摘要:
A NAND flash memory device according to the present invention is provided which includes a first page buffer circuit reading main data bits from the main field during a read operation, a second page buffer circuit reading redundant data bits from the redundancy field during the read operation, a first column gate circuit configured to select a part of the read main data bits and a part of the read redundant data bits in response to first column selection signals at the same time, and a second column gate circuit configured to select a part of the selected main data bits in response to second column selection signals.
摘要:
A NAND flash memory device which includes a first page buffer circuit reading main data bits from the main field during a read operation, a second page buffer circuit reading redundant data bits from the redundancy field during the read operation, a first column gate circuit configured to select a part of the read main data bits and a part of the read redundant data bits in response to first column selection signals at the same time, and a second column gate circuit configured to select a part of the selected main data bits in response to second column selection signals.
摘要:
A method for compensating an image produced by image means for implementing image information takes account of ambient illumination. Luminance of external background illumination around the image means is measured. The measured luminance of the background illumination is compared with preset tristimulus values and a reflectance factor of the image means, a comparison result is computed, and a control signal is generated to compensate luminance and chroma of an image. Luminance and chroma of the image means are compensated in response to the control signal.
摘要:
A semiconductor device includes an insulating layer on a substrate, a first electrode in the insulating layer having a first upper surface and a second upper surface, a second electrode in the insulating layer spaced apart from the first electrode by a first distance and having a third upper surface and a fourth upper surface, the third upper surface being disposed at a substantially same level as the first upper surface, and the fourth upper surface being disposed at a substantially same level as the second upper surface, a first phase change material pattern covering a part of the first upper surface of the first electrode, and a second phase change material pattern covering a part of the third upper surface of the second electrode, wherein an interface region between the second phase change pattern and the second electrode is spaced apart from an interface region between the first phase change pattern and the first electrode by a second distance greater than the first distance.
摘要:
A semiconductor memory device includes a clock inputting unit configured to receive a system clock and a data clock, a clock dividing unit configured to divide a frequency of the data clock to generate a data division clock and determining a phase of the data division clock according to a division control signal, a phase dividing unit configured to generate a plurality of multiple-phase data division clocks each having a predetermined phase difference according to the data division clock, and a first phase detecting unit configured to detect a phase of the system clock based on a predetermined selection clock among the multiple-phase data division clocks, and generate the division control signal according to the detection result.
摘要:
An on-die termination circuit of a semiconductor memory apparatus includes a comparator that compares a voltage corresponding to a normal code with a reference voltage to output a comparison signal. A code adjusting unit varies the normal code according to the comparison signal, outputs the varied normal code, and resets the normal code to a predetermined reset code or a variable fuse code.
摘要:
A non-volatile semiconductor memory device and method of programming the non-volatile semiconductor memory device are disclosed. The non-volatile semiconductor memory device includes a selected word-line and unselected word-lines including at least one unselected word-line to which a first voltage signal is applied. The selected word-line is coupled to a selected memory transistor and receives a program voltage signal in response to a program voltage enable signal. A first voltage signal is applied to the at least one unselected word-line. The first voltage signal has a voltage level of a reduced pass voltage signal before the program voltage enable signal is activated and has a voltage level of a pass voltage signal while the program voltage enable signal is activated.
摘要:
A method of forming a ferroelectric random access memory includes sequentially forming a conductive pattern, an etch-stop layer, a ferroelectric capacitor and an interlayer dielectric on a semiconductor substrate, which includes a first region and a second region. The ferroelectric capacitor is formed on the first region and the conductive pattern is formed on the second region. The interlayer dielectric is patterned to simultaneously form a first opening to expose a top surface of the ferroelectric capacitor and a second opening to expose a top surface of the etch-stop layer. The patterned interlayer dielectric is annealed in an ambient atmosphere, including oxygen atoms. The etch-stop layer exposed through the second opening is etched to expose a top surface of the conductive pattern. First and second top plugs are formed to connect to the ferroelectric capacitor and the conductive pattern through the first and second openings, respectively.
摘要:
An embodiment of the FeRAM includes a ferroelectric capacitor including a bottom electrode, a ferroelectric layer, and a top electrode. Strontium ruthenium oxide is formed between the bottom electrode and the ferroelectric layer and between the ferroelectric layer and the top electrode. A diffusion barrier layer including strontium ruthenium oxide and iridium is formed between the top electrode and a direct cell contact plug coupled to a plate line interconnecting top electrodes of ferroelectric capacitors. Thus, diffusion of nitrogen or metallic materials produced in subsequent processes is suppressed to prevent degradation of the ferroelectric layer.
摘要:
The apparatus for on-die termination of a semiconductor memory includes a first ODT (On-Die Termination) voltage generating unit that outputs a first line voltage by calibrating an input voltage with a resistance ratio according to a first code having at least two bits; a first code calibrating unit that counts the first code according to the result of a comparison between the first line voltage and a reference voltage, stops the code count when the first code reaches a maximum value or a minimum value, and stores a code value based on a final count; a second ODT voltage generating unit that outputs a second line voltage by calibrating an input voltage with a resistance ratio according to the first code and a second code having at least two bits; and a second code calibrating unit that counts the second code according to the result of a comparison between the second line voltage and the reference voltage, stops the code count when the second code reaches the maximum value or the minimum value, and stores a code value based on a final count.