Abstract:
Systems, methods, and apparatus for operating an integrated circuit (IC) are provided. An apparatus may be configured to receive at one or more switches a signal from at least one circuit positioned on a first die lying within a first geometric plane, detect a signaling path between the at least one circuit positioned on the first die and at least one circuit positioned on a second die lying within a second geometric plane that is different from the first geometric plane, and control the one or more switches to route the signal along the signaling path. Circuits having a similar power characteristic are positioned adjacent to each other on the first die or the second die and circuits having a high temperature characteristic are positioned separate from each other on the first die or the second die.
Abstract:
A three-dimensional integrated circuit (3D-IC) architecture incorporates multiple layers, each layer including at least one die and at least one switch to connect the dies on the different layers. In some aspects, a power distribution network (PDN) is routed from a first layer through the switches to supply power to at least one other layer, thereby reducing routing congestion on the layers. The switches can be placed around the periphery of an IC package to improve heat dissipation (e.g., by improving heat transfer from the center to the edge of the IC package). The switches can be used for routing test signals and/or other signals between layers, thereby improving test functionality and/or fault recovery.
Abstract:
Systems, methods, and apparatus for operating an integrated circuit (IC) are provided. An apparatus may be configured to receive at one or more switches a signal from at least one circuit positioned on a first die lying within a first geometric plane, detect a signaling path between the at least one circuit positioned on the first die and at least one circuit positioned on a second die lying within a second geometric plane that is different from the first geometric plane, and control the one or more switches to route the signal along the signaling path. Circuits having a similar power characteristic are positioned adjacent to each other on the first die or the second die and circuits having a high temperature characteristic are positioned separate from each other on the first die or the second die.
Abstract:
A signal interconnect includes a transmission line, a termination circuit coupled to the transmission line, and a high pass filter circuit coupled in series along the transmission line. The high pass filter circuit includes a first resistive circuit and a first capacitive circuit coupled in parallel. The first resistive circuit has a resistance based on a difference between a resistance of the transmission line at a high frequency and a resistance of the transmission line at a low frequency.
Abstract:
A signal interconnect includes a transmission line, a termination circuit coupled to the transmission line, and a high pass filter circuit coupled in series along the transmission line. The high pass filter circuit includes a first resistive circuit and a first capacitive circuit coupled in parallel. The first resistive circuit has a resistance based on a difference between a resistance of the transmission line at a high frequency and a resistance of the transmission line at a low frequency.
Abstract:
A circuit design scheme routes wires based on temperature. In particular, temperature conditions along a prospective route are taken into account when determining whether to use that route for a wire. For example, a route can be selected from among a set of prospective routes based on which route is associated with the “smoothest” temperature gradient. Here, preference may be given to the route or routes having the smallest amount of temperature variation along the route.
Abstract:
Methods and an apparatus related to generating parameters and guidelines used in the manufacture of semiconductor IC devices are described. A method includes measuring a first oscillating signal produced by a first ring oscillator that includes a first interconnect provided in a first interconnect layer of an IC, selecting a first mode of operation for a second ring oscillator circuit that includes a second interconnect disposed in alignment with the first interconnect, selecting a second mode of operation for the second ring oscillator circuit, and determining one or more characteristics of the first interconnect based on a difference in frequency of the first oscillating signal produced when the second ring oscillator circuit is operated in the first mode and frequency of the first oscillating signal when the second ring oscillator circuit is operated in the second mode.
Abstract:
Methods and an apparatus related to generating parameters and guidelines used in the manufacture of semiconductor IC devices are described. A method includes measuring a first oscillating signal produced by a first ring oscillator that includes a first interconnect provided in a first interconnect layer of an IC, selecting a first mode of operation for a second ring oscillator circuit that includes a second interconnect disposed in alignment with the first interconnect, selecting a second mode of operation for the second ring oscillator circuit, and determining one or more characteristics of the first interconnect based on a difference in frequency of the first oscillating signal produced when the second ring oscillator circuit is operated in the first mode and frequency of the first oscillating signal when the second ring oscillator circuit is operated in the second mode.
Abstract:
Aspects disclosed in the detailed description include optimizing interconnect designs in low-power integrated circuits (ICs). In this regard, in one aspect, functional blocks having substantially correlated power utilization patterns are grouped into a power-related cluster to share a sleeping cell, thus leading to a reduced number of sleep transistors and a simplified interconnect design in a low-power IC. In another aspect, functional blocks having higher block temperatures are separated into more than one power-related cluster, improving heat dissipation in the low-power IC. A simulated annealing (SA) process is employed to determine an optimized placement for the low-power IC based on a power-related cost function that includes a power-related parameter and a heat-related parameter. By running the SA process based on the power-related cost function, it is possible to determine the optimized placement that leads to the reduced number of sleep transistors and improved heat dissipation in the low-power IC.
Abstract:
A three-dimensional integrated circuit (3D-IC) architecture incorporates multiple layers, each layer including at least one die and at least one switch to connect the dies on the different layers. In some aspects, a power distribution network (PDN) is routed from a first layer through the switches to supply power to at least one other layer, thereby reducing routing congestion on the layers. The switches can be placed around the periphery of an IC package to improve heat dissipation (e.g., by improving heat transfer from the center to the edge of the IC package). The switches can be used for routing test signals and/or other signals between layers, thereby improving test functionality and/or fault recovery.