公开(公告)号：US20230111938A1

公开(公告)日：2023-04-13

申请号：US17956751

申请日：2022-09-29

申请人： ARTERIS, INC.

发明人： Benoit LAFAGE ,  Insaf MELIANE ,  Cyril HABERT ,  Gregoire AVOT

IPC分类号： G01R31/319 ,  G01R31/317 ,  G01R31/302

摘要： A system and method are disclosed for assembling a testbench for evaluating electronic systems. The method includes assembling large testbenches by using verification features associated with functional components, automatically creating component connections, and statistically checking the testbench prior to generation and simulation. The system includes a computer system that implements the method.

公开(公告)号：US20230012393A1

公开(公告)日：2023-01-12

申请号：US17859989

申请日：2022-07-07

申请人： Tektronix, Inc.

发明人： Keith D. Rule

IPC分类号： G01R31/319 ,  G01R31/317 ,  G01R31/302

摘要： A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client. A method of providing usage-aware compressed data from a test and measurement instrument includes acquiring waveform data from one or more devices under test, receiving a user input through a user interface, determining one or more requested data types based on the user input, transforming the waveform data into compressed data containing only data elements corresponding to the one or more requested data types, and transmitting the compressed data to a client.

公开(公告)号：US20220206064A1

公开(公告)日：2022-06-30

申请号：US17133659

申请日：2020-12-24

申请人： Intel Corporation

发明人： Zhen ZHOU ,  Renzhi LIU ,  Jong-Ru GUO ,  Kenneth P. FOUST ,  Jason A. MIX ,  Kai XIAO ,  Zuoguo WU ,  Daqiao DU

IPC分类号： G01R31/302 ,  H01P3/08 ,  H01Q9/16 ,  H04B5/02 ,  G01R31/28 ,  G01R31/303

摘要： A package substrate may include a circuit and a leaky surface wave launcher. The circuit may perform engineering tests and end-user operations using sideband signals. The leaky surface wave launcher may perform near field wireless communication. The leaky surface wave launcher may include a via and a strip line. The via may be electrically coupled to the circuit. The via may provide the sideband signals to and receive the sideband signals from the circuit. The strip line may be electrically coupled to the via. The strip line may be excited by the sideband signals to wirelessly couple the leaky surface wave launcher with an external device. The strip line and the via may be unbalanced such that the strip line generates a leaky wave that propagates at least a portion of the package substrate and an environment proximate the package substrate.

公开(公告)号：US11340293B2

公开(公告)日：2022-05-24

申请号：US17061352

申请日：2020-10-01

申请人： PDF SOLUTIONS, INC.

发明人： Indranil De ,  Marian Mankos ,  Dennis Ciplickas ,  Christopher Hess ,  Jeremy Cheng ,  Balasubramanian Murugan ,  Qi Hu

IPC分类号： G01R31/26 ,  G01R31/306 ,  G01R31/302 ,  G01R31/265

摘要： Systems, devices, and methods for performing a non-contact electrical measurement (NCEM) on a NCEM-enabled cell included in a NCEM-enabled cell vehicle may be configured to perform NCEMs while the NCEM-enabled cell vehicle is moving. The movement may be due to vibrations in the system and/or movement of a movable stage on which the NCEM-enabled cell vehicle is positioned. Position information for an electron beam column producing the electron beam performing the NCEMs and/or for the moving stage may be used to align the electron beam with targets on the NCEM-enabled cell vehicle while it is moving.

公开(公告)号：US11137417B2

公开(公告)日：2021-10-05

申请号：US16554195

申请日：2019-08-28

申请人： Keysight Technologies, Inc.

发明人： Tie Qiu ,  Andrew Choon Kait Tek ,  Huang Shaoying

IPC分类号： G01R1/07 ,  G01R31/70 ,  G01R31/302 ,  G01R31/312

摘要： A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.

公开(公告)号：US20210119632A1

公开(公告)日：2021-04-22

申请号：US16681376

申请日：2019-11-12

申请人： GOWIN Semiconductor Corporation

发明人： Jinghui Zhu ,  Jiyong Zhang ,  Jianhua Liu

IPC分类号： H03K19/177 ,  G01R31/3185 ,  G01R31/302

摘要： A programmable semiconductor device contains a wireless communication block (“WCB”) capable of facilitating wirelessly field programmable gate array (“FPGA”) programming download as well as functional logic implementation. In one aspect, WCB detects an FPGA access request for initiating an FPGA reconfiguration from a remote system via a wireless communications network. Upon receiving a configuration bitstream for programming the FPGA via the wireless communications network, the configuration bitstream is forwarded from WCB to a configuration download block (“CDB”) for initiating a configuration process. CDB subsequently programs at least a portion of configurable logic blocks (“LBs”) in FPGA in response to the configuration bitstream.

