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公开(公告)号:US20130044549A1
公开(公告)日:2013-02-21
申请号:US13210194
申请日:2011-08-15
申请人: Akira Goda , Shafqat Ahmed , Khaled Hasnat , Krishna K. Parat
发明人: Akira Goda , Shafqat Ahmed , Khaled Hasnat , Krishna K. Parat
IPC分类号: G11C16/04 , H01L29/78 , H01L29/788
CPC分类号: G11C16/0483 , G11C16/0408 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/14 , G11C16/26 , G11C16/3418 , G11C16/3427 , H01L27/11519 , H01L27/11556 , H01L27/11565 , H01L27/11582
摘要: Apparatus and methods are disclosed, such as an apparatus that includes a string of charge storage devices associated with a pillar (e.g., of semiconductor material), a source gate device, and a source select device coupled between the source gate device and the string. Additional apparatus and methods are described.
摘要翻译: 公开了装置和方法,例如包括与柱(例如半导体材料)相关联的一串电荷存储装置的装置,源极栅极装置和耦合在源栅极装置和串之间的源极选择装置。 描述附加的装置和方法。
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公开(公告)号:US08797806B2
公开(公告)日:2014-08-05
申请号:US13210194
申请日:2011-08-15
申请人: Akira Goda , Shafqat Ahmed , Khaled Hasnat , Krishna K. Parat
发明人: Akira Goda , Shafqat Ahmed , Khaled Hasnat , Krishna K. Parat
IPC分类号: G11C16/04
CPC分类号: G11C16/0483 , G11C16/0408 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/14 , G11C16/26 , G11C16/3418 , G11C16/3427 , H01L27/11519 , H01L27/11556 , H01L27/11565 , H01L27/11582
摘要: Apparatus and methods are disclosed, such as an apparatus that includes a string of charge storage devices associated with a pillar (e.g., of semiconductor material), a source gate device, and a source select device coupled between the source gate device and the string. Additional apparatus and methods are described.
摘要翻译: 公开了装置和方法,例如包括与柱(例如半导体材料)相关联的一串电荷存储装置的装置,源极栅极装置和耦合在源栅极装置和串之间的源选择装置。 描述附加的装置和方法。
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公开(公告)号:US20120117306A1
公开(公告)日:2012-05-10
申请号:US12942152
申请日:2010-11-09
申请人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
发明人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
CPC分类号: G06F3/0625 , G06F3/061 , G06F3/0653 , G06F3/0665 , G06F3/0688 , G06F3/0689 , G06F12/0804 , G06F12/0846 , G06F13/28 , G06F2212/2022 , G06F2212/224 , G06F2212/461 , G11C16/0483 , G11C16/24 , G11C16/26 , Y02D10/14
摘要: Memory devices, methods for programming sense flags, methods for sensing flags, and memory systems are disclosed. In one such memory device, the odd bit lines of a flag memory cell array are connected with a short circuit to a dynamic data cache. The even bit lines of the flag memory cell array are disconnected from the dynamic data cache. When an even page of a main memory cell array is read, the odd flag memory cells, comprising flag data, are read at the same time so that it can be determined whether the odd page of the main memory cell array has been programmed. If the flag data indicates that the odd page has not been programmed, threshold voltage windows can be adjusted to determine the states of the sensed even memory cell page.
摘要翻译: 公开了存储器件,用于编程感测标志的方法,用于感测标志的方法和存储器系统。 在一个这样的存储器件中,标志存储器单元阵列的奇数位线与短路连接到动态数据高速缓存。 标记存储单元阵列的偶数位线与动态数据高速缓存断开连接。 当读取主存储单元阵列的偶数页时,同时读取包括标志数据的奇数标志存储单元,以便可以确定主存储单元阵列的奇数页是否已被编程。 如果标志数据指示奇数页未被编程,则可以调整阈值电压窗口以确定感测到的偶数存储单元页的状态。
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公开(公告)号:US20140370664A1
公开(公告)日:2014-12-18
申请号:US13917068
申请日:2013-06-13
申请人: Kiran Pangal , Khaled Hasnat , Shafqat Ahmed
发明人: Kiran Pangal , Khaled Hasnat , Shafqat Ahmed
IPC分类号: H01L27/105
CPC分类号: H01L27/1052 , H01L27/101 , H01L27/2463 , H01L45/1675
摘要: Techniques for fabricating cross-point memory devices are disclosed in which word line (WL) and/or bit line (BL) processing is separate from cross-point memory memory-material processing, thereby providing an advantageous increase in thickness of the WL and/or BL metal that avoids an increase in the WL and BL resistances as feature sizes for cross-point memories scale smaller.
