Etching of a phosphosilicate glass film selectively implanted with boron
    6.
    发明授权
    Etching of a phosphosilicate glass film selectively implanted with boron 失效
    蚀刻选择性注入硼的磷硅玻璃薄膜

    公开(公告)号:US4634494A

    公开(公告)日:1987-01-06

    申请号:US760135

    申请日:1985-07-29

    摘要: The etch rate of phosphosilicate glass becomes lowered as boron ions are implanted therein. In accordance with the principle of the present invention, boron ions are implanted into a phosphosilicate glass film selectively in location or concentration and the thus boron-implanted phosphosilicate glass film is etched by an etchant, for example buffered hydrofluoric acid solution, to etch an intended portion of the phosphosilcate glass film preferentially thereby defining a hole, such as a contact hole, or substantially flat surface.

    摘要翻译: 磷硅玻璃的蚀刻速率随着硼离子注入而降低。 根据本发明的原理,在位置或浓度上选择性地将硼离子注入磷硅玻璃膜中,并且通过蚀刻剂(例如缓冲氢氟酸溶液)蚀刻硼注入的磷硅酸盐玻璃膜,以蚀刻预期的 磷硅酸盐玻璃膜的一部分优先从而限定孔,例如接触孔或基本平坦的表面。