摘要:
A bias generator unit is provided that includes a central bias generator to provide a bias voltage, a local bias generator to receive the bias voltage and a reference voltage and to provide a forward body bias signal or a reverse body bias signal. The bias generator may include a charge pump to output (or provide) a reference voltage to a reference generator, which in turn provides reference signals to the central bias generator. As a result, the local bias generator may control the body bias signal provided by the local bias generator.
摘要:
Apparatus and systems, as well as methods and articles, may operate to select a microprocessor clock frequency responsive to a desired voltage and/or a desired temperature of operation.
摘要:
An integrated circuit (IC) package is disclosed. The IC package includes a first die; and a second die bonded to the CPU die in a three dimensional packaging layout.
摘要:
A method and apparatus are provided for adjusting a frequency of a die. This may include measuring characteristics of a die at various combinations of power supply voltage, body bias voltage and/or temperature and determining operating characteristics, such as power supply voltage and body bias voltage, based on the measured characteristics.
摘要:
In some embodiments, a chip is provided that comprises a group of transistors and a body bias generator. The group of transistors is coupled to the body bias generator. The body bias generator is configured to body bias the transistors at a level based on one or more measured parameters associated with the chip and on an operating mode. Other embodiments are disclosed herein and/or are otherwise claimed.
摘要:
Embodiments of the present invention provide a method, apparatus and system for dynamically adjusting one or more performance-related parameters of a processor core based on at least one operation parameter related to an operating condition of the processor core.
摘要:
Apparatus, system and method for managing power of a main circuitry disposed on a main substrate using a control circuitry disposed on a control substrate, in a stacked relationship with the main substrate, are described herein.
摘要:
An apparatus for and method of modifying an IC design layout of an integrated circuit, comprising: accessing an initial IC design layout, with the initial layout including a plurality of MOSFET devices having a common substrate; and removing a plurality of body contacts of the MOSFET devices to create a first modified IC design layout.
摘要:
A system may include acquisition of a supply voltage information representing past supply voltages supplied to an electrical component, acquisition of a temperature information representing past temperatures of the electrical component, and control of a performance characteristic of the electrical component based on the supply voltage information and the temperature information. Some embodiments may further include determination of a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component, and change of the performance characteristic based on the reliability margin.