Lithographic projection apparatus and method of compensating perturbation factors
    4.
    发明授权
    Lithographic projection apparatus and method of compensating perturbation factors 有权
    光刻投影仪和补偿扰动因子的方法

    公开(公告)号:US08570489B2

    公开(公告)日:2013-10-29

    申请号:US12741960

    申请日:2008-11-07

    IPC分类号: G03B27/32 G03B27/42 G03B27/54

    摘要: A lithographic projection apparatus including a support structure configured to support a patterning device, the patterning device configured to impart a beam of radiation with a pattern in its cross-section; a substrate holder configured to hold a substrate; a projection system configured to expose the patterned beam of radiation on a target portion of the substrate; and a system configured to compensate one or more perturbation factors by providing an additional beam of radiation to be exposed on the target portion of the substrate, the additional beam of radiation being imparted in its cross-section with an additional pattern which is based on the pattern of the patterning device and on lithographic projection apparatus property data, the lithographic projection apparatus property data characterizing a level and nature of one or more systematic perturbation factors of different lithographic apparatus.

    摘要翻译: 一种光刻投影设备,包括被配置为支撑图案形成装置的支撑结构,所述图案形成装置被配置为在其横截面中赋予图案的辐射束; 衬底保持器,其构造成保持衬底; 投影系统,被配置为将所述图案化的辐射束暴露在所述基板的目标部分上; 以及被配置为通过提供待暴露在所述基板的目标部分上的另外的辐射束来补偿一个或多个扰动因子的系统,所述附加辐射束在其横截面中被赋予附加图案,所述另外的图案基于 图案形成装置的图案和光刻投影装置的属性数据,光刻投影装置的属性数据表征不同光刻装置的一个或多个系统扰动因子的水平和性质。

    Sample preparation
    6.
    发明授权
    Sample preparation 有权
    样品制备

    公开(公告)号:US08624185B2

    公开(公告)日:2014-01-07

    申请号:US13233397

    申请日:2011-09-15

    IPC分类号: H01J37/30

    摘要: Disclosed are methods for preparing samples that include forming a first channel in a material by directing a first plurality of noble gas ions at the material, forming a second channel in the material by directing a second plurality of noble gas ions at the material, where the second channel is spaced from the first channel so that a portion of the material between channels has a mean thickness of 100 nm or less, and detaching the portion from the material to yield the sample.

    摘要翻译: 公开了用于制备样品的方法,其包括通过在材料处引导第一多个惰性气体离子而在材料中形成第一通道,通过在材料处引导第二多个惰性气体离子在材料中形成第二通道, 第二通道与第一通道间隔开,使得通道之间的材料的一部分具有100nm或更小的平均厚度,并且将该部分与材料分离以产生样品。

    SAMPLE PREPARATION
    9.
    发明申请
    SAMPLE PREPARATION 有权
    样品制备

    公开(公告)号:US20120199737A1

    公开(公告)日:2012-08-09

    申请号:US13233397

    申请日:2011-09-15

    IPC分类号: G01N23/02 B01J19/08

    摘要: Disclosed are methods for preparing samples that include forming a first channel in a material by directing a first plurality of noble gas ions at the material, forming a second channel in the material by directing a second plurality of noble gas ions at the material, where the second channel is spaced from the first channel so that a portion of the material between channels has a mean thickness of 100 nm or less, and detaching the portion from the material to yield the sample.

    摘要翻译: 公开了用于制备样品的方法,其包括通过在材料处引导第一多个惰性气体离子而在材料中形成第一通道,通过在材料处引导第二多个惰性气体离子在材料中形成第二通道, 第二通道与第一通道间隔开,使得通道之间的材料的一部分具有100nm或更小的平均厚度,并且将该部分与材料分离以产生样品。

    LITHOGRAPHIC PROJECTION APPARATUS AND METHOD OF COMPENSATING PERTURBATION FACTORS
    10.
    发明申请
    LITHOGRAPHIC PROJECTION APPARATUS AND METHOD OF COMPENSATING PERTURBATION FACTORS 有权
    平面投影装置和补偿因子的方法

    公开(公告)号:US20100321657A1

    公开(公告)日:2010-12-23

    申请号:US12741960

    申请日:2008-11-07

    IPC分类号: G03B27/52

    摘要: A lithographic projection apparatus including a support structure configured to support a patterning device, the patterning device configured to impart a beam of radiation with a pattern in its cross-section; a substrate holder configured to hold a substrate; a projection system configured to expose the patterned beam of radiation on a target portion of the substrate; and a system configured to compensate one or more perturbation factors by providing an additional beam of radiation to be exposed on the target portion of the substrate, the additional beam of radiation being imparted in its cross-section with an additional pattern which is based on the pattern of the patterning device and on lithographic projection apparatus property data, the lithographic projection apparatus property data characterizing a level and nature of one or more systematic perturbation factors of different lithographic apparatus.

    摘要翻译: 一种光刻投影设备,包括被配置为支撑图案形成装置的支撑结构,所述图案形成装置被配置为在其横截面中赋予图案的辐射束; 衬底保持器,其构造成保持衬底; 投影系统,被配置为将所述图案化的辐射束暴露在所述基板的目标部分上; 以及被配置为通过提供待暴露在所述基板的目标部分上的另外的辐射束来补偿一个或多个扰动因子的系统,所述附加辐射束在其横截面中被赋予附加图案,所述另外的图案基于 图案形成装置的图案和光刻投影装置的属性数据,光刻投影装置的属性数据表征不同光刻装置的一个或多个系统扰动因子的水平和性质。