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    Surface inspection method and surface inspection apparatus
    2.
    发明授权
    Surface inspection method and surface inspection apparatus 有权
    表面检查方法和表面检查装置

    公开(公告)号：US06888918B2

    公开(公告)日：2005-05-03

    申请号：US10715767

    申请日：2003-11-18

    Applicant: Izuo Horai ,  Kenji Aikou ,  Kyoichi Mori

    Inventor： Izuo Horai ,  Kenji Aikou ,  Kyoichi Mori

    IPC: G01B11/30 ,  G01N21/88 ,  G01N21/95 ,  G01N23/223 ,  G01B15/06

    CPC classification number: G01N23/223 ,  G01B11/30 ,  G01N21/88 ,  G01N2021/8861 ,  G01N2223/076

    Abstract: An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Alternatively, the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.

    Abstract translation: 光学检查单元在光学上检查被检查物体的表面。 处理单元根据来自光学检查单元的检查结果来检测被检查物体的表面上的缺陷及其特征，检测检测对象表面上检测到的缺陷的位置，并根据其特征对检测到的缺陷进行分类 。 处理单元根据关于缺陷的特征或分类结果的预定条件选择应执行X射线分析的缺陷。 或者，处理单元显示缺陷的位置和分类结果，并且操作者选择应执行X射线分析的缺陷。 X射线检查单元对所选或选择的缺陷进行X射线分析。

    Machine for punching out electronic circuitry parts, method for replacing tape supply reels, and method for producing electronic circuitry parts from tape
    3.
    发明授权
    Machine for punching out electronic circuitry parts, method for replacing tape supply reels, and method for producing electronic circuitry parts from tape 失效
    用于冲出电子电路部件的机器，用于替换磁带供应卷轴的方法，以及用于从磁带制造电子电路部件的方法

    公开(公告)号：US06887330B2

    公开(公告)日：2005-05-03

    申请号：US10613008

    申请日：2003-07-07

    Applicant: Jun Onoshiro ,  Kenya Wada ,  Hideaki Kataho

    Inventor： Jun Onoshiro ,  Kenya Wada ,  Hideaki Kataho

    IPC: H01L21/60 ,  H01L21/50 ,  H01L23/498 ,  H05K1/00 ,  H05K3/00 ,  H05K13/04 ,  B65H21/00

    CPC classification number: H05K13/0417 ,  H01L23/4985 ,  H01L2924/0002 ,  H05K1/0393 ,  H05K3/0052 ,  H05K3/0097 ,  Y10T83/902 ,  Y10T83/9425 ,  H01L2924/00

    Abstract: Carrier tapes, each carrying electronic circuitry parts at predetermined intervals on a carrier portion, are successively and continuously fed to a punching station from a tape feeding station with at least a pair of tape supply reels. While a carrier tape from a first supply reel is being fed to the punching station, a carrier tape from a second supply reel is set in a standby position. As soon as the carrier tape from the first supply reel is consumed to a last electronic part, a head end of the carrier tape from the second supply reel is spliced to a tail end of the carrier tape of the first supply reel by means of tape holder members located in the course of a tape supply route between the tape feeding station and the tape punching station, thereby make replacement of the tape supply reel quicker and easier.

    Abstract translation: 每个以载体部分上的预定间隔承载电子电路部件的载带从具有至少一对磁带供应卷轴的送带台连续地和连续地馈送到冲压台。 当来自第一供应卷轴的载带被馈送到冲压站时，来自第二供应卷轴的载带被设置在待机位置。 一旦来自第一供应卷轴的载带被消耗到最后一个电子部件，则来自第二供应卷轴的载带的头端通过带被拼接到第一供应卷轴的载带的尾端 保持件位于送带站和带冲孔站之间的带供应路径的过程中，从而更快速地更换带供应卷轴。

    Inspecting method and apparatus for repeated micro-miniature patterns
    5.
    发明授权
    Inspecting method and apparatus for repeated micro-miniature patterns 失效
    用于重复微型图案的检查方法和装置

    公开(公告)号：US06944325B2

    公开(公告)日：2005-09-13

    申请号：US10656221

    申请日：2003-09-08

    Applicant: Junichi Taguchi ,  Aritoshi Sugimoto ,  Masami Ikoto ,  Yuko Inoue ,  Tetsuya Watanabe ,  Wakana Shinke

    Inventor： Junichi Taguchi ,  Aritoshi Sugimoto ,  Masami Ikoto ,  Yuko Inoue ,  Tetsuya Watanabe ,  Wakana Shinke

    IPC: G01N21/956 ,  G06T7/00 ,  G06K9/00

    CPC classification number: G06T7/0004 ,  G01N21/95607 ,  G06T7/001 ,  G06T2207/30148

    Abstract: An apparatus for inspecting foreign matter in repeated micro-miniature patterns formed upon a surface of an object to be inspected, comprising: an inspection light illuminating device for irradiating an inspection light directed upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; a scattered light detector for detecting scattered light of the inspection light being scattered upon the surface said object to be inspected; means for obtaining a first information related to a foreign matter attaching upon the surface of said object to be inspected, which is obtained on a basis of the detection of said scattered light by said scattered light detector; an illumination means for applying a bright field illumination upon the surface of the object to be inspected, on which the repeated micro-miniature patterns are formed; means for picking up the image of the foreign matter, under a bright field illumination by said illumination means; means for obtaining a second information related to said foreign matter, depending upon an image of said foreign matter, which is obtained on a basis of said picking up of the image by said image picking up means under the bright field illumination; and means for displaying said first information and said second information, both being related to said foreign matter, on a display screen thereof.

