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    MANUFACTURING CONTROL BASED ON A FINAL DESIGN STRUCTURE INCORPORATING BOTH LAYOUT AND CLIENT-SPECIFIC MANUFACTURING INFORMATION
    1.
    发明申请
    MANUFACTURING CONTROL BASED ON A FINAL DESIGN STRUCTURE INCORPORATING BOTH LAYOUT AND CLIENT-SPECIFIC MANUFACTURING INFORMATION 有权
    基于最终设计结构的制造控制，包括两个布局和客户特定的制造信息

    公开(公告)号：US20130325156A1

    公开(公告)日：2013-12-05

    申请号：US13485862

    申请日：2012-05-31

    申请人： Casey J. Grant ,  Kurt A. Tallman ,  Sebastian T. Ventrone

    发明人： Casey J. Grant ,  Kurt A. Tallman ,  Sebastian T. Ventrone

    IPC分类号： G05B13/02

    CPC分类号： G05B19/4097 ,  G05B2219/32031 ,  G05B2219/32033 ,  G05B2219/45031

    摘要： Disclosed are embodiments of an improved design method, the results of which are a final design structure for an integrated circuit that incorporates, not only layout information, but also client-specific manufacturing information (e.g., import/export information, service requests, processing directives, purchase order requirements, design rule information, etc.) in the same data format in hierarchical form. Also disclosed are embodiments of a manufacturing control method and system. In these embodiments, a final design structure, such as that described above, is received at tape-in. The information contained therein (particularly, the client-specific manufacturing information) is sorted by type and then forwarded to the appropriate tools within the manufacturing facility for processing. By providing the client-specific manufacturing information directly to each manufacturing facility in the final design structure in conjunction with the layout information, the embodiments eliminate the need for independent information gathering by each manufacturing facility.

    摘要翻译： 公开了一种改进的设计方法的实施例，其结果是集成电路的最终设计结构，不仅包括布局信息，而且包括客户特定制造信息（例如，导入/导出信息，服务请求，处理指令 ，采购订单要求，设计规则信息等）以相同的数据格式分层格式。 还公开了制造控制方法和系统的实施例。 在这些实施例中，诸如上述的最终设计结构在磁带入口处被接收。 其中包含的信息（特别是客户特定的制造信息）按类型排序，然后转发到制造设施内的适当工具进行处理。 结合布局信息，通过在终端设计结构中直接向每个制造设施提供特定于客户的制造信息，实施例消除了对每个制造设备的独立信息收集的需要。

    Structure for switching system for signal monitoring and switch-back control
    2.
    发明授权
    Structure for switching system for signal monitoring and switch-back control 有权
    用于信号监控和切换控制的开关系统结构

    公开(公告)号：US07872692B2

    公开(公告)日：2011-01-18

    申请号：US12056795

    申请日：2008-03-27

    申请人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    发明人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    IPC分类号： H04N5/50 ,  H04N5/44

    CPC分类号： H04N7/163 ,  H04N21/4383 ,  H04N21/4394 ,  H04N21/44008 ,  H04N21/472 ,  H04N21/812

    摘要： A design structure for systems for switching a displayed signal for a display between a plurality of signals are disclosed. In one embodiment, the design structure is embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, and includes: a system for switching a displayed signal for a display between a plurality of signals, the system including: a microcontroller; a chooser for setting a primary signal from a plurality of program-variable signals; a monitor tuner coupled to the microcontroller for tuning the primary signal during switching of the displayed signal from the primary signal to a secondary signal; a detector coupled to the monitor tuner and the microcontroller for detecting a predetermined condition in the primary signal; and a selector coupled to the microcontroller for switching the displayed signal from the secondary signal to the primary signal upon occurrence of the predetermined condition.

    摘要翻译： 公开了用于在多个信号之间切换用于显示的显示信号的系统的设计结构。 在一个实施例中，设计结构体现在用于设计，制造或测试集成电路的机器可读介质中，并且包括：用于在多个信号之间切换用于显示的显示信号的系统，所述系统包括：微控制器 ; 用于从多个可编程信号设置主信号的选择器; 耦合到微控制器的监视器调谐器，用于在将所显示的信号从主信号切换到辅助信号期间调谐主信号; 耦合到所述监视器调谐器和所述微控制器的检测器，用于检测所述主信号中的预定条件; 以及耦合到微控制器的选择器，用于在发生预定条件时将显示的信号从次级信号切换到主信号。

    Switching system for signal monitoring and switch-back control
    3.
    发明授权
    Switching system for signal monitoring and switch-back control 失效
    用于信号监控和切换控制的切换系统

    公开(公告)号：US07773159B2

    公开(公告)日：2010-08-10

    申请号：US11276130

    申请日：2006-02-15

    申请人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    发明人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    IPC分类号： H04N5/50 ,  H04N5/44

