Abstract:
A method and system for providing a MEMS sensor integrated with a flip chip are disclosed. In a first aspect, the system comprises a MEMS sensor, at least one flip chip coupled to the MEMS sensor, and at least one through-silicon via (TSV) that electrically connects the at least one flip chip to the MEMS sensor. In a second aspect, the system comprises a MEMS sensor that includes a CMOS coupled to a MEMS structure, wherein the CMOS comprises a substrate coupled to an interconnect in contact with the MEMS structure. The system further comprises a plurality of flip chips coupled to the substrate, a plurality of TSV that electrically connect the plurality of flip chips to the interconnect, and a plurality of layers on the substrate to provide electrical connections between the plurality of flip chips and from the plurality of flip chips to at least one external component.
Abstract:
The present invention generally relates to a DVC having a charge-pump coupled to a MEMS device. The charge-pump is designed to control the output voltage delivered to the electrodes, such as the pull-in electrode or the pull-off electrode, that move the switching element within the MEMS device between locations spaced far from and disposed closely to the RF electrode.
Abstract:
The present invention generally relates to a method of operating a MEMS DVC while minimizing impact of the MEMS device on contact surfaces. By reducing the drive voltage upon the pull-in movement of the MEMS device, the acceleration of the MEMS device towards the contact surface is reduced and thus, the impact velocity is reduced and less damage of the MEMS DVC device occurs.
Abstract:
Es wird ein auf Waferlevel herstellbares Bauelement mit einem ersten Chip (CH1) und einem damit verbundenen zweiten Chip (CH2) angegeben. Die Verbindung wird über eine erste und eine zweite Ver bindungsstruktur (VS1, VS2) und eine erste und eine zweite Kontaktstruktur (KS1, KS2) des zweiten chip (zumindest teilweise) hergestellt. Eine Anpassstruktur (A5) zwischen dem ersten Chip und der ersten Verbindungsstruktur gleicht eine Höhendifferenz zwischen der ersten und der zweiten Kontaktstruktur aus.
Abstract:
This disclosure provides systems, methods and apparatus for generating images using dual-shutter shutter assemblies. Such shutter assemblies include two shutters that move over a common aperture to selectively obstruct the passage of light there through. In the closed position, portions of one of the shutters overlaps a portion of the other shutter to provide such light obstruction without the two shutters needing to come into contact.
Abstract:
This document refers to multi-die micromechanical system (MEMS) packages. In an example, a multi-die MEMS package can include a controller integrated circuit (IC) configured to couple to a circuit board, a MEMS IC mounted to a first side of the controller IC, a through silicon via extending through the controller IC between the first side and a second side of the controller IC, the second side opposite the first side, and wherein the MEMS IC is coupled to the through silicon via.
Abstract:
An inertial sensor is described in which a resonant element is driven by control electronics into resonance. The control electronics includes an oscillator. A circuit is provided for matching the frequency of the oscillator with the frequency of the output of the resonant element such that the time to operation from start up of the sensor is minimised and the requirement of frequency matching a given sensor to the control electronics is removed.
Abstract:
This application relates to transducer apparatus (300, 400), especially for MEMS capacitive transducers. The apparatus has a voltage bias generator (102) for receiving a supply voltage (VDD) and generating a bias voltage (VB) for biasing a capacitive transducer (101). A voltage supply path extends between a supply voltage input terminal (309a) and the voltage bias generator (102). A programmable trim circuit (207), in use, controls the bias voltage generated by the voltage bias generator. A first filter (301) is configured to applying filtering to the voltage supply path. A programming contact pad (308) is configured to form an external contact of the transducer apparatus when packaged and is electrically coupled to the programmable trim circuit via a signal path that does not include the first filter.