    Abstract translation: 一种用于检查形成在待检查物体的表面上的重复微型图案中的异物的装置，包括：检查光照明装置，用于照射指向被检查物体的表面的检查光，其上重复 形成微型图案; 用于检测检查光的散射光的散射光检测器，散射在被检查物体的表面上; 用于根据所述散射光检测器对所述散射光的检测获得的用于获得与附着在所述被检查物体的表面上的异物有关的第一信息的装置; 照明装置，用于在其上形成有重复的微型图案的被检查物体的表面上施加明场照明; 用于在所述照明装置的明场照明下拾取异物的图像的装置; 用于根据所述异物的图像获得与所述异物相关的第二信息的装置，其基于在所述明场照明下的所述图像拾取装置的所述图像拾取而获得; 以及用于在其显示屏幕上显示与所述异物相关的所述第一信息和所述第二信息的装置。

    Method and apparatus for testing a memory device in quasi-operating conditions
    6.
    发明申请
    Method and apparatus for testing a memory device in quasi-operating conditions 失效
    用于在准操作条件下测试存储器件的方法和装置

    公开(公告)号：US20050193274A1

    公开(公告)日：2005-09-01

    申请号：US11107896

    申请日：2005-04-18

    Applicant: Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

    Inventor： Hideyuki Aoki ,  Takeshi Wada ,  Masaaki Namba ,  Noboru Uchida ,  Shigeki Katsumi ,  Yuji Wada ,  Masaaki Mochiduki

    IPC: G01R31/28 ,  G06F12/16 ,  G11C29/56 ,  G06F11/00

    CPC classification number: G11C29/56

    Abstract: A memory test system can screen objects of tests accurately at low cost in quasi-operating conditions by utilizing a personal computer. The system utilizes a PC tester comprising a measurement PC unit that carries a memory module to be used as reference; a signal distribution unit for distributing the signal taken out from the measurement PC unit; a plurality of PFBs mounted with respective objected products to be observed simultaneously by using the signals distributed by the signal distribution unit; a display panel for displaying the current status of the test that is being conducted; a power source for producing the operating voltage of the system; and a control PC for controlling the selection of test parameters and various analytical operations. The PC tester is adapted to take out the signal from the chip set LSI on the PC mother board in the measurement PC unit to the individual memories on the memory module or the memory module per se and test them in quasi-operating conditions.

    Abstract translation: 记忆测试系统可以通过使用个人计算机在准操作条件下以低成本准确地屏蔽测试对象。 该系统利用包括测量PC单元的PC测试器，该单元携带用作参考的存储器模块; 信号分配单元，用于分配从测量PC单元取出的信号; 通过使用由信号分配单元分配的信号同时观察安装有相应对象产品的多个PFB; 用于显示正在进行的测试的当前状态的显示面板; 用于产生系统的工作电压的电源; 以及用于控制测试参数和各种分析操作的选择的控制PC。 PC测试器适于将测量PC单元中的PC母板上的芯片组LSI的信号从存储器模块或存储器模块本身的各个存储器中取出，并在准工作条件下进行测试。

    ACF tape feeder machine, and method for feeding ACF tape
    8.
    发明授权
    ACF tape feeder machine, and method for feeding ACF tape 失效
    ACF送带机，ACF胶带送料方法

    公开(公告)号：US06911101B2

    公开(公告)日：2005-06-28

    申请号：US10613005

    申请日：2003-07-07

    Applicant: Jun Onoshiro ,  Kenya Wada ,  Ichiyo Ando

    Inventor： Jun Onoshiro ,  Kenya Wada ,  Ichiyo Ando

    IPC: G02F1/1345 ,  G02F1/13 ,  H01L21/00 ,  H01L21/60 ,  H05K3/32 ,  H05K3/36 ,  B32B31/20

    CPC classification number: H01L21/67132 ,  H05K3/323 ,  H05K3/361 ,  Y10T156/1712

    Abstract: From a supply reel which is set in position at an ACF (Anisotropic Concuctive Film) feeding station, an ACF tape having an ACF laminated on one side of a liner tape is drawn out by an ACF bonding means. At least two reel mount members are provided on a reel stand at the ACF feeding station to mount two ACF tape supply reels concurrently thereon. The reel stand is connected to a switch means thereby to switch the two reel mount members either to an operating or tape supplying position or a standby position. As soon as an ACF tape from a supply reel in the operating position is consumed completely, a fresh supply reel in the standby position is switched into the operating position to continue the supply of the ACF tape.

    Abstract translation: 从设置在ACF（各向异性导电膜）馈送站的位置的供带盘，通过ACF接合装置抽出层叠在衬垫带一侧的ACF的ACF带。 在ACF馈送站的卷轴架上设置至少两个卷轴安装部件，以在其上同时安装两个ACF带供应卷盘。 卷轴支架连接到开关装置，从而将两个卷轴安装部件切换到操作或送纸位置或待机位置。 一旦来自操作位置的供带盘的ACF胶带被完全消耗，则备用位置中的新鲜供应卷轴被切换到操作位置以继续供应ACF带。

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