    CPC分类号： H04N5/50 ,  H04N7/163 ,  H04N21/4383 ,  H04N21/4394 ,  H04N21/44008 ,  H04N21/472 ,  H04N21/812

    摘要： Systems for switching a displayed signal for a display between a plurality of signals are disclosed. In one embodiment, the system includes a microcontroller; a chooser for choosing a primary signal from a plurality of program-variable signals at the microcontroller; a monitor tuner coupled to the microcontroller for tuning the primary signal during switching of the displayed signal from the primary signal to a secondary signal; a detector coupled to the monitor tuner and the microcontroller for detecting a predetermined condition in the primary signal; and a selector coupled to the microcontroller for switching the displayed signal from the secondary signal to the primary signal upon occurrence of the predetermined condition. A user can switch between signals such as television channels or other dedicated functions without the risk of missing a portion of the program material.

    摘要翻译： 公开了用于在多个信号之间切换用于显示的显示信号的系统。 在一个实施例中，该系统包括微控制器; 用于在微控制器处从多个可编程信号中选择主信号的选择器; 耦合到微控制器的监视器调谐器，用于在将所显示的信号从主信号切换到辅助信号期间调谐主信号; 耦合到所述监视器调谐器和所述微控制器的检测器，用于检测所述主信号中的预定条件; 以及耦合到微控制器的选择器，用于在发生预定条件时将显示的信号从次级信号切换到主信号。 用户可以在诸如电视频道或其他专用功能的信号之间切换，而不会丢失节目素材的一部分。

    DESIGN STRUCTURE FOR SWITCHING SYSTEM FOR SIGNAL MONITORING AND SWITCH-BACK CONTROL
    4.
    发明申请
    DESIGN STRUCTURE FOR SWITCHING SYSTEM FOR SIGNAL MONITORING AND SWITCH-BACK CONTROL 有权
    用于信号监控和开关控制的开关系统的设计结构

    公开(公告)号：US20080172641A1

    公开(公告)日：2008-07-17

    申请号：US12056795

    申请日：2008-03-27

    申请人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    发明人： Ahmed Y. Ginawi ,  Casey J. Grant ,  Christopher Ro ,  Sebastian T. Ventrone

    IPC分类号： G06F17/50

    CPC分类号： H04N7/163 ,  H04N21/4383 ,  H04N21/4394 ,  H04N21/44008 ,  H04N21/472 ,  H04N21/812

    摘要： A design structure for systems for switching a displayed signal for a display between a plurality of signals are disclosed. In one embodiment, the design structure is embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, and includes: a system for switching a displayed signal for a display between a plurality of signals, the system including: a microcontroller; a chooser for setting a primary signal from a plurality of program-variable signals; a monitor tuner coupled to the microcontroller for tuning the primary signal during switching of the displayed signal from the primary signal to a secondary signal; a detector coupled to the monitor tuner and the microcontroller for detecting a predetermined condition in the primary signal; and a selector coupled to the microcontroller for switching the displayed signal from the secondary signal to the primary signal upon occurrence of the predetermined condition.

    摘要翻译： 公开了用于在多个信号之间切换用于显示的显示信号的系统的设计结构。 在一个实施例中，设计结构体现在用于设计，制造或测试集成电路的机器可读介质中，并且包括：用于在多个信号之间切换用于显示的显示信号的系统，所述系统包括：微控制器 ; 用于从多个可编程信号设置主信号的选择器; 耦合到微控制器的监视器调谐器，用于在将所显示的信号从主信号切换到辅助信号期间调谐主信号; 耦合到所述监视器调谐器和所述微控制器的检测器，用于检测所述主信号中的预定条件; 以及耦合到微控制器的选择器，用于在发生预定条件时将显示的信号从次级信号切换到主信号。

    Manufacturing control based on a final design structure incorporating both layout and client-specific manufacturing information
    5.
    发明授权
    Manufacturing control based on a final design structure incorporating both layout and client-specific manufacturing information 有权
    基于结合布局和客户特定制造信息的最终设计结构的制造控制

    公开(公告)号：US08849440B2

    公开(公告)日：2014-09-30

    申请号：US13485862

    申请日：2012-05-31

    申请人： Casey J. Grant ,  Kurt A. Tallman ,  Sabastian T. Ventrone

    发明人： Casey J. Grant ,  Kurt A. Tallman ,  Sabastian T. Ventrone

    IPC分类号： G05B13/02

    CPC分类号： G05B19/4097 ,  G05B2219/32031 ,  G05B2219/32033 ,  G05B2219/45031

    摘要： Disclosed are embodiments of an improved design method, the results of which are a final design structure for an integrated circuit that incorporates, not only layout information, but also client-specific manufacturing information (e.g., import/export information, service requests, processing directives, purchase order requirements, design rule information, etc.) in the same data format in hierarchical form. Also disclosed are embodiments of a manufacturing control method and system. In these embodiments, a final design structure, such as that described above, is received at tape-in. The information contained therein (particularly, the client-specific manufacturing information) is sorted by type and then forwarded to the appropriate tools within the manufacturing facility for processing. By providing the client-specific manufacturing information directly to each manufacturing facility in the final design structure in conjunction with the layout information, the embodiments eliminate the need for independent information gathering by each manufacturing facility.