摘要翻译: 公开了用于制造交叉点存储器件的技术,其中字线(WL)和/或位线(BL)处理与交叉点存储器材料处理分离,从而提供WL和/ 或BL金属,避免了WL和BL电阻的增加,因为交叉点存储器的特征尺寸缩小。
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公开(公告)号:US09135998B2
公开(公告)日:2015-09-15
申请号:US12942152
申请日:2010-11-09
申请人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
发明人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
CPC分类号: G06F3/0625 , G06F3/061 , G06F3/0653 , G06F3/0665 , G06F3/0688 , G06F3/0689 , G06F12/0804 , G06F12/0846 , G06F13/28 , G06F2212/2022 , G06F2212/224 , G06F2212/461 , G11C16/0483 , G11C16/24 , G11C16/26 , Y02D10/14
摘要: Memory devices, methods for programming sense flags, methods for sensing flags, and memory systems are disclosed. In one such memory device, the odd bit lines of a flag memory cell array are connected with a short circuit to a dynamic data cache. The even bit lines of the flag memory cell array are disconnected from the dynamic data cache. When an even page of a main memory cell array is read, the odd flag memory cells, comprising flag data, are read at the same time so that it can be determined whether the odd page of the main memory cell array has been programmed. If the flag data indicates that the odd page has not been programmed, threshold voltage windows can be adjusted to determine the states of the sensed even memory cell page.
摘要翻译: 公开了存储器件,用于编程感测标志的方法,用于感测标志的方法和存储器系统。 在一个这样的存储器件中,标志存储器单元阵列的奇数位线与短路连接到动态数据高速缓存。 标记存储单元阵列的偶数位线与动态数据高速缓存断开连接。 当读取主存储单元阵列的偶数页时,同时读取包括标志数据的奇数标志存储单元,以便可以确定主存储单元阵列的奇数页是否已被编程。 如果标志数据指示奇数页未被编程,则可以调整阈值电压窗口以确定感测到的偶数存储单元页的状态。
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公开(公告)号:US07547597B2
公开(公告)日:2009-06-16
申请号:US11501129
申请日:2006-08-07
申请人: Derchang Kau , Khaled Hasnat , Everett Lee
发明人: Derchang Kau , Khaled Hasnat , Everett Lee
IPC分类号: H01L21/8238 , H01L21/4763
CPC分类号: H01L27/105 , H01L27/11 , H01L27/1116
摘要: A method for directly aligning multiple lithography masking layers. The method may be used to fabricate a flash plus logic structure. The flash plus logic structure may comprise a flash memory cell, a logic cell and a transistor.
摘要翻译: 一种用于直接对准多个光刻掩模层的方法。 该方法可用于制造闪光加逻辑结构。 闪光加上逻辑结构可以包括闪存单元,逻辑单元和晶体管。
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公开(公告)号:US20190043882A1
公开(公告)日:2019-02-07
申请号:US16021550
申请日:2018-06-28
申请人: Khaled Hasnat , Prashant Majhi , Krishna Parat
发明人: Khaled Hasnat , Prashant Majhi , Krishna Parat
IPC分类号: H01L27/11582 , H01L23/528 , H01L23/532 , H01L29/49 , H01L21/768 , H01L21/28 , H01L29/51
摘要: Embodiments of the present disclosure are directed towards techniques to provide a memory device with reduced capacitance. In one embodiment, a memory array is formed in a die, and includes one or more pillars and a plurality of wordlines coupled with the one or more pillars. Adjacent wordlines of the plurality of wordlines are separated by respective dielectric layers, which may include components, to reduce capacitance of the plurality of wordlines. The components comprise air gaps or low-k dielectric material. Other embodiments may be described and/or claimed.
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公开(公告)号:US07087943B2
公开(公告)日:2006-08-08
申请号:US10435495
申请日:2003-05-08
申请人: Derchang Kau , Khaled Hasnat , Everett Lee
发明人: Derchang Kau , Khaled Hasnat , Everett Lee
CPC分类号: H01L27/105 , H01L27/11 , H01L27/1116
摘要: A method for directly aligning multiple lithography masking layers. The method may be used to fabricate a flash plus logic structure. The flash plus logic structure may comprise a flash memory cell, a logic cell and a transistor.
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公开(公告)号:US20060267224A1
公开(公告)日:2006-11-30
申请号:US11501129
申请日:2006-08-07
申请人: Derchang Kau , Khaled Hasnat , Everett Lee
发明人: Derchang Kau , Khaled Hasnat , Everett Lee
IPC分类号: H01L21/44 , H01L21/4763
CPC分类号: H01L27/105 , H01L27/11 , H01L27/1116
摘要: A method for directly aligning multiple lithography masking layers. The method may be used to fabricate a flash plus logic structure. The flash plus logic structure may comprise a flash memory cell, a logic cell and a transistor.
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