摘要:
A method of forming a low dielectric constant interlayer dielectric film on a substrate by reacting, under chemical vapor deposition conditions sufficient to deposit the film on the substrate, an organosilicon precursor comprising a silyl ether, a silyl ether oligomer, or an organosilicon compound containing one or more reactive groups, to form an interlayer dielectric film having a dielectric constant of 3.5 or less. The films formed by the above method.
摘要:
A porous organosilica glass (OSG) film consists of a single phase of a material represented by the formula SivOwCxHyFz, where v+w+x+y+z=100%, v is from 10 to 35 atomic %, w is from 10 to 65 atomic %, x is from 5 to 30 atomic %, y is from 10 to 50 atomic % and z is from 0 to 15 atomic %, wherein the film has pores and a dielectric constant less than 2.6. The film is provided by a chemical vapor deposition method in which a preliminary film is deposited from organosilane and/or organosiloxane precursors and pore-forming agents (porogens) wherein the precursor is a compound of the formula R1n(OR2)p(O(O)CR4)3−n−pSi—R7—SiR3m(O(O)CR5)q(OR6)3−m−q where R1 and R3 are independently H or C1 to C4 linear or branched, saturated, singly or multiply unsaturated, cyclic, partially or fully fluorinated hydrocarbon; R2, R8 and R7 are independently C1 to C6 linear or branched, saturated, singly or multiply unsaturated, cyclic, aromatic, partially or fully fluorinated hydrocarbon, R4 and Rs are independently H, C1 to C6 linear or branched, saturated, singly or multiply unsaturated, cyclic, aromatic, partially or fully fluorinated hydrocarbon, n is 0 to 3, m is 0 to 3, q is 0 to 3 and p is 0 to 3, provided that n+m>1, n+p 3, and m+q 3, wherein the porogen is selected from the group consisting of norbornadiene, alpha-terpinene, limonene, cyclooctane, and cymene. The porogens are subsequently removed to provide the porous film.
摘要翻译:多孔有机硅玻璃(OSG)膜由式SivOwCxHyFz表示的材料的单相组成,其中v + w + x + y + z = 100%,v为10〜35原子%,w为10〜 65原子%,x为5〜30原子%,y为10〜50原子%,z为0〜15原子%,其中,膜的孔隙和介电常数小于2.6。 该薄膜由化学气相沉积方法提供,其中预备薄膜由有机硅烷和/或有机硅氧烷前体和成孔剂(致孔剂)沉积,其中前体是式R1n(OR2)p(O(O) )CR 4)3-n-pSi-R 7 -SiR 3 m(O(O)CR 5)q(OR 6)3-m-q其中R 1和R 3独立地为H或C 1至C 4直链或支链,饱和,单或多不饱和, 环状,部分或完全氟化的烃; R2,R8和R7独立为C1至C6直链或支链,饱和,单或多不饱和,环状,芳族,部分或全部是氟化的烃,R4和R5独立地为H,C1至C6直链或支链,饱和,单或多 不饱和的,环状的,芳族的,部分或完全氟化的烃,n为0至3,m为0至3,q为0至3,p为0至3,条件是n + m> 1,n + p 3和 m + q 3,其中致孔剂选自降冰片二烯,α-萜品烯,柠檬烯,环辛烷和伞花烃。 随后除去致孔剂以提供多孔膜。
摘要:
Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. In one aspect of the present invention, an organosilicate glass film is exposed to an ultraviolet light source wherein the film after exposure has an at least 10% or greater improvement in its mechanical properties (i.e., material hardness and elastic modulus) compared to the as-deposited film.
摘要:
Organofluorosilicate glass films contain both organic species and inorganic fluorines, exclusive of significant amounts of fluorocarbon species. Preferred films are represented by the formula SivOwCxHyFz, where v+w+x+y+z=100%, v is from 10 to 35 atomic %, w is from 10 to 65 atomic % y is from 10 to 50 atomic %, x is from 1 to 30 atomic %, z is from 0.1 to 15 atomic %, and x/z is optionally greater than 0.25, wherein substantially none of the fluorine is bonded to the carbon. A CVD method includes: (a) providing a substrate within a vacuum chamber; (b) introducing into the vacuum chamber gaseous reagents including a fluorine-providing gas, an oxygen-providing gas and at least one precursor gas selected from an organosilane and an organosiloxane; and (c) applying energy to the gaseous reagents in the chamber to induce reaction of the gaseous reagents and to form the film on the substrate.
摘要翻译:有机氟硅酸盐玻璃膜含有有机物质和无机氟,不含大量的碳氟化合物。 优选的膜由式SivOwCxHyFz表示,其中v + w + x + y + z = 100%,v为10至35原子%,w为10至65原子%,y为10至50原子%,x 为1〜30原子%,z为0.1〜15原子%,x / z任选大于0.25,基本上没有氟与碳键合。 CVD方法包括:(a)在真空室内提供衬底; (b)在真空室中引入气体试剂,其中包括提供供气的气体,供氧气体和至少一种选自有机硅烷和有机硅氧烷的前体气体; 和(c)向室中的气态试剂施加能量以诱导气态试剂的反应并在基底上形成膜。
摘要:
A porous organosilica glass (OSG) film consists of a single phase of a material represented by the formula SivOwCxHyFz, where v+w+x+y+z=100%, v is from 10 to 35 atomic %, w is from 10 to 65 atomic %, x is from 5 to 30 atomic %, y is from 10 to 50 atomic % and z is from 0 to 15 atomic %, wherein the film has pores and a dielectric constant less than 2.6. The film is provided by a chemical vapor deposition method in which a preliminary film is deposited from organosilane and/or organosiloxane precursors and pore-forming agents (porogens), which can be independent of, or bonded to, the precursors. The porogens are subsequently removed to provide the porous film. Compositions, such as kits, for forming the films include porogens and precursors. Porogenated precursors are also useful for providing the film.