    摘要翻译： 公开了一种改进的设计方法的实施例，其结果是集成电路的最终设计结构，不仅包括布局信息，而且包括客户特定制造信息（例如，导入/导出信息，服务请求，处理指令 ，采购订单要求，设计规则信息等）以相同的数据格式分层格式。 还公开了制造控制方法和系统的实施例。 在这些实施例中，诸如上述的最终设计结构在磁带入口处被接收。 其中包含的信息（特别是客户特定的制造信息）按类型排序，然后转发到制造设施内的适当工具进行处理。 结合布局信息，通过在终端设计结构中直接向每个制造设施提供特定于客户的制造信息，实施例消除了对每个制造设备的独立信息收集的需要。

    Methods of fabricating photomasks for improving damascene wire uniformity without reducing performance
    6.
    发明授权
    Methods of fabricating photomasks for improving damascene wire uniformity without reducing performance 有权
    制造光掩模以改善镶嵌丝均匀性而不降低性能的方法

    公开(公告)号：US08399181B2

    公开(公告)日：2013-03-19

    申请号：US13346776

    申请日：2012-01-10

    申请人： Casey J. Grant ,  Jude L. Hankey

    发明人： Casey J. Grant ,  Jude L. Hankey

    IPC分类号： G03F7/16 ,  G03F7/20 ,  G03F7/40 ,  G06F17/50

    CPC分类号： H01L21/7684 ,  G03F1/36 ,  H01L21/3212 ,  H01L23/522 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A method of improving damascene wire uniformity without reducing performance. The method includes simultaneously forming a multiplicity of damascene wires and a multiplicity of metal dummy shapes in a dielectric layer of a wiring level of an integrated circuit chip, the metal dummy shapes being dispersed between damascene wires of the multiplicity of damascene wires; and removing or modifying those metal dummy shapes of the multiplicity of metal dummy shapes within exclusion regions around selected damascene wires of the multiplicity of damascene wires. Also a method of fabricating a photomask and a photomask for use in improving damascene wire uniformity without reducing performance.

    摘要翻译： 改善镶嵌丝均匀性而不降低性能的方法。 该方法包括在集成电路芯片的布线层的电介质层中同时形成多个镶嵌线和多个金属虚拟形状，金属虚拟形状分散在多个镶嵌线的镶嵌线之间; 以及在多个镶嵌线的所选择的镶嵌线周围的排除区域内去除或修改多个金属假形状的那些金属虚拟形状。 还有一种制造光掩模和光掩模的方法，其用于改善镶嵌线的均匀性而不降低性能。

    Modification of electrical properties for semiconductor wafers
    7.
    发明授权
    Modification of electrical properties for semiconductor wafers 失效
    半导体晶圆的电性能的改进

    公开(公告)号：US07205216B2

    公开(公告)日：2007-04-17

    申请号：US10710700

    申请日：2004-07-29

    申请人： Casey J. Grant ,  Heidi L. Greer ,  Steven M. Shank ,  Michael C. Triplett

    发明人： Casey J. Grant ,  Heidi L. Greer ,  Steven M. Shank ,  Michael C. Triplett

    IPC分类号： H01L21/20 ,  H01L21/31

    CPC分类号： H01L21/324 ,  H01L22/20

    摘要： A method and structure for fabricating semiconductor wafers. The method comprises providing a plurality of semiconductor wafers. The plurality of semiconductor wafers comprises a first semiconductor wafer and a second semiconductor wafer. The first semiconductor wafer is located adjacent to the second semiconductor wafer. A relationship is provided between a plurality of values for an electrical characteristic and a plurality of materials. A material is chosen from the plurality of materials existing in the relationship. A substructure is formed comprising the material sandwiched between a topside of the first semiconductor wafer and a backside of a portion of the of the second semiconductor wafer. The plurality of semiconductor wafers are placed into a furnace comprising an elevated temperature for processing resulting in a value for the first semiconductor wafer of the electrical characteristic that corresponds to said material in said relationship.

    摘要翻译： 一种用于制造半导体晶片的方法和结构。 该方法包括提供多个半导体晶片。 多个半导体晶片包括第一半导体晶片和第二半导体晶片。 第一半导体晶片位于第二半导体晶片附近。 在电特性和多种材料的多个值之间提供关系。 从存在于该关系中的多种材料中选择材料。 形成了包括夹在第一半导体晶片的顶侧和第二半导体晶片的一部分的背面之间的材料的子结构。 将多个半导体晶片放置在包括用于处理的升高的温度的炉中，从而产生与所述关系中的所述材料对应的电特性的第一半导体晶片的值。