Nitride semiconductor laser element
    2.
    发明授权
    Nitride semiconductor laser element 有权
    氮化物半导体激光元件

    公开(公告)号:US09312659B2

    公开(公告)日:2016-04-12

    申请号:US14556195

    申请日:2014-11-30

    摘要: Provided is a highly reliable nitride semiconductor laser element having a robust end face protection film not being peeled even in laser operation. The nitride semiconductor laser element includes: a semiconductor multi-layer structure including a group III nitride semiconductor and having a light-emitting end face; and a protection film including a dielectric multi-layer film and covering the light-emitting end face of the semiconductor multi-layer structure. The protection film includes an end face protection layer and an oxygen diffusion suppression layer arranged sequentially in stated order from the light-emitting end face. The end face protection layer includes a crystalline film comprising nitride including aluminum. The oxygen diffusion suppression layer has a structure in which a metal oxide film is between silicon oxide films. The metal oxide film is crystallized by laser light.

    摘要翻译: 提供了一种高可靠性的氮化物半导体激光元件,其具有即使在激光操作中也不会剥离的坚固的端面保护膜。 氮化物半导体激光元件包括:包含III族氮化物半导体并具有发光端面的半导体多层结构; 以及包含电介质多层膜并覆盖半导体多层结构的发光端面的保护膜。 保护膜包括从发光端面按顺序依次布置的端面保护层和氧扩散抑制层。 端面保护层包括包含铝的氮化物的结晶膜。 氧扩散抑制层具有金属氧化物膜在氧化硅膜之间的结构。 金属氧化物膜通过激光结晶。

    Nitride semiconductor laser element and method for manufacturing same
    4.
    发明授权
    Nitride semiconductor laser element and method for manufacturing same 有权
    氮化物半导体激光元件及其制造方法

    公开(公告)号:US08654808B2

    公开(公告)日:2014-02-18

    申请号:US13194046

    申请日:2011-07-29

    申请人: Tomonori Morizumi

    发明人: Tomonori Morizumi

    IPC分类号: H01S5/00

    摘要: A nitride semiconductor laser element has: a nitride semiconductor layer having cavity planes at the ends of a waveguide region, an insulating film formed on an upper face of the nitride semiconductor layer so that the ends on the cavity plane side are isolated from cavity planes, and a first film formed from the cavity plane to the upper face of the nitride semiconductor layer, and covered part of the insulating film surface, the first film has a first region that is in contact with the nitride semiconductor and a second region that is in contact with the insulating film, and is formed from AlxGa1-xN (0

    摘要翻译: 氮化物半导体激光元件具有:在波导区域的端部具有空腔平面的氮化物半导体层,形成在氮化物半导体层的上表面上的绝缘膜,使得空腔平面侧的端部与空腔平面隔离, 以及从所述空腔平面到所述氮化物半导体层的上表面形成的第一膜,以及所述绝缘膜表面的被覆部分,所述第一膜具有与所述氮化物半导体接触的第一区域和位于 与绝缘膜接触,并且由Al x Ga 1-x N(0

    Nitride semiconductor light-emitting device
    5.
    发明授权
    Nitride semiconductor light-emitting device 有权
    氮化物半导体发光器件

    公开(公告)号:US08437376B2

    公开(公告)日:2013-05-07

    申请号:US13294682

    申请日:2011-11-11

    IPC分类号: H01S5/00

    摘要: A nitride semiconductor device includes a multilayer semiconductor structure made of a group III nitride semiconductor and having a light-emitting facet, and a first coating film formed to cover the light-emitting facet of the multilayer semiconductor structure. The first coating film is a crystalline film made of a nitride containing aluminum. The crystalline film is composed of a group of single domains, and the single domain is comprised of a group of grains whose crystal orientation planes have a same inclination angle and a same rotation angle. A length of a boundary between the domains per unit area is 7 μm−1 or less.

    摘要翻译: 氮化物半导体器件包括由III族氮化物半导体制成并具有发光小面的多层半导体结构,以及形成为覆盖多层半导体结构的发光面的第一涂膜。 第一涂膜是由含有铝的氮化物制成的结晶膜。 结晶膜由一组单畴构成,单畴由一组晶体构成,晶粒取向面具有相同的倾斜角度和相同的旋转角度。 单位面积域之间的边界长度为7mum-1以下。

    SEMICONDUCTOR LASER DEVICE
    6.
    发明申请
    SEMICONDUCTOR LASER DEVICE 失效
    半导体激光器件