公开(公告)号：US10955451B2

公开(公告)日：2021-03-23

申请号：US16184879

申请日：2018-11-08

申请人： ASE TEST, INC.

发明人： Yen-Chun Wang ,  Hung-Jen Huang ,  Chen-Kuo Chu ,  I-Chun Liu

IPC分类号： G01R29/10 ,  G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R31/302

摘要： A testing device includes a testing socket, a first transmission medium and a second transmission medium. The testing socket defines a radiation space. The first transmission medium is disposed in the radiation space of the testing socket. The first transmission medium is configured for supporting a device under test (DUT). The second transmission medium is disposed in the radiation space of the testing socket.

公开(公告)号：US20210013748A1

公开(公告)日：2021-01-14

申请号：US17015602

申请日：2020-09-09

申请人： Taiwan Semiconductor Manufacturing Company, Ltd.

发明人： MIN-JER WANG ,  CHING-NEN PENG ,  CHEWN-PU JOU ,  FENG WEI KUO ,  HAO CHEN ,  HUNG-CHIH LIN ,  HUAN-NENG CHEN ,  KUANG-KAI YEN ,  MING-CHIEH LIU ,  TSUNG-HSIUNG LEE

IPC分类号： H02J50/40 ,  H01L25/065 ,  H01L23/538 ,  H02J50/10 ,  H02J50/80 ,  G01R31/28 ,  G01R31/302 ,  H01L23/544 ,  G06F30/39 ,  H02J50/20

摘要： An integrated circuit (IC) includes a first circuit layer that includes a first wireless power transfer (WPT) device, a first chip electrically connected to the first circuit layer, and a first tracking circuit disposed in the first chip. The first WPT device may be configured to extract energy from an electromagnetic signal and provide an output voltage. The first tracking circuit may be powered by the output voltage of the first WPT device and may output tracking data in response to an instruction extracted from the electromagnetic signal.

公开(公告)号：US10852349B2

公开(公告)日：2020-12-01

申请号：US16359954

申请日：2019-03-20

申请人： MEDIATEK INC.

发明人： Chih-Yang Liu ,  Ying-Chou Shih ,  Yen-Ju Lu ,  Chih-Ming Hung ,  Jui-Lin Hsu

IPC分类号： G01R31/30 ,  G01R31/302 ,  G01R31/28 ,  G01R31/303 ,  H01Q1/22 ,  G01R1/04

摘要： A wireless test system includes a load board having an upper surface and a lower surface. The load board has a testing antenna disposed on the load board. A socket for receiving a device under test (DUT) having an antenna structure therein is disposed on the upper surface of the load board. The antenna structure is aligned with the testing antenna. The wireless test system further includes a handler for picking up and delivering the DUT to the socket. The handler has a clamp for holding and pressing the DUT. The clamp is grounded during testing and functions as a ground reflector that reflects and reverses radiation pattern of the DUT from an upward direction to a downward direction toward the testing antenna.

公开(公告)号：US10809296B2

公开(公告)日：2020-10-20

申请号：US15825018

申请日：2017-11-28

申请人： Rohde & Schwarz GmbH & Co. KG

发明人： Joachim Danz

IPC分类号： G01R31/302 ,  G01R31/307 ,  G01R31/317 ,  G01R31/28 ,  H04B17/29

摘要： An over-the-air test system is described that is used for testing a device under test in a wireless communication environment. The test system comprises at least one measurement antenna connected with a signal processing unit configured to generate a signal or to analyze a signal. The test system further comprises a reflector configured to reflect electromagnetic signals, the reflector being positioned in a signal path established between the device under test and the measurement antenna such that the signals are reflected by the reflector. The measurement antenna has a radiation pattern with a main lobe, the measurement antenna being configured to adjust the direction of the main lobe with respect to the reflector in order to simulate different impinging angles of the signals. Further, a method for testing a device under test is described.