Local clean robot-transport plant and robot-transport manufacturing method
    1.
    发明申请
    Local clean robot-transport plant and robot-transport manufacturing method 审中-公开
    本地清洁机器人运输工厂和机器人运输制造方法

    公开(公告)号:US20070274814A1

    公开(公告)日:2007-11-29

    申请号:US11797528

    申请日:2007-05-04

    IPC分类号: H01L21/677

    摘要: A local clean robot-transport plant includes: a plurality of manufacturing apparatuses; a plurality of closed-type transport containers; a container discrimination/selection apparatus; an apparatus group control server. Each of the plurality of closed-type transport containers stores and transports an intermediate product of manufacturing processes along a plurality of interprocess transport paths defined among the plurality of manufacturing apparatuses in accordance with a flow of the manufacturing processes. The container discrimination/selection apparatus is configured to discriminate and select the closed-type transport container of transport type 1 and the closed-type transport container of transport type 2, respectively, from among the plurality of closed-type transport containers. The apparatus group control server is configured to collectively control operation of the plurality of manufacturing apparatuses and the container discrimination/selection apparatus to move the closed-type transport container of transport type 2 to a specific interprocess transport path and to move the closed-type transport container of transport type 1 to the interprocess transport path other than the specific interprocess transport path.

    摘要翻译: 本地清洁机器人运输设备包括:多个制造装置; 多个封闭式运输容器; 容器辨认/选择装置; 设备组控制服务器。 多个封闭式运输容器中的每一个根据制造过程的流程,沿着多个制造装置之间限定的多个处理间传送路径来存储和传送制造过程的中间产品。 容器识别/选择装置被配置为分别从多个封闭式运输集装箱中分别选择运输类型1的封闭式运输集装箱和运输类型2的封闭式运输集装箱。 设备组控制服务器被配置为共同地控制多个制造设备和容器识别/选择设备的操作,以将传送类型2的封闭式运输容器移动到特定的处理间传送路径,并且移动封闭式传送 1类运输集装箱到特定进程间运输路径以外的进程间运输路径。

    Method for manufacturing electronic device
    2.
    发明申请
    Method for manufacturing electronic device 有权
    电子设备制造方法

    公开(公告)号:US20080023442A1

    公开(公告)日:2008-01-31

    申请号:US11826922

    申请日:2007-07-19

    IPC分类号: C03C25/68 C23C16/00

    摘要: A method for manufacturing an electronic device using a closed-type transport container, includes: controlling relative humidity inside the closed-type transport container to be lower than ambient relative humidity outside the closed-type transport container on a particular interprocess transport path in which an intermediate product stored in the closed-type transport container is transported from a first manufacturing process to a second manufacturing process. The first manufacturing process allows basic compounds containing nitrogen atoms to be released from the intermediate product. The second manufacturing process is susceptible to degradation due to contamination by the basic compounds.

    摘要翻译: 一种使用封闭式输送容器的电子装置的制造方法,其特征在于,包括:在所述封闭式输送容器内部的相对湿度比所述封闭式输送容器外的环境相对湿度低的特定过程输送路径, 存储在封闭式运输容器中的中间产品从第一制造过程运输到第二制造过程。 第一制造方法允许含有氮原子的碱性化合物从中间产物中释放出来。 第二制造过程由于碱性化合物的污染而易于降解。

    Method for manufacturing electronic device
    3.
    发明授权
    Method for manufacturing electronic device 有权
    电子设备制造方法

    公开(公告)号:US08119020B2

    公开(公告)日:2012-02-21

    申请号:US11826922

    申请日:2007-07-19

    IPC分类号: B44C1/22

    摘要: A method for manufacturing an electronic device using a closed-type transport container, includes: controlling relative humidity inside the closed-type transport container to be lower than ambient relative humidity outside the closed-type transport container on a particular interprocess transport path in which an intermediate product stored in the closed-type transport container is transported from a first manufacturing process to a second manufacturing process. The first manufacturing process allows basic compounds containing nitrogen atoms to be released from the intermediate product. The second manufacturing process is susceptible to degradation due to contamination by the basic compounds.