    公开(公告)号:US20120076168A1

    公开(公告)日:2012-03-29

    申请号:US13309120

    申请日:2011-12-01

    申请人: Yuichiro OKUNUKI

    发明人: Yuichiro OKUNUKI

    IPC分类号: H01S5/026

    摘要: A semiconductor laser according to the present invention comprises a λ/2 dielectric film (λ: in-medium wavelength of a dielectric film, for example, SiO2, Si3N4, Al2O3, and AlN) in contact with a facet of a resonator; and a first dielectric double layered film disposed on the dielectric film, which includes a first layer of a-Si and a second layer of a material having a refractive index lower than that of a-Si. The first layer has a thickness ¼ of an in-medium wavelength of a-Si, and the second layer has a thickness ¼ of an in-medium wavelength of the second layer. Therefore, it is possible to firmly stack the first dielectric double layered film and form a high reflectance film with high yield.

    摘要翻译: 根据本发明的半导体激光器包括与谐振器的小面接触的λ/ 2电介质膜(电介质膜的介质中波长,例如SiO 2,Si 3 N 4,Al 2 O 3和AlN) 以及设置在电介质膜上的第一介电双层膜,其包括第一层a-Si和第二层折射率低于a-Si的材料。 第一层具有a-Si的介质内波长的厚度¼,第二层具有第二层的介质内波长的厚度¼。 因此,可以将第一电介质双层膜牢固堆叠并以高产率形成高反射率膜。

    SEMICONDUCTOR LASER DEVICE
    8.
    发明申请
    SEMICONDUCTOR LASER DEVICE 失效
    半导体激光器件

    公开(公告)号:US20100246623A1

    公开(公告)日:2010-09-30

    申请号:US12572323

    申请日:2009-10-02

    申请人: Yuichiro Okunuki

    发明人: Yuichiro Okunuki

    IPC分类号: H01S5/20 H01S5/00

    摘要: A semiconductor laser according to the present invention comprises a λ/2 dielectric film (λ: in-medium wavelength of a dielectric film, for example, SiO2, Si3N4, Al2O3, and AlN) in contact with an facet of a resonator; and a first dielectric double layered film disposed on the dielectric film, which includes a first layer of a-Si and a second layer of a material having a refractive index lower than that of a-Si. The first layer has a thickness ¼ of a in-medium wavelength of a-Si, and the second layer has a thickness ¼ of a in-medium wavelength of the second layer. Therefore, it is possible to firmly stack the first dielectric double layered film and form a high reflectance film with high yield.

    摘要翻译: 根据本发明的半导体激光器包括与谐振器的面相接触的λ/ 2电介质膜(λ:介电膜的介质中波长,例如SiO 2,Si 3 N 4,Al 2 O 3和AlN) 以及设置在电介质膜上的第一介电双层膜,其包括第一层a-Si和第二层折射率低于a-Si的材料。 第一层具有a-Si的介质内波长的厚度¼,第二层具有第二层的介质内波长的厚度¼。 因此,可以将第一电介质双层膜牢固堆叠并以高产率形成高反射率膜。

    Light-Emitting Device Structure Using Nitride Bulk Single Crystal Layer
    9.
    发明申请
    Light-Emitting Device Structure Using Nitride Bulk Single Crystal Layer 有权
    使用氮化物单晶层的发光器件结构

    公开(公告)号:US20080108162A1

    公开(公告)日:2008-05-08

    申请号:US11969735

    申请日:2008-01-04

    IPC分类号: H01L33/00

    摘要: The object of this invention is to provide a high-output type nitride light emitting device. The nitride light emitting device comprises an n-type nitride semiconductor layer or layers, a p-type nitride semiconductor layer or layers and an active layer therebetween, wherein a gallium-containing nitride substrate is obtained from a gallium-containing nitride bulk single crystal, provided with an epitaxial growth face with dislocation density of 105/cm2 or less, and A-plane or M-plane which is parallel to C-axis of hexagonal structure for an epitaxial face, wherein the n-type semiconductor layer or layers are formed directly on the A-plane or M-plane. In case that the active layer comprises a nitride semiconductor containing In, an end face film of single crystal AlxGa1-xN (0≦x≦1) can be formed at a low temperature not causing damage to the active layer.

    摘要翻译: 本发明的目的是提供一种高输出型氮化物发光器件。 氮化物发光器件包括n型氮化物半导体层或p型氮化物半导体层或其间的有源层,其中含镓氮化物衬底由含镓氮化物本体单晶获得, 具有位错密度为10 5 / cm 2以下的外延生长面,平行于六方结构的C轴的A面或M面 对于外延面,其中n型半导体层直接形成在A平面或M平面上。 在有源层包括含有In的氮化物半导体的情况下,单晶Al x Ga 1-x N(0 <= x <= 1)的端面膜, 可以在不会对活性层造成损害的低温下形成。