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公开(公告)号:US20240203763A1
公开(公告)日:2024-06-20
申请号:US18288144
申请日:2022-04-25
Applicant: LAM RESEARCH CORPORATION
Inventor: Ramesh CHANDRASEKHARAN , Mohan THILAGARAJ , Karl Frederick LEESER
IPC: H01L21/67 , C23C16/458 , C23C16/46
CPC classification number: H01L21/67103 , C23C16/4586 , C23C16/46 , H01L21/67248
Abstract: A controller to control a temperature of a first substrate support in a substrate processing system includes a resistance calculation module to calculate a first resistance of a first heater element of a plurality of heater elements of the first substrate support, a temperature calculation module to calculate a first temperature of the first heater element based on the calculated first resistance, and a filter module to filter a first signal that corresponds to the calculated first resistance. The temperature calculation module selectively causes the filter module to filter the first signal in response to a determination of whether at least one condition associated with operation of the substrate processing system is met.
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公开(公告)号:US20210257188A1
公开(公告)日:2021-08-19
申请号:US17258584
申请日:2019-07-08
Applicant: LAM RESEARCH CORPORATION
Inventor: Eller Y. JUCO , Karl Frederick LEESER , Huatan QIU
IPC: H01J37/32
Abstract: A multi-signal radio frequency (RF) source includes an RF source; and a switch including an input in communication with an output of the RF source, a first output and a second output. The switch is configured to selectively connect the input to one of the first output and the second output. An RF generator in communication with the first output of the multi-signal RF source is configured to generate plasma in a processing chamber. A remote plasma generator in communication with the second output of the multi-signal RF source is configured to supply remote plasma to the processing chamber.
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公开(公告)号:US20240136161A1
公开(公告)日:2024-04-25
申请号:US18278276
申请日:2022-03-11
Applicant: LAM RESEARCH CORPORATION
Inventor: Karl Frederick LEESER , Richard BLANK , Jacob L. HIESTER
IPC: H01J37/32 , C23C16/455 , C23C16/458 , C23C16/50 , C23C16/52 , H01L21/683
CPC classification number: H01J37/32715 , C23C16/45565 , C23C16/4583 , C23C16/50 , C23C16/52 , H01J37/3244 , H01J37/32541 , H01J37/32568 , H01L21/6833 , H01J2237/2007 , H01J2237/20207
Abstract: A system comprises a pedestal and a controller. The pedestal is arranged below a showerhead in a processing chamber and includes at least three electrodes to clamp a substrate to the pedestal during processing. The controller is configured to measure a pedestal-to-showerhead gap and at least one of a magnitude and a direction of a relative tilt between the pedestal and the showerhead by sensing impedances between the at least three electrodes and the showerhead.
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公开(公告)号:US20230416922A1
公开(公告)日:2023-12-28
申请号:US18463647
申请日:2023-09-08
Applicant: Lam Research Corporation
Inventor: Yukinori SAKIYAMA , Karl Frederick LEESER , Vincent BURKHART
IPC: C23C16/52 , H01J37/32 , C23C16/505
CPC classification number: C23C16/52 , H01J37/32697 , H01J37/32715 , H01J37/32174 , C23C16/505 , H01J2237/24564 , H01J2237/0206 , H01J2237/3321
Abstract: A tool that suppresses or altogether eliminates arcing between a substrate pedestal and substrate is disclosed. The tool includes a processing chamber, a substrate pedestal for supporting a substrate within the processing chamber, and shower head positioned within the processing chamber. The shower head is arranged to dispense gas that is turned into a plasma, which develops a DC self-bias potential on the substrate surface. The tool also includes a bias control system configured to induce a DC potential to the substrate at a deliberate target electrical potential.
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公开(公告)号:US20230230820A1
公开(公告)日:2023-07-20
申请号:US18010990
申请日:2021-06-30
Applicant: LAM RESEARCH CORPORATION
Inventor: Douglas L. KEIL , Alice G. HOLLISTER , Karl Frederick LEESER
IPC: H01J37/32 , C23C16/44 , C23C16/505 , C23C16/455
CPC classification number: H01J37/32862 , C23C16/505 , C23C16/4405 , C23C16/45536 , H01J37/32357 , H01J37/32449 , H01J37/32816 , H01J2237/186 , H01J2237/0225 , H01J2237/1825 , H01J2237/3321 , H01J2237/24578
Abstract: A method for removing residue deposits from a reaction chamber includes supplying a cleaning gas into the reaction chamber via direct delivery from a remote plasma source (RPS). The cleaning gas forms a plurality of gas flow streamlines within the reaction chamber. Each of the streamlines originates at an injection point for receiving the cleaning gas and terminates at a chamber pump port coupled to a fore line for evacuating the cleaning gas. A flow characteristic of the cleaning gas is modified to redirect at least a portion of the gas flow streamlines to circulate in proximity to an inner perimeter of the reaction chamber to remove the residue deposits or to enhance the diffusion of cleaning species to surfaces to be cleaned. The inner perimeter is disposed along one or more vertical surfaces of the reaction chamber that are orthogonal to a horizontal surface including the injection point.
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公开(公告)号:US20240379316A1
公开(公告)日:2024-11-14
申请号:US18688223
申请日:2022-08-29
Applicant: Lam Research Corporation
Inventor: Karl Frederick LEESER
Abstract: In joining composite ceramic bodies, at least one ceramic body is a compositionally graded with varying concentrations between two or more ceramic materials. The compositionally graded ceramic body terminates at an interfacial layer that is substantially composed of a single ceramic material. The compositionally graded ceramic body is joined to another ceramic body that may also be compositionally graded or made of a single ceramic material, and an interfacial layer of the other ceramic body is identical in composition with the interfacial layer of the compositionally graded ceramic body. In some embodiments, the ceramic bodies may be joined by diffusion bonding. In some embodiments, the ceramic bodies include a ceramic platen and ceramic stem of a wafer pedestal implemented in a plasma processing apparatus.
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公开(公告)号:US20190172684A1
公开(公告)日:2019-06-06
申请号:US16267932
申请日:2019-02-05
Applicant: Lam Research Corporation
Inventor: Douglas KEIL , Edward J. AUGUSTYNIAK , Karl Frederick LEESER , Mohamed SABRI
IPC: H01J37/32
Abstract: A system includes an electrode. The electrode includes a showerhead having a first stem portion and a head portion. A plurality of dielectric layers is vertically stacked between the electrode and a first surface of a conducting structure. The plurality of dielectric layers includes M dielectric layers arranged adjacent to the head portion and P dielectric portions arranged around the first stem portion. The plurality of dielectric layers defines a first gap between the electrode and one of the plurality of dielectric layers, a second gap between adjacent ones of the plurality of dielectric layers, and a third gap between a last one of the plurality of dielectric layers and the first surface. A number of the plurality of dielectric layers and sizes of the first gap, the second gap, and the third gap are selected to prevent parasitic plasma between the first surface and the electrode.
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公开(公告)号:US20250038011A1
公开(公告)日:2025-01-30
申请号:US18706772
申请日:2022-11-01
Applicant: LAM RESEARCH CORPORATION
Inventor: Richard H. GOULD , Karl Frederick LEESER , Michael NORDIN , Jose VELASCO
IPC: H01L21/67
Abstract: A substrate processing tool includes: a first processing module; a vacuum transfer module connected to the first processing module; one or more pumps; a backfill source; and one or more controllers. The one or more controllers are configured to: control the one or more pumps to reduce a chamber pressure in the vacuum transfer module from a first chamber pressure to a second chamber pressure and then backfill the vacuum transfer module with an inert gas to a third chamber pressure prior to permitting transfer of a substrate into the first processing module; subsequent to backfilling the vacuum transfer module, cause a transfer of the substrate from the vacuum transfer module to the first processing module; and cause the first processing module to process the substrate.
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公开(公告)号:US20230238220A1
公开(公告)日:2023-07-27
申请号:US18129370
申请日:2023-03-31
Applicant: Lam Research Corporation
Inventor: Douglas KEIL , Edward J. AUGUSTYNIAK , Karl Frederick LEESER , Mohamed SABRI
IPC: H01J37/32 , C23C16/455
CPC classification number: H01J37/32495 , H01J37/3244 , H01J37/32623 , C23C16/45565 , H01J37/3255 , H01J37/32091
Abstract: A system includes an electrode. The electrode includes a showerhead having a first stem portion and a head portion. A plurality of dielectric layers is vertically stacked between the electrode and a first surface of a conducting structure. The plurality of dielectric layers includes M dielectric layers arranged adjacent to the head portion and P dielectric portions arranged around the first stem portion. The plurality of dielectric layers defines a first gap between the electrode and one of the plurality of dielectric layers, a second gap between adjacent ones of the plurality of dielectric layers, and a third gap between a last one of the plurality of dielectric layers and the first surface. A number of the plurality of dielectric layers and sizes of the first gap, the second gap, and the third gap are selected to prevent parasitic plasma between the first surface and the electrode.
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公开(公告)号:US20230073259A1
公开(公告)日:2023-03-09
申请号:US17799866
申请日:2021-02-17
Applicant: LAM RESEARCH CORPORATION
Inventor: Ramesh CHANDRASEKHARAN , Karl Frederick LEESER , Christopher GAGE , Seshu NIMMALA , Ramkishan Rao LINGAMPALLI , Joel HOLLINGSWORTH , Vincent BURKHART , William LAFFERTY , Sergey Georgiyevich BELOSTOTSKIY
IPC: H01J37/32
Abstract: A baseplate for a substrate support includes a heater layer configured to selectively heat the baseplate and a heat spreader disposed between the heater layer and an upper surface of the baseplate. The heat spreader is configured to distribute heat provided by the heater layer throughout the baseplate. The baseplate includes a first material that has a first coefficient of thermal expansion (CTE) and a first thermal conductivity. The heat spreader includes a second material that has a second CTE and a second thermal conductivity greater than the first thermal conductivity.
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