Fin field effect transistor and method of fabricating the same
    1.
    发明授权
    Fin field effect transistor and method of fabricating the same 有权
    Fin场效应晶体管及其制造方法

    公开(公告)号:US07968442B2

    公开(公告)日:2011-06-28

    申请号:US12459660

    申请日:2009-07-06

    IPC分类号: H01L21/28

    CPC分类号: H01L29/7854 H01L29/66795

    摘要: A fin field effect transistor includes a fin protruding from a semiconductor substrate, a gate insulating layer formed so as to cover upper and lateral surfaces of the fin, and a gate electrode formed across the fin so as to cover the gate insulating layer. An upper edge of the fin is rounded so that an electric field concentratedly applied to the upper edge of the fin through the gate electrode is dispersed. A thickness of a portion of the gate insulating layer formed on an upper surface of the fin is greater than a thickness of a portion of the gate insulating layer formed on a lateral surface of the fin, in order to reduce an electric field applied through the gate electrode.

    摘要翻译: 翅片场效应晶体管包括从半导体衬底突出的鳍片,形成为覆盖鳍片的上表面和侧表面的栅极绝缘层,以及跨过鳍状物形成以覆盖栅极绝缘层的栅电极。 鳍的上边缘是圆形的,使得通过栅电极集中地施加到鳍的上边缘的电场被分散。 形成在鳍的上表面上的栅极绝缘层的一部分的厚度大于形成在鳍的侧表面上的栅极绝缘层的一部分的厚度,以便减少通过 栅电极。

    Fin field effect transistor and method of fabricating the same
    2.
    发明申请
    Fin field effect transistor and method of fabricating the same 有权
    Fin场效应晶体管及其制造方法

    公开(公告)号:US20100109057A1

    公开(公告)日:2010-05-06

    申请号:US12459660

    申请日:2009-07-06

    IPC分类号: H01L29/78 H01L21/336

    CPC分类号: H01L29/7854 H01L29/66795

    摘要: A fin field effect transistor includes a fin protruding from a semiconductor substrate, a gate insulating layer formed so as to cover upper and lateral surfaces of the fin, and a gate electrode formed across the fin so as to cover the gate insulating layer. An upper edge of the fin is rounded so that an electric field concentratedly applied to the upper edge of the fin through the gate electrode is dispersed. A thickness of a portion of the gate insulating layer formed on an upper surface of the fin is greater than a thickness of a portion of the gate insulating layer formed on a lateral surface of the fin, in order to reduce an electric field applied through the gate electrode.

    摘要翻译: 翅片场效应晶体管包括从半导体衬底突出的鳍片,形成为覆盖鳍片的上表面和侧表面的栅极绝缘层,以及跨过鳍状物形成以覆盖栅极绝缘层的栅电极。 鳍的上边缘是圆形的,使得通过栅电极集中地施加到鳍的上边缘的电场被分散。 形成在鳍的上表面上的栅极绝缘层的一部分的厚度大于形成在鳍的侧表面上的栅极绝缘层的一部分的厚度,以便减少通过 栅电极。

    Method of fabricating flash memory with u-shape floating gate
    6.
    发明申请
    Method of fabricating flash memory with u-shape floating gate 审中-公开
    用u形浮栅制造闪速存储器的方法

    公开(公告)号:US20060246666A1

    公开(公告)日:2006-11-02

    申请号:US11410837

    申请日:2006-04-26

    IPC分类号: H01L21/336

    摘要: A method of fabricating a flash memory having a U-shape floating gate is provided. The method includes forming adjacent isolation layers separated by a gap and forming a tunnel oxide layer in the gap. After a conductive layer is formed on the tunnel oxide layer to a thickness not to fill the gap, a polishing sacrificial layer is formed on the conductive layer. The sacrificial layer and the conductive layer on the isolation layers are removed, thereby forming a U-shape floating gate self-aligned in the gap, and concurrently forming a sacrificial layer pattern within an inner portion of the floating gate. Selected isolation layers are then recessed to expose sidewalls of the floating gate. The sacrificial layer pattern is then removed from the floating gate to expose an upper surface of the floating gate.

    摘要翻译: 提供一种制造具有U形浮动栅极的闪速存储器的方法。 该方法包括形成由间隙隔开并在间隙中形成隧道氧化物层的相邻隔离层。 在隧道氧化物层上形成导电层至不填充间隙的厚度之后,在导电层上形成抛光牺牲层。 除去隔离层上的牺牲层和导电层,从而在间隙中形成自对准的U形浮动栅极,同时在浮栅的内部部分内形成牺牲层图案。 然后将选定的隔离层凹入以露出浮动栅极的侧壁。 然后从浮动栅极去除牺牲层图案以暴露浮动栅极的上表面。

    Semiconductor devices having narrow conductive line patterns and related methods of forming such semiconductor devices
    10.
    发明授权
    Semiconductor devices having narrow conductive line patterns and related methods of forming such semiconductor devices 有权
    具有窄导线图形的半导体器件和形成这种半导体器件的相关方法

    公开(公告)号:US08310055B2

    公开(公告)日:2012-11-13

    申请号:US12645820

    申请日:2009-12-23

    IPC分类号: H01L23/522 H01L21/768

    摘要: Semiconductor devices and methods of forming semiconductor devices are provided in which a plurality of patterns are simultaneously formed to have different widths and the pattern densities of some regions are increased using double patterning. The semiconductor device includes a plurality of conductive lines each including a first line portion and a second line portion, where the first line portion extends on a substrate in a first direction, the second line portion extends from one end of the first line portion in a second direction, and the first direction is different from the second direction; a plurality of contact pads each of which is connected with a respective conductive line of the plurality of conductive lines via the second line portion of the corresponding conductive line; and a plurality of dummy conductive lines each including a first dummy portion extending from a respective contact pad of the plurality of contact pads, in parallel with the corresponding second line portion in the second direction.

    摘要翻译: 提供形成半导体器件的半导体器件和方法,其中同时形成多个图案以具有不同的宽度,并且使用双重图案化来增加一些区域的图案密度。 半导体器件包括多个导线,每条导线包括第一线部分和第二线部分,其中第一线部分在第一方向上在衬底上延伸,第二线部分从第一线部分的一端延伸到 第二方向,第一方向与第二方向不同; 多个接触焊盘,每个接触焊盘经由相应的导线的第二线部分与多条导线的相应导线连接; 以及多个虚设导电线,每个虚设导电线包括从所述多个接触焊盘的相应的接触焊盘延伸的第一虚设部分,与所述第二方向上的对应的第二线部分平行。