    摘要翻译: 一种使用封闭式输送容器的电子装置的制造方法,其特征在于,包括:在所述封闭式输送容器内部的相对湿度比所述封闭式输送容器外的环境相对湿度低的特定过程输送路径, 存储在封闭式运输容器中的中间产品从第一制造过程运输到第二制造过程。 第一制造方法允许含有氮原子的碱性化合物从中间产物中释放出来。 第二制造过程由于碱性化合物的污染而易于降解。

    Method of manufacturing semiconductor device
    4.
    发明授权
    Method of manufacturing semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US07538047B2

    公开(公告)日:2009-05-26

    申请号:US11451519

    申请日:2006-06-13

    IPC分类号: H01L21/469

    CPC分类号: H01L21/76229 H01L21/76224

    摘要: A method of manufacturing a semiconductor device includes forming a trench for isolation on a surface of a substrate including a semiconductor substrate, filling the trench with a solution containing a perhydrosilazane polymer by applying the solution on the substrate, converting the solution into a film containing the perhydrosilazane polymer by heating the solution, and converting the film into a silicon dioxide film including heating the film at a first temperature in an atmosphere containing vapor, and heating the film heated at the first temperature at a second temperature lower than the first temperature in an atmosphere containing vapor or in pure water.

    摘要翻译: 一种制造半导体器件的方法包括在包括半导体衬底的衬底的表面上形成用于隔离的沟槽,通过将溶液涂覆在衬底上,用含有全氢硅氮烷聚合物的溶液填充沟槽,将溶液转化为含有 通过加热溶液,将膜转化为二氧化硅膜,包括在含有蒸气的气氛中的第一温度下加热该膜,并且在第一温度下在比第一温度低的温度下加热第一温度的膜, 含有蒸汽或纯水的气氛。

    Method for manufacturing a semiconductor device
    5.
    发明授权
    Method for manufacturing a semiconductor device 失效
    半导体器件的制造方法

    公开(公告)号:US07071107B2

    公开(公告)日:2006-07-04

    申请号:US10674382

    申请日:2003-10-01

    IPC分类号: H01L21/302

    摘要: There is disclosed a method of manufacturing a semiconductor device, wherein an Si3N4 film is formed as a mask member on the surface of a silicon substrate, then etched to form an STI trench. A solution of perhydrogenated silazane polymer is coated on the surface of the silicon substrate having an STI trench formed thereon to deposit a coated film (PSZ film) thereon. The PSZ film deposited on the mask member is removed, leaving part of the PSZ film inside the trench, wherein the thickness of the PSZ film is controlled to make the height thereof from the bottom of the STI trench become 600 nm or less. Thereafter, the PSZ film is heat-treated in a water vapor-containing atmosphere to convert the PSZ film into a silicon oxide film through a chemical reaction of the PSZ film. Subsequently, the silicon oxide film is heat-treated to densify the silicon oxide film.

    摘要翻译: 公开了一种制造半导体器件的方法,其中在硅衬底的表面上形成Si 3 N 4 N 4膜作为掩模构件,然后蚀刻形成 一个STI沟槽。 将过氢化硅氮烷聚合物的溶液涂布在其上形成有STI沟槽的硅衬底的表面上,以在其上沉积涂膜(PSZ膜)。 去除沉积在掩模构件上的PSZ膜,使PSZ膜的一部分留在沟槽内,其中控制PSZ膜的厚度使其从STI沟槽底部的高度变为600nm以下。 然后,在含水蒸汽的气氛中对PSZ膜进行热处理,通过PSZ膜的化学反应将PSZ膜转换为氧化硅膜。 随后,对氧化硅膜进行热处理以使氧化硅膜致密化。

    Method of manufacturing semiconductor device
    10.
    发明申请
    Method of manufacturing semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US20070004170A1

    公开(公告)日:2007-01-04

    申请号:US11451519

    申请日:2006-06-13

    IPC分类号: H01L21/76

    CPC分类号: H01L21/76229 H01L21/76224

    摘要: A method of manufacturing a semiconductor device includes forming a trench for isolation on a surface of a substrate including a semiconductor substrate, filling the trench with a solution containing a perhydrosilazane polymer by applying the solution on the substrate, converting the solution into a film containing the perhydrosilazane polymer by heating the solution, and converting the film into a silicon dioxide film including heating the film at a first temperature in an atmosphere containing vapor, and heating the film heated at the first temperature at a second temperature lower than the first temperature in an atmosphere containing vapor or in pure water.

    摘要翻译: 一种制造半导体器件的方法包括在包括半导体衬底的衬底的表面上形成用于隔离的沟槽,通过将溶液涂覆在衬底上,用含有全氢硅氮烷聚合物的溶液填充沟槽,将溶液转化为含有 通过加热溶液,将膜转化为二氧化硅膜,包括在含有蒸气的气氛中的第一温度下加热该膜,并且在第一温度下在比第一温度低的温度下加热第一温度的膜, 含有蒸汽或纯水的气氛。