Abstract:
In one embodiment, a method of manufacturing an RFID label includes providing a web structure comprising a dielectric layer and a metal layer; depositing a non-removable resist on the metal layer, the deposition of the non-removable resist defining an antenna; depositing a removable resist on the metal layer, the deposition of the removable resist defining connection pads for connecting an integrated circuit (IC) to the antenna; etching the metal layer to form the antenna and the connection pads; removing the removable resist from the metal layer to expose the connection pads; and attaching the IC to the connection pads.
Abstract:
A transmitter communicates with a receiver and an error corrector corrects bit errors generated during data transmission. The transmitter has a scrambler unit that scrambles data so that a running disparity of 0 and 1 in the input data is substantially zero. A bit-string converting unit 15 that adds bit data for ensuring a maximum run length of a serial bit string of the scrambled data and converts control information to bit data of a fixed value. A synchronization timing generating unit 16 divides the transmitted data by a constant interval and converts the transmission data to a data block. A bit-string converting unit extracts a fixed-value bit pattern of the control data from the bit string of the data block, converts the bit pattern to the control information, and discriminates the data and the control information. A descrambler unit reconverts the data-scrambled data to the data before scrambling.
Abstract:
An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.
Abstract:
A first transistor group, a second transistor group, and an electrode pad are formed on a semiconductor substrate. A first protective film is formed so as to cover the semiconductor substrate except for an upper region of the electrode pad. The second protective film which generates a stress in a projecting direction is formed so as to cover the first protective film except for an upper region of the first transistor group. A transistor ability of the first transistor group is varied to be relatively higher due to a presence of the second protective film, based on a transistor ability of the second transistor group, as a reference.
Abstract:
A manufacturing method of a thin film semiconductor substrate includes implanting ions at a specified depth into a semiconductor substrate, forming a bubble layer in the semiconductor substrate by vaporizing the ions through heating, bonding an insulating substrate onto the semiconductor substrate, and cleaving the semiconductor substrate along the bubble layer to form a semiconductor thin film on a side of the insulating substrate. At the forming, the semiconductor substrate is heated at a temperature in a temperature range of approximately 1000° C. to 1200° C. for a duration in a range of approximately 10 μs to 100 ms. The heating of the semiconductor substrate is performed by using, for example, a light beam.
Abstract:
In the context of a notebook computer, multiple battery safety measures in the computer, battery pack, and individual battery cells. These battery packs include industry standard safety mechanisms as well as additional safeguards designed to increase safety. The additional safeguards can be categorized in the following ways. The first safeguard deals with multiple, independent levels of battery monitoring. The second safeguard employs abnormal condition detection methods. The third safeguard deals with improvements to mechanical and thermal design.
Abstract:
An exhaust gas purification device in which catalysts are efficiently activated and in which pressure loss caused by deposition of particulates exhausted from an internal combustion engine is suppressed. The exhaust gas purification device has a first purification section and a second purification section. The first purification section has a metal honeycomb structure where a first oxidation catalyst is carried. The second purification section is placed on the downstream side of the first purification section and has a particulate filter that carries different amounts of second oxidation catalysts on the upstream side and on the downstream side of an exhaust gas route.
Abstract:
During a process of closing of a shutter of a disk device, a position of the shutter is detected. A first shutter position indicator indicative of a first position of the shutter and a second shutter position indicator indicative of a second position, which is immediately before the first position, are calculated. Whether a disk is pinched by the shutter is determined based on comparison of a predetermined threshold and the difference between the first shutter position indicator and the second shutter position indicator.
Abstract:
An uppermost one of multilayered electrode pads, on which a bump and a plating coat will be formed, is made of metal having high ionization tendency, particularly, Al. On the other hand, an uppermost one of multilayered electrode pads, on which none of the bump and the plating coat will be formed, is made of metal having low ionization tendency, particularly, Cu.
Abstract:
A maintenance information management method comprising steps of: by a terminal processing apparatus, transmitting, to a management apparatus via a network, maintenance work information about an analyzer on which maintenance work has been performed; storing, in a maintenance work information storage section of the management apparatus, the maintenance work information transmitted via the network; and transmitting, to the terminal processing apparatus via the network, the maintenance work information of the analyzer, which is stored in the maintenance work information storage section.