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公开(公告)号:US11853846B2
公开(公告)日:2023-12-26
申请号:US17044633
申请日:2018-04-30
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Sai Rahul Chalamalasetti , Paolo Faraboschi , Martin Foltin , Catherine Graves , Dejan S. Milojicic , John Paul Strachan , Sergey Serebryakov
CPC classification number: G06N3/08 , G11C13/0069 , G11C2213/77
Abstract: A crossbar array includes a number of memory elements. An analog-to-digital converter (ADC) is electronically coupled to the vector output register. A digital-to-analog converter (DAC) is electronically coupled to the vector input register. A processor is electronically coupled to the ADC and to the DAC. The processor may be configured to determine whether division of input vector data by output vector data from the crossbar array is within a threshold value, and if not within the threshold value, determine changed data values as between the output vector data and the input vector data, and write the changed data values to the memory elements of the crossbar array.
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公开(公告)号:US11385863B2
公开(公告)日:2022-07-12
申请号:US16052218
申请日:2018-08-01
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Sai Rahul Chalamalasetti , Paolo Faraboschi , Martin Foltin , Catherine Graves , Dejan S. Milojicic , Sergey Serebryakov , John Paul Strachan
Abstract: Disclosed techniques provide for dynamically changing precision of a multi-stage compute process. For example, changing neural network (NN) parameters on a per-layer basis depending on properties of incoming data streams and per-layer performance of an NN among other considerations. NNs include multiple layers that may each be calculated with a different degree of accuracy and therefore, compute resource overhead (e.g., memory, processor resources, etc.). NNs are usually trained with 32-bit or 16-bit floating-point numbers. Once trained, an NN may be deployed in production. One approach to reduce compute overhead is to reduce parameter precision of NNs to 16 or 8 for deployment. The conversion to an acceptable lower precision is usually determined manually before deployment and precision levels are fixed while deployed. Disclosed techniques and implementations address automatic rather than manual determination or precision levels for different stages and dynamically adjusting precision for each stage at run-time.
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公开(公告)号:US20190044546A1
公开(公告)日:2019-02-07
申请号:US15670802
申请日:2017-08-07
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Gregg B. Lesartre , Harvey Ray , Kevin L. Miller , Chris Michael Brueggen , Martin Foltin
Abstract: A technique includes determining that a given memory device of a plurality of memory devices has failed and in response to the determination that the given memory device has failed, re-encoding a data unit associated with the given memory device. The data unit is associated with a payload and a symbol-based error correction code. The re-encoding includes determining a bit-based error correction code for the payload and replacing the data unit in the memory with the payload and the bit-based error correction code.
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公开(公告)号:US20180276068A1
公开(公告)日:2018-09-27
申请号:US15468619
申请日:2017-03-24
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Gregg B. Lesartre , Craig Warner , Martin Foltin , Chris Michael Brueggen , Brian S. Birk , Harvey Ray
CPC classification number: H03M13/2906 , G06F11/1048 , G11C29/52 , G11C2029/0409 , G11C2029/0411
Abstract: In one example in accordance with the present disclosure, a system comprises a plurality of memory dies, a first region of memory allocated for primary ECC spread across a first subset of at least one memory die belonging to the plurality of memory die, wherein a portion of the primary ECC is allocated to each data block and a second region of memory allocated for secondary ECC spread across a second subset of at least one memory die included in the plurality of memory die. The system also comprises a memory controller configured to determine that an error within the first data block cannot be corrected using a first portion of the primary ECC allocated to the first data block, access the second region allocated for secondary ECC stored on the at least one memory die belonging to the plurality of memory die and attempt to correct the error using the primary and secondary ECC.
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公开(公告)号:US20180032400A1
公开(公告)日:2018-02-01
申请号:US15224988
申请日:2016-08-01
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Gregg B. Lesartre , Martin Foltin
CPC classification number: G06F11/142 , G06F3/0619 , G06F3/0629 , G06F3/0673 , G06F2201/805 , G06F2201/81
Abstract: In various examples, a device comprises a memory. The memory comprises a plurality of dies and logic. The logic may: determine a tolerable bit error rate (BER) of the memory based on whether one of the plurality of dies has failed, and adjust a parameter of the memory based on the tolerable BER.
