DESIGN SUPPORT METHOD AND APPARATUS FOR PRINTED CIRCUIT BOARD
    2.
    发明申请
    DESIGN SUPPORT METHOD AND APPARATUS FOR PRINTED CIRCUIT BOARD 有权
    印刷电路板的设计支持方法和设备

    公开(公告)号:US20110239176A1

    公开(公告)日:2011-09-29

    申请号:US13155204

    申请日:2011-06-07

    IPC分类号: G06F17/50

    摘要: An orthogonal array is formed by performing electromagnetic field analysis only once and determining a range by using the mount position and type of a capacitor and the number of capacitors as parameters to perform circuit analysis a small number of times. An estimation equation is formed by using as an index a result of the absolute value of the calculated power source impedance, and a capacitor is disposed to reduce noises by using the estimation equation.

    摘要翻译: 仅通过执行电磁场分析一次形成正交阵列,并且通过使用电容器的安装位置和类型以及电容器数量作为参数来确定范围以进行电路分析次数少。 通过使用计算的电源阻抗的绝对值的结果作为指标来形成估计方程,并且通过使用估计方程来设置电容器以减少噪声。

    TEST METHOD AND INTERPOSER USED THEREFOR
    3.
    发明申请
    TEST METHOD AND INTERPOSER USED THEREFOR 失效
    使用的测试方法和插入器

    公开(公告)号:US20110234249A1

    公开(公告)日:2011-09-29

    申请号:US13044717

    申请日:2011-03-10

    IPC分类号: G01R31/00

    CPC分类号: G01R31/2889

    摘要: An interposer to be mounted with an integrated circuit to be a test object is provided with a switch and a probe to detect an electric current corresponding to individual terminals of the integrated circuit. A test pattern signal is then inputted to the integrated circuit through a test substrate as a switch that is connected to a power supply terminal of the integrated circuit and that is turned off. If the integrated circuit normally operates and the current values of all the terminals of the integrated circuit are within a tolerance, the power supply terminal connected to the turned-off switch is identified as a terminal that may be removed.

    摘要翻译: 安装有作为测试对象的集成电路的插入器设置有用于检测与集成电路的各个端子相对应的电流的开关和探头。 然后,通过作为与集成电路的电源端子连接并断开的开关的测试基板将测试图形信号输入到集成电路。 如果集成电路正常工作,并且集成电路的所有端子的电流值都在容差内,则连接到关断开关的电源端子被识别为可以被去除的端子。

    SUPPORT METHOD AND APPARATUS FOR PRINTED CIRCUIT BOARD
    4.
    发明申请
    SUPPORT METHOD AND APPARATUS FOR PRINTED CIRCUIT BOARD 有权
    印刷电路板的支持方法和装置

    公开(公告)号:US20090213558A1

    公开(公告)日:2009-08-27

    申请号:US12361761

    申请日:2009-01-29

    IPC分类号: H05K1/18

    摘要: An orthogonal array is formed by performing electromagnetic field analysis only once and determining a range by using the mount position and type of a capacitor and the number of capacitors as parameters to perform circuit analysis a small number of times. An estimation equation is formed by using as an index a result of the absolute value of the calculated power source impedance, and a capacitor is disposed to reduce noises by using the estimation equation.

    摘要翻译: 仅通过执行电磁场分析一次形成正交阵列,并且通过使用电容器的安装位置和类型以及电容器数量作为参数来确定范围以进行电路分析次数少。 通过使用计算的电源阻抗的绝对值的结果作为指标来形成估计方程,并且通过使用估计方程来设置电容器以减少噪声。

    STACKED SEMICONDUCTOR DEVICE
    5.
    发明申请
    STACKED SEMICONDUCTOR DEVICE 有权
    堆叠半导体器件

    公开(公告)号:US20070291557A1

    公开(公告)日:2007-12-20

    申请号:US11761470

    申请日:2007-06-12

    IPC分类号: G11C5/06 G11C7/00 G11C8/00

    摘要: Stacked semiconductor device includes plural memory chips, stacked together, in which waveform distortion at high speed transmission is removed. Stacked semiconductor device 1 includes plural memory chips 11, 12 stacked together. Data strobe signal (DQS) and inverted data strobe signal (/DQS), as control signals for inputting/outputting data twice per cycle, are used as two single-ended data strobe signals. Data strobe signal and inverted data strobe signal mate with each other. Data strobe signal line for the data strobe signal L4 is connected to data strobe signal (DQS) pad of first memory chip 11. Inverted data strobe signal line for /DQS signal L5 is connected to inverted data strobe signal (/DQS) pad of second memory chip 12.

    摘要翻译: 堆叠的半导体器件包括堆叠在一起的多个存储器芯片,其中高速传输中的波形失真被去除。 堆叠半导体器件1包括堆叠在一起的多个存储器芯片11,12。 作为用于每周期两次输入/输出数据的控制信号的数据选通信号(DQS)和反相数据选通信号(/ DQS)被用作两个单端数据选通信号。 数据选通信号和反相数据选通信号相互配合。 用于数据选通信号L 4的数据选通信号线连接到第一存储芯片11的数据选通信号(DQS)焊盘。用于DQS信号L 5的反相数据选通信号线连接到反相数据选通信号(/ DQS)焊盘 的第二存储器芯片12。