摘要翻译:多孔有机硅玻璃(OSG)膜由式SivOwCxHyFz表示的材料的单相组成,其中v + w + x + y + z = 100%,v为10〜35原子%,w为10〜 65原子%,x为5〜30原子%,y为10〜50原子%,z为0〜15原子%,其中,膜的孔隙和介电常数小于2.6。 该薄膜通过化学气相沉积方法提供,其中预备薄膜由有机硅烷和/或有机硅氧烷前体和成孔剂(致孔剂)沉积,其可以与前体无关或与之结合。 随后除去致孔剂以提供多孔膜。 用于形成膜的组合物,例如试剂盒包括致孔剂和前体。 致孔前体也可用于提供薄膜。
摘要:
Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. In one aspect of the present invention, an organosilicate glass film is exposed to an ultraviolet light source wherein the film after exposure has an at least 10% or greater improvement in its mechanical properties (i.e., material hardness and elastic modulus) compared to the as-deposited film.
摘要:
Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. In certain embodiments of the invention, there is provided a low-temperature process to remove at least a portion of at least one pore-forming phase within a multiphasic film thereby forming a porous film. The pore-forming phase may be removed via exposure to at least one energy source, preferably an ultraviolet light source, in a non-oxidizing atmosphere.
摘要:
A chemical vapor deposition method for producing a porous organosilica glass film comprising: introducing into a vacuum chamber gaseous reagents including at least one precursor selected from the group consisting of an organosilane and an organosiloxane, and a porogen that is distinct from the precursor, wherein the porogen is a C4 to C14 cyclic hydrocarbon compound having a non-branching structure and a degree of unsaturation equal to or less than 2; applying energy to the gaseous reagents in the vacuum chamber to induce reaction of the gaseous reagents to deposit a preliminary film on the substrate, wherein the preliminary film contains the porogen; and removing from the preliminary film substantially all of the labile organic material to provide the porous film with pores and a dielectric constant less than 2.6.
摘要:
A chemical vapor deposition process for preparing a low dielectric constant organosilicate (OSG) having enhanced mechanical properties by adjusting the amount of organic groups, such as methyl groups, within the mixture is disclosed herein. In one embodiment of the present invention, the OSG film is deposited from a mixture comprising a first silicon-containing precursor that comprises from 3 to 4 Si—O bonds per Si atom, from 0 to 1 of bonds selected from the group consisting of Si—H, Si—Br, and Si—Cl bonds per Si atom and no Si—C bonds and a second silicon-containing precursor that comprises at least one Si—C bond per Si atom. In another embodiment of the present invention, the OSG film is deposited from a mixture comprising an asymmetric silicon-containing precursor. In either embodiment, the mixture may further contain a porogen precursor to provide a porous OSG film.
摘要:
A porous organosilicate glass (OSG) film: SivOwCxHyFz, where v+w+x+y+z=100%, v is 10 to 35 atomic %, w is 10 to 65 atomic %, x is 5 to 30 atomic %, y is 10 to 50 atomic % and z is 0 to 15 atomic %, has a silicate network with carbon bonds as methyl groups (Si—CH3) and contains pores with diameter less than 3 nm equivalent spherical diameter and dielectric constant less than 2.7. A preliminary film is deposited by a chemical vapor deposition method from organosilane and/or organosiloxane precursors, and independent pore-forming precursors. Porogen precursors form pores within the preliminary film and are subsequently removed to provide the porous film. Compositions, film forming kits, include organosilane and/or organosiloxane compounds containing at least one Si—H bond and porogen precursors of hydrocarbons containing alcohol, ether, carbonyl, carboxylic acid, ester, nitro, primary amine, secondary amine, and/or tertiary amine functionality or combinations.
摘要翻译:多孔有机硅酸盐玻璃(OSG)膜:其中,X,Y,X,Y, 其中v + w + x + y + z = 100%,v为10〜35原子%,w为10〜65原子%,x为5〜30原子%,y为10〜 z为0〜15原子%,具有作为甲基(Si-CH 3 3)的碳原子的硅酸盐网络,并且含有直径小于3nm的等效球径,介电常数小于2.7的孔 。 通过化学气相沉积法从有机硅烷和/或有机硅氧烷前体和独立的成孔前体沉积初步膜。 致孔剂前体在预备膜内形成孔,随后被除去以提供多孔膜。 组合物,成膜试剂盒包括含有至少一个Si-H键的有机硅烷和/或有机硅氧烷化合物,以及含有醇,醚,羰基,羧酸,酯,硝基,伯胺,仲胺和/或叔碳原子的烃的致孔剂前体 胺官能团或组合。