Abstract:
Disclosed is a connector structure on a substrate (10) which includes at least one first solder portion (16) on the surface of the substrate; at least one second solder portion (18) connected to each of the at least one first solder portions; and an epoxy layer (20) disposed about the at least one first and second solder portions in such a manner as to cover the first solder portion and contact, but not cover, the second solder portion. Also disclosed is a connector structure on a substrate which includes at least one first solder portion on the surface of said substrate; at least one second solder ball portion connected to the at least one first solder portions; wherein the melting point of the second solder ball portion is relatively higher than that of the first solder portion. Finally, disclosed is a method of testing the solderability of the above structures.
Abstract:
A laminated structure is formed by providing metal layers having wettability relative to solder at least on both sides and by inserting at least one layer of a metal which can control the diffusion of the solder between them. The terminals for connection between the substrates having structure in which a pair of solder bumps are adhered onto both surfaces of the laminated structure, and a method of producing the same are given.
Abstract:
A low cost process for fabricating solder column interconnections for an electronic package is described. The process includes the steps of filling an array of pin holes in a pin mold (14) with a lead/tin solder, which array of pin holes is in substantial registration with the array of conductive pads (12) on one side of a chip carrier (2); heating the lead/tin solder in the pin mold such that the solder becomes molten and coalesces with the array of conductive pads of the chip carrier, thereby forming an array of miniature pins (4) bonded to the array of conductive pads of the chip carrier; joining circuit components to the other side of the chip carrier; and reflowing an eutectic lead/tin solder paste screened to the corresponding array of conductive pads of a circuit board to bond the free ends of the array of miniature pins of the carrier to the corresponding array of conductive pads, thereby forming the solder column connections between the chip carrier and the circuit board. The process is suitable for mass production of reliable, high-density electrical inter-connections between a chip carrier and a supporting circuit board.
Abstract:
In connecting an electronic circuit part such as a semiconductor (1) or other part to a substrate (2) for mounting the part with solder (6), the solder is composed of a high-melting-point solder portion which is subjected working such as rolling and heat treatment in order to break the cast structure thereof, and a smaller volume of low-melting-point solder portions. The high-melting-point solder portion is connected to both the electronic circuit substrate and the electronic circuit part through the low-point-melting solder portions. This method enables interconnection between objects to be connected without impairing the high ductility and toughness of the high-melting-point solder which is subjected to working and heat treatment. This soldering method ensures highly relialable manufacture of miniaturized high density circuits, such as LSI.
Abstract:
A mounting structure includes a bonding material (106) that bonds second electrodes (104) of a circuit board (105) and bumps (103) of a semiconductor package (101), the bonding material (106) being surrounded by a first reinforcing resin (107). Moreover, a portion between the outer periphery of the semiconductor package (101) and the circuit board (105) is covered with a second reinforcing resin (108). Even if the bonding material (106) is a solder material having a lower melting point than a conventional bonding material, high drop resistance is obtained.
Abstract:
An electronic component housing container includes a container body housing an electronic component inside a cavity constituted by a bottom plate (1) and a side wall (2) which surrounds a center region of the bottom plate (1), and an input-output terminal (3). The input-output terminal (3) includes an insulation member (5), a pin terminal (4), and a ring-like member (6). The insulation member (5) is bonded to a periphery of an opening of a through hole (2a) provided in the side wall (2) so as to close the through hole (2a). The pin terminal (4) has a flange portion (4a) protruding from an outer peripheral surface of the pin terminal, and is pierced through the insulation member (5), and the flange portion (4a) is bonded to the insulation member (5). The ring-like member (6), through which the pin terminal (4) passes, is bonded to the outer peripheral surface of the pin terminal (4) and to the insulation member (5), on an opposite side to a surface of the insulation member (4) to which the flange portion (4a) is bonded. Problems arising in the bonding portion of the insulation member (5) due to a force applied to the tip of the pin terminal (4) are alleviated.
Abstract:
An electronic component housing container includes a container body housing an electronic component inside a cavity constituted by a bottom plate (1) and a side wall (2) which surrounds a center region of the bottom plate (1), and an input-output terminal (3). The input-output terminal (3) includes an insulation member (5), a pin terminal (4), and a ring-like member (6). The insulation member (5) is bonded to a periphery of an opening of a through hole (2a) provided in the side wall (2) so as to close the through hole (2a). The pin terminal (4) has a flange portion (4a) protruding from an outer peripheral surface of the pin terminal, and is pierced through the insulation member (5), and the flange portion (4a) is bonded to the insulation member (5). The ring-like member (6), through which the pin terminal (4) passes, is bonded to the outer peripheral surface of the pin terminal (4) and to the insulation member (5), on an opposite side to a surface of the insulation member (4) to which the flange portion (4a) is bonded. Problems arising in the bonding portion of the insulation member (5) due to a force applied to the tip of the pin terminal (4) are alleviated.