MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MAKING SAME
    1.
    发明申请
    MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MAKING SAME 审中-公开
    磁性随机访问存储器件及其制造方法

    公开(公告)号:US20130277778A1

    公开(公告)日:2013-10-24

    申请号:US13452230

    申请日:2012-04-20

    IPC分类号: H01L29/82 H01L21/8246

    摘要: This description relates to a method for fabricating a magnetoresistive random access memory (MRAM) device having a plurality of magnetic tunnel junction (MTJ) units. The method includes forming a bottom conductive layer, forming an anti-ferromagnetic layer and forming a tunnel layer over the bottom conductive layer and the anti-ferromagnetic layer. The method further includes forming a free magnetic layer, having a magnetic moment aligned in a direction that is adjustable by applying an electromagnetic field, over the tunnel layer and forming a top conductive layer over the free magnetic layer. The method further includes performing at least one lithographic process to remove portions of the bottom conductive layer, the anti-ferromagnetic layer, the tunnel layer, the free magnetic layer and the top conductive layer that is uncovered by the photoresist layer until the bottom conductive layer is exposed and removing portions of at least one sidewall of the MTJ unit.

    摘要翻译: 该描述涉及一种用于制造具有多个磁性隧道结(MTJ)单元的磁阻随机存取存储器(MRAM)装置的方法。 该方法包括形成底部导电层,形成反铁磁层并在底部导电层和反铁磁层上形成隧道层。 该方法还包括形成自由磁性层,该磁性层在通过施加电磁场的可调整方向上对准磁矩,并在隧道层上形成顶部导电层,并在自由磁性层上形成顶部导电层。 该方法还包括执行至少一个光刻工艺以去除由光致抗蚀剂层未覆盖的底部导电层,反铁磁层,隧道层,自由磁性层和顶部导电层的部分,直到底部导电层 暴露并去除MTJ单元的至少一个侧壁的部分。

    PHASE CHANGE MEMORY CELL
    2.
    发明申请
    PHASE CHANGE MEMORY CELL 有权
    相变存储器单元

    公开(公告)号:US20120104339A1

    公开(公告)日:2012-05-03

    申请号:US12913117

    申请日:2010-10-27

    IPC分类号: H01L45/00 H01L21/02 H01L21/10

    摘要: On a first structure having a first dielectric layer, a second dielectric layer, and a third dielectric layer a crown is formed through the third dielectric layer and the second dielectric layer. A fourth dielectric layer is deposited over the first structure and thereby is over the crown. A portion of the fourth dielectric layer is removed to form a first spacer having a remaining portion of the fourth dielectric layer. A portion of the third electric layer is also removed during the removal of the portion the fourth dielectric layer, resulting in a second spacer having a remaining portion of the third dielectric layer. A second structure is thereby formed. A phase change material layer is deposited over the second structure. An electrode layer is deposited over the phase change layer. Portions of the electrode layer and the phase change layer are removed by a chemical-mechanical-polishing process to form a phase change region having a remaining portion of the phase change layer and to form an electrode region having a remaining portion of the electrode layer.

    摘要翻译: 在具有第一电介质层,第二电介质层和第三电介质层的第一结构上,通过第三电介质层和第二电介质层形成表冠。 在第一结构上沉积第四电介质层,从而在冠部上方。 去除第四电介质层的一部分以形成具有第四电介质层的剩余部分的第一间隔物。 在去除第四介电层的部分期间,第三电层的一部分也被去除,导致具有第三介电层的剩余部分的第二间隔物。 由此形成第二结构。 相变材料层沉积在第二结构上。 电极层沉积在相变层上。 通过化学机械抛光工艺除去电极层和相变层的一部分,形成具有相变层的剩余部分的相变区域,并形成具有电极层的剩余部分的电极区域。

    IMAGE SENSOR HAVING COMPRESSIVE LAYERS
    3.
    发明申请
    IMAGE SENSOR HAVING COMPRESSIVE LAYERS 有权
    具有压缩层的图像传感器

    公开(公告)号:US20130329102A1

    公开(公告)日:2013-12-12

    申请号:US13492258

    申请日:2012-06-08

    IPC分类号: H04N5/335

    摘要: An image sensor device including a semiconductor substrate that includes an array region and a black level correction region. The array region contains a plurality of radiation-sensitive pixels. The black level correction region contains one or more reference pixels. The substrate has a front side and a back side. The image sensor device includes a first compressively-stressed layer formed on the back side of the substrate. The first compressively-stressed layer contains silicon oxide, and is negatively charged. The second compressively-stressed layer contains silicon nitride, and is negatively charged. A metal shield is formed over at least a portion of the black level correction region. The image sensor device includes a third compressively-stressed layer formed on the metal shield and the second compressively-stressed layer. The third compressively-stressed layer contains silicon oxide. A sidewall of the metal shield is protected by the third compressively-stressed layer.

