Method and apparatus for controlling rise and fall of temperature in semiconductor substrates
    1.
    发明授权
    Method and apparatus for controlling rise and fall of temperature in semiconductor substrates 有权
    用于控制半导体衬底温度升高和降低的方法和装置

    公开(公告)号:US06461428B2

    公开(公告)日:2002-10-08

    申请号:US09729669

    申请日:2000-12-05

    IPC分类号: C30B2514

    摘要: A method of controlling the temperature of a semiconductor substrate for prevention of any cracks from being formed in the semiconductor substrate event though semiconductors having different temperature rise/fall characteristics are fed into a reactor in which each semiconductor substrates is subjected to an oxidation, diffusion, or a chemical vapor deposition process. The temperatures are measured at various points in the semiconductor substrates in the heated reactor; the temperature rise/fall characteristic thereof is determined by computing the rate of temperature rise and the in-plane temperature distribution out of the measured values; a temperature control program adaptable