Process for preparing lithium polymer secondary battery
    6.
    发明授权
    Process for preparing lithium polymer secondary battery 失效
    锂聚合物二次电池的制备工艺

    公开(公告)号:US06936380B2

    公开(公告)日:2005-08-30

    申请号:US10102666

    申请日:2002-03-22

    摘要: The present invention relates to a novel process for preparing a lithium polymer secondary battery which comprises a step of direct coating of a plasticized and crosslinked polymer electrolyte onto a lithium electrode. The process for preparing a lithium polymer secondary battery comprises the steps of: (i) dissolving a mixture of a crosslinking agent and a monomer in a molar ratio of 1:1 to 1:11 in a liquid electrolyte of 100 to 400% (w/w) to obtain a polymer electrolyte; (ii) applying the polymer electrolyte onto one side of a lithium electrode and treating with heat or UV to obtain a polymer-coated electrode; and, (iii) bonding the polymer-coated electrode to a positive electrode. In accordance with the present invention, a lithium polymer secondary battery with an improved interfacial stability between a lithium electrode and a polymer electrolyte can be prepared in a simple manner, which makes possible its wide application in the development of lithium polymer secondary battery.

    摘要翻译: 本发明涉及一种制备锂聚合物二次电池的新方法,其包括将塑化和交联的聚合物电解质直接涂覆在锂电极上的步骤。 制备锂聚合物二次电池的方法包括以下步骤:(i)将溶液的摩尔比为1:1至1:11的交联剂和单体的混合物在100至400%(w / w),得到聚合物电解质; (ii)将聚合物电解质施加到锂电极的一侧上,用热或UV进行处理以获得聚合物涂覆的电极; 和(iii)将聚合物涂覆的电极粘合到正极上。 根据本发明,可以以简单的方式制备具有改善锂电极和聚合物电解质之间的界面稳定性的锂聚合物二次电池,这使得其可广泛应用于锂聚合物二次电池的开发中。

    Methods of inspecting structures
    8.
    发明授权
    Methods of inspecting structures 有权
    检查结构的方法

    公开(公告)号:US08625110B2

    公开(公告)日:2014-01-07

    申请号:US12662079

    申请日:2010-03-30

    IPC分类号: G01B11/28

    摘要: A method of inspecting a structure. The method includes preparing preliminary spectrums of reference diffraction intensities according to critical dimensions of reference structures, obtaining a linear spectrum from the preliminary spectrums in a set critical dimension range, radiating light to respective measurement structures formed on a substrate, measuring measurement diffraction intensities of the light diffracted by the measurement structures, and obtaining respective critical dimensions of the measurement structures from the measurement diffraction intensities using the linear spectrum.

    摘要翻译: 检查结构的方法。 该方法包括根据参考结构的临界尺寸准备参考衍射强度的初步光谱,从设定的临界尺寸范围内的初步光谱获得线性光谱,将光照射到形成在基板上的各个测量结构,测量测量衍射强度 由测量结构衍射的光,并且使用线性光谱从测量衍射强度获得测量结构的临界尺寸。

    Methods of inspecting structures
    9.
    发明申请
    Methods of inspecting structures 有权
    检查结构的方法

    公开(公告)号:US20110007329A1

    公开(公告)日:2011-01-13

    申请号:US12662079

    申请日:2010-03-30

    IPC分类号: G01B11/06 G01B11/14

    摘要: A method of inspecting a structure. The method includes preparing preliminary spectrums of reference diffraction intensities according to critical dimensions of reference structures, obtaining a linear spectrum from the preliminary spectrums in a set critical dimension range, radiating light to respective measurement structures formed on a substrate, measuring measurement diffraction intensities of the light diffracted by the measurement structures, and obtaining respective critical dimensions of the measurement structures from the measurement diffraction intensities using the linear spectrum.

    摘要翻译: 检查结构的方法。 该方法包括根据参考结构的临界尺寸准备参考衍射强度的初步光谱,从设定的临界尺寸范围内的初步光谱获得线性光谱,将光照射到形成在基板上的各个测量结构,测量测量衍射强度 由测量结构衍射的光,并且使用线性光谱从测量衍射强度获得测量结构的临界尺寸。