确控制样品放置和取向，从而大大提高分析和产量的可预测性
-
-
-
-
Search Results
5
records
(took 0.021 seconds)
