Multi-chip stack package
    1.
    发明申请
    Multi-chip stack package 有权
    多芯片堆栈包

    公开(公告)号:US20060091560A1

    公开(公告)日:2006-05-04

    申请号:US11258137

    申请日:2005-10-26

    Abstract: A multi-chip stack package mainly comprises a substrate, a first chip, a redistribution structure and at least one second chip. The first chip is disposed on the substrate by an active surface facing upwards. The redistribution structure comprises a plurality of first intermediate pads, a plurality of second intermediate pads and a plurality of external pads. The first intermediate pads, the second intermediate pads, and the external pads are formed on the first active surface of the first chip, wherein the first intermediate pads and the second intermediate pads are electrically connected with each other. The second chip is disposed on the redistribution structure, and electrically connected to the first intermediate pads. The second intermediate pads are electrically connected to the substrate through a plurality of bonding wires, so that the second chip and the substrate are electrically conducted, and the connection length of the bonding wires is reduced.

    Abstract translation: 多芯片堆叠封装主要包括基板,第一芯片,再分配结构和至少一个第二芯片。 第一芯片通过面向上的有源表面设置在基板上。 再分布结构包括多个第一中间焊盘,多个第二中间焊盘和多个外部焊盘。 第一中间焊盘,第二中间焊盘和外部焊盘形成在第一芯片的第一有源表面上,其中第一中间焊盘和第二中间焊盘彼此电连接。 第二芯片设置在再分布结构上,并且电连接到第一中间焊盘。 第二中间焊盘通过多个接合线电连接到基板,使得第二芯片和基板被导电,并且键合线的连接长度减小。

    Multi-chip stack package
    4.
    发明授权
    Multi-chip stack package 有权
    多芯片堆栈包

    公开(公告)号:US07218006B2

    公开(公告)日:2007-05-15

    申请号:US11258137

    申请日:2005-10-26

    Abstract: A multi-chip stack package mainly includes a substrate, a first chip, a redistribution structure and at least one second chip. The first chip is disposed on the substrate with an active surface facing upwards. The redistribution structure includes a plurality of first intermediate pads, a plurality of second intermediate pads and a plurality of external pads. The first intermediate pads, the second intermediate pads, and the external pads are formed on the first active surface of the first chip, wherein the first intermediate pads and the second intermediate pads are electrically connected with each other. The second chip is disposed on the redistribution structure, and electrically connected to the first intermediate pads. The second intermediate pads are electrically connected to the substrate through a plurality of bonding wires, so that the second chip and the substrate are electrically conducted, and the connection length of the bonding wires is reduced.

    Abstract translation: 多芯片堆叠封装主要包括衬底,第一芯片,再分配结构和至少一个第二芯片。 第一芯片设置在基板上,其表面朝上。 再分配结构包括多个第一中间焊盘,多个第二中间焊盘和多个外部焊盘。 第一中间焊盘,第二中间焊盘和外部焊盘形成在第一芯片的第一有源表面上,其中第一中间焊盘和第二中间焊盘彼此电连接。 第二芯片设置在再分布结构上,并且电连接到第一中间焊盘。 第二中间焊盘通过多个接合线电连接到基板,使得第二芯片和基板被导电,并且键合线的连接长度减小。

    TEST APPARATUS FOR PCI CARD
    8.
    发明申请
    TEST APPARATUS FOR PCI CARD 审中-公开
    PCI卡测试装置

    公开(公告)号:US20120246371A1

    公开(公告)日:2012-09-27

    申请号:US13097105

    申请日:2011-04-29

    CPC classification number: G01R31/2808

    Abstract: A test apparatus includes a circuit board and a peripheral component interconnect (PCI) expansion slot. A number of golden fingers are arranged at a first side of the circuit board. A second side of the circuit board is connected to a bottom of the PCI expansion slot. The golden fingers are electrically connected to the PCI expansion slot. A number of first test pads and second test pads are arranged on the circuit board between the first and second sides. The first and second test pads have different shapes, sizes, and/or colors. The first and second test pads are electrically connected to the PCI expansion slot correspondingly.

    Abstract translation: 测试装置包括电路板和外围组件互连(PCI)扩展槽。 在电路板的第一侧布置有多个金指。 电路板的第二面连接到PCI扩展槽的底部。 金手指电连接到PCI扩展槽。 在第一和第二侧之间的电路板上布置有多个第一测试焊盘和第二测试焊盘。 第一和第二测试垫具有不同的形状,尺寸和/或颜色。 第一和第二测试垫相应地电连接到PCI扩展槽。

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