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公开(公告)号:US20170308327A1
公开(公告)日:2017-10-26
申请号:US15136840
申请日:2016-04-22
Applicant: Hewlett Packard Enterprise Development LP
Inventor: Gregg B. Lesartre , Martin Foltin
IPC: G06F3/06
CPC classification number: G06F3/0659 , G06F3/0613 , G06F3/0679 , G06F12/0868 , G06F2212/1024 , G06F2212/213 , G06F2212/283 , G06F2212/7203
Abstract: In various examples, a memory may comprise a subarray having an associated write extension buffer; and request logic to; receive a write request associated with the subarray, execute the write request. The request logic may further determine that the write request has not completed within an allocated number of write cycles, and responsive to determining that the write request has not completed the allocated number of write cycles: store the write request in the write extension buffer.
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公开(公告)号:US20170271001A1
公开(公告)日:2017-09-21
申请号:US15500040
申请日:2015-01-30
Applicant: Hewlett Packard Enterprise Development LP
Inventor: Naveen Muralimanohar , Rajeev Balasubramonian , Martin Foltin
IPC: G11C13/00
Abstract: A method of determining a current in a memory element of a crossbar array is described. In the method, a number of pre-access operations are initiated. Each pre-access operation includes discarding a previously stored sneak current, determining a new sneak current for the crossbar array, discarding a previously stored sneak current, and storing the new sneak current. In the method, in response to a received access command, an access voltage is applied to a target memory element of the crossbar array and an element current for the target memory element is determined based on an access current and a stored sneak current.
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公开(公告)号:US09754666B2
公开(公告)日:2017-09-05
申请号:US15111194
申请日:2014-01-31
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Brent E. Buchanan , Martin Foltin , Jeffrey A. Lucas , Clinton H. Parker
CPC classification number: G11C13/004 , G11C13/0069 , G11C2013/0042 , G11C2213/77
Abstract: An apparatus includes a first resistive storage element and a second resistive storage element. The first and second resistive storage elements are coupled to column lines to of a crosspoint array to form a memory cell; and a ratio of resistances of the first and second resistive storage elements indicates a stored value for the memory cell.
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公开(公告)号:US20160343432A1
公开(公告)日:2016-11-24
申请号:US15113914
申请日:2014-01-31
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor: Richard H. Henze , Naveen Muralimanohar , Yoocharn Jeon , Martin Foltin , Erik Ordentlich , Gregg B. Lesartre , R. Stanley Williams
IPC: G11C13/00 , H01L27/24 , H01L45/00 , H01L23/528
CPC classification number: G11C13/004 , G11C5/025 , G11C11/005 , G11C13/0004 , G11C13/0007 , G11C13/0011 , G11C13/0069 , G11C2213/71 , G11C2213/72 , G11C2213/77 , G11C2213/79 , H01L23/528 , H01L27/2463 , H01L27/2481 , H01L45/04 , H01L45/06 , H01L45/085 , H01L45/1233 , H01L45/14 , H01L45/142 , H01L45/143 , H01L45/144 , H01L45/146 , H01L45/147
Abstract: A non-volatile memory device with multiple latency tiers includes at least two crossbar memory arrays, each crossbar memory array comprising a number of memory cells, each memory cell connected to a word line and a bit line at a cross point. The crossbar memory arrays each have a different latency. The crossbar memory arrays are formed on a single die.
Abstract translation: 具有多个延迟层的非易失性存储器件包括至少两个交叉存储器阵列,每个横向存储器阵列包括多个存储器单元,每个存储器单元连接到字线和位于交叉点的位线。 交叉开关存储器阵列每个具有不同的延迟。 交叉开关存储器阵列形成在单个管芯上。
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公开(公告)号:US12204961B2
公开(公告)日:2025-01-21
申请号:US18528086
申请日:2023-12-04
Applicant: Hewlett Packard Enterprise Development LP
Inventor: John Paul Strachan , Dejan S. Milojicic , Martin Foltin , Sai Rahul Chalamalasetti , Amit S. Sharma
Abstract: In some examples, a device includes a first processing core comprising a resistive memory array to perform an analog computation, and a digital processing core comprising a digital memory programmable with different values to perform different computations responsive to respective different conditions. The device further includes a controller to selectively apply input data to the first processing core and the digital processing core.
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