    摘要翻译: 一种包括具有阵列区域和黑色电平校正区域的半导体衬底的图像传感器装置。 阵列区域包含多个辐射敏感像素。 黑色电平校正区域包含一个或多个参考像素。 基板具有前侧和后侧。 图像传感器装置包括形成在基板的背面上的第一压缩应力层。 第一压应力层含有氧化硅,带负电荷。 第二压应力层含有氮化硅,带负电荷。 在黑色电平校正区域的至少一部分上形成金属屏蔽。 图像传感器装置包括形成在金属屏蔽和第二压缩应力层上的第三压缩应力层。 第三压缩应力层含有氧化硅。 金属屏蔽层的侧壁由第三压应力层保护。

    BIOLOGICAL SENSING STRUCTURES AND METHODS OF FORMING THE SAME
    6.
    发明申请
    BIOLOGICAL SENSING STRUCTURES AND METHODS OF FORMING THE SAME 有权
    生物感测结构及其形成方法

    公开(公告)号:US20130208371A1

    公开(公告)日:2013-08-15

    申请号:US13372141

    申请日:2012-02-13

    IPC分类号: G02B5/08 B05D3/10 B05D5/06

    摘要: A method of forming of biological sensing structures including a portion of a substrate is recessed to form a plurality of mesas in the substrate. Each of the plurality of mesas has a top surface and a sidewall surface. A first light reflecting layer is deposited over the top surface and the sidewall surface of each mesa. A filling material is formed over a first portion of the first light reflecting layer. A stop layer is deposited over the filling material and a second portion of the first light reflecting layer. A sacrificial layer is formed over the stop layer and is planarized exposing the stop layer. A first opening is formed in the stop layer and the first light reflecting layer. A second light reflecting layer is deposited over the first opening. A second opening is formed in the second light reflecting layer.

    摘要翻译: 形成包括衬底的一部分的生物感测结构的方法被凹进以在衬底中形成多个台面。 多个台面中的每一个具有顶表面和侧壁表面。 第一光反射层沉积在每个台面的顶表面和侧壁表面上。 在第一光反射层的第一部分上形成填充材料。 沉积在填充材料上的停止层和第一光反射层的第二部分。 牺牲层形成在停止层上并且被平坦化地暴露停止层。 在停止层和第一光反射层中形成第一开口。 第二光反射层沉积在第一开口上。 在第二光反射层中形成第二开口。

    SEMICONDUCTOR STRUCTURE HAVING SETS OF III-V COMPOUND LAYERS AND METHOD OF FORMING THE SAME
    8.
    发明申请
    SEMICONDUCTOR STRUCTURE HAVING SETS OF III-V COMPOUND LAYERS AND METHOD OF FORMING THE SAME 有权
    具有III-V族化合物层的半导体结构及其形成方法

    公开(公告)号:US20140197418A1

    公开(公告)日:2014-07-17

    申请号:US13743045

    申请日:2013-01-16

    IPC分类号: H01L29/06 H01L21/02

    摘要: A semiconductor structure includes a substrate, a first III-V compound layer over the substrate, one or more sets of III-V compound layers over the first III-V compound layer, a second III-V compound layer over the one or more sets of III-V compound layers, and an active layer over the second III-V compound layer. The first III-V compound layer has a first type doping. Each of the one or more sets of III-V compound layers includes a lower III-V compound layer and an upper III-V compound layer over the lower III-V compound layer. The upper III-V compound layer having the first type doping, and the lower III-V compound layer is at least one of undoped, unintentionally doped having a second type doping, or doped having the second type doping. The second III-V compound layer is either undoped or unintentionally doped having the second type doping.

    摘要翻译: 半导体结构包括衬底,在衬底上的第一III-V化合物层,在第一III-V化合物层上的一组或多组III-V化合物层,在一个或多个组上的第二III-V化合物层 的III-V化合物层,以及在第二III-V化合物层上的活性层。 第一III-V族化合物层具有第一种掺杂。 一组或多组III-V化合物层中的每一个在下III-V化合物层上包括下III-V化合物层和上III-V化合物层。 具有第一类掺杂的上III-V化合物层和下III-V族化合物层是至少一种未掺杂的,无意掺杂的具有第二类型掺杂或掺杂具有第二类掺杂的至少一种。 第二III-V族化合物层是未掺杂的或无意掺杂的,具有第二种掺杂。

    ANTI-REFLECTIVE LAYER FOR BACKSIDE ILLUMINATED CMOS IMAGE SENSORS
    9.
    发明申请
    ANTI-REFLECTIVE LAYER FOR BACKSIDE ILLUMINATED CMOS IMAGE SENSORS 审中-公开
    用于背光照明的CMOS图像传感器的反反射层

    公开(公告)号:US20130270663A1

    公开(公告)日:2013-10-17

    申请号:US13755376

    申请日:2013-01-31

    IPC分类号: H01L27/146

    摘要: A method of forming an image sensor device includes forming a light sensing region at a front surface of a silicon substrate and a patterned metal layer there over. Thereafter, the method includes depositing a metal oxide anti-reflection laminate on the first surface of the substrate. The metal oxide anti-reflection laminate includes one or more composite layers of thin metal oxides stacked over the photodiode. Each composite layer includes two or more metal oxide layers: one metal oxide is a high energy band gap metal oxide and another metal oxide is a high refractive index metal oxide.

    摘要翻译: 形成图像传感器装置的方法包括在硅衬底的前表面上形成感光区域,并在其上形成图案化的金属层。 此后,该方法包括在基板的第一表面上沉积金属氧化物防反射层压板。 金属氧化物防反射层叠体包括层叠在光电二极管上的一层以上的金属氧化物复合层。 每个复合层包括两个或更多个金属氧化物层:一个金属氧化物是高能带隙金属氧化物,另一个金属氧化物是高折射率金属氧化物。