SEMICONDUCTOR DEVICE
    1.
    发明申请

    公开(公告)号:US20200303360A1

    公开(公告)日:2020-09-24

    申请号:US16089079

    申请日:2017-01-23

    Abstract: There is a problem that the reliability of insulation is lowered. A length L2 from a center P of a conductor layer 334 to a peripheral edge portion of an insulating member 333 is formed to be longer than a length L1 from the center P of the conductor layer 334 to a peripheral edge portion of a protruding portion 307a of a base member 307. In other words, a base end surface 308 of the peripheral edge portion of the protruding portion 307a is located on an inner side with respect to an insulating member end surface 336 of the peripheral edge portion of the insulating member 333. Further, the insulating member end surface 336 of the insulating member 333 and a conductor layer end surface 344 of the conductor layer form an end surface at the same position. Since the base end surface 308 of the peripheral edge portion of the protruding portion 307a is located on the inner side with respect to the insulating member end surface 336 of the peripheral edge portion of the insulating member 333 in this manner, an insulation distance can be secured.

    Power Converter
    4.
    发明申请
    Power Converter 审中-公开

    公开(公告)号:US20190123659A1

    公开(公告)日:2019-04-25

    申请号:US16096564

    申请日:2017-03-02

    Abstract: Reliability of a power converter is improved while suppressing an increase in size and an increase in cost of the power converter. A power converter according to the present invention includes a power semiconductor module and a flow path forming body which contains the power semiconductor module and forms a flow path through which a refrigerant flows. In the flow path forming body, a first opening which communicates one surface of the flow path forming body with the flow path is formed, and in the power semiconductor module, a first sealing surface which is formed along an insertion direction of the power semiconductor module into the flow path and faces the flow path forming body and a second sealing surface which is formed along the insertion direction and faces the flow path forming body are formed.

    POWER SEMICONDUCTOR DEVICE
    7.
    发明申请

    公开(公告)号:US20190006255A1

    公开(公告)日:2019-01-03

    申请号:US16066843

    申请日:2016-12-07

    Abstract: At the time of clamping, excessive stress is applied to bonding parts between substrates and input/output terminals, which may cause the bonding parts to be detached and cause the substrates to be cracked.A lower electrode of a power semiconductor element 11 is connected via a bonding material 13 to a first interconnection layer 12 arranged on a lower surface of the power semiconductor element 11, and an upper electrode 14 of the power semiconductor element 11 is connected via the bonding material 13 to a second interconnection layer 15 arranged on an upper surface. Also, a second main terminal 16 electrically connected to the upper electrode 14 of the power semiconductor element 11 is connected via the bonding material 13 to the second interconnection layer 15 and contacts and is positioned on a third interconnection layer 24 (spacer) arranged to be parallel to the first interconnection layer 12 on the lower surface. An insulating layer 26 is laminated on a surface of each of the first interconnection layer 12 to the third interconnection layer 24 opposite the bonding material 13, and a heat dissipating layer 27 is laminated on the insulating layer 26.

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