摘要:
A method for testing a printed circuit board to determining the dielectric loss associated with the circuit board material relative to a standard. Dielectric losses in the material generate heat when a high frequency electronic signal, such as a microwave frequency signal, is communicated through a microstrip that is embedded within the printed circuit board. The temperature or spectrum at the surface of printed circuit board is measured and compared against the temperature or spectrum of the standard to determine whether the material under test is acceptable. While various temperature measurement devices may be used, the temperature is preferably measured without contacting the surface, such as using an infrared radiation probe.
摘要:
A method for testing a printed circuit board to determining the dielectric loss associated with the circuit board material relative to a standard. Dielectric losses in the material generate heat when a high frequency electronic signal, such as a microwave frequency signal, is communicated through a microstrip that is embedded within the printed circuit board. The temperature or spectrum at the surface of printed circuit board is measured and compared against the temperature or spectrum of the standard to determine whether the material under test is acceptable. While various temperature measurement devices may be used, the temperature is preferably measured without contacting the surface, such as using an infrared radiation probe.
摘要:
A method of electrically qualifying high speed printed circuit board (PCB) connectors includes mounting a PCB connector on a test card, sending bit patterns through a first portion of the test card, evaluating a waveform on a sense signal on a second portion of the test card for the bit patterns launched on said first portion of the test card to measure common mode noise, and comparing the measured common mode noise of the second portion of the test card to a golden standard performed on a pre-qualified connector. The first portion of the test card comprises connectors to inject bit patterns. The second portion of the test card includes a split plane which induces common mode noise on a sense signal, the sense signal, and a termination pack. If the measured common mode noise on the PCB connector is worse than the golden standard, then the PCB connector is disqualified. If the measured common mode noise on the PCB connector is as good as or better than the golden standard, then the PCB connector is qualified. A first section of the PCB connector connects to the first portion of the test card and a second section of the PCB connector connects to the second portion of the test card. Transmission lines in the test card and the sense line are tightly coupled by shortening a distance between the sense line and the transmission lines.
摘要:
An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.
摘要:
A cable having an electrically conducting wire with a cross sectional shape defined by a simple closed curve having from three to eight concave portions separated by an equal number of convex portions. The simple closed curve has no point where the radius of curvature is less than one-sixth (⅙) of an overall radius of the wire and no point where adjacent curves or lines intersect at an angle. The alternating concave and convex portions of the cable's cross-sectional shape may have substantially the same curvature. The cross-sectional shape of the cable avoids sharp angles and fight curves.
摘要:
The present invention assesses memory (DIMM) strength by calculating frequency content of a radiated field which is collected by an apparatus, such as a dipole antenna. Radiated field is created by accelerated charge, which is a function of the slew rate or DIMM strength. Radiated power is directly proportional to the frequency at which bits are driven. By separating the radiated field from the near field or stored field, the DIMM strength content is isolated from other functional DIMM issues, such as tRCD latency, refresh cycles, addressing mode, etc. By examining the radiated power, the disadvantages of the prior art, such as by probing the DIMM's contacts, are avoided.
摘要:
A multi-memory module circuit topology is disclosed that includes a memory controller, a plurality of memory modules connected to the memory controller through a memory bus, and a resonator connected to the plurality of memory modules in a starburst topology. A method for reducing impedance discontinuities in a multi-memory module circuit is disclosed that includes providing a plurality of memory modules connected to a memory controller through a memory bus, selecting a starburst topology, and connecting a resonator to the plurality of memory module in dependence upon the selected starburst topology. An additional method for reducing impedance discontinuities in a multi-memory module circuit is disclosed that includes providing by a resonator a predetermined discontinuity reducing impedance at a predetermined location in the multi-memory module circuit between at least two memory modules, the multi-memory module circuit having a plurality of components of logically arranged around the predetermined location.
摘要:
An electronic system includes a circuit board formed from a composite material. The composite material includes fibers embedded within a substrate and the fibers are oriented substantially orthogonal to one another. A plurality of traces are formed on the board, and the plurality of traces are oriented relative to at least one of the fibers at an angle between about 17.5° and about 27.5° or between about 20.0° and about 25.0°. A pair of the traces are oriented substantially orthogonal to one another, and a pair of the traces are oriented relative to one another at an angle of about 45.0°. The fibers are fiberglass, and the substrate is an epoxy resin. The fibers have a different dielectric constant than the substrate.
摘要:
The present invention assesses memory (DIMM) strength by calculating frequency content of a radiated field which is collected by an apparatus, such as a dipole antenna. Radiated field is created by accelerated charge, which is a function of the slew rate or DIMM strength. Radiated power is directly proportional to the frequency at which bits are driven. By separating the radiated field from the near field or stored field, the DIMM strength content is isolated from other functional DIMM issues, such as tRCD latency, refresh cycles, addressing mode, etc. By examining the radiated power, the disadvantages of the prior art, such as by probing the DIMM's contacts, are avoided.
摘要:
Embodiments of the present invention are directed to shifting the resonant frequency in a high-frequency chip package away from an operational frequency by connecting a capacitance between an open-ended plating stub and ground. One embodiment provides a multi-layer substrate for interfacing a chip with a printed circuit board. A first outer layer provides a chip mounting location. A signal interconnect is spaced from the chip mounting location, and a signal trace extends from near the chip mounting location to the signal interconnect. A chip mounted at the chip mounting location may be connected to the signal trace by wirebonding. A plating stub extends from the signal interconnect, such as to a periphery of the substrate. A capacitor is used to capacitively couple the plating stub to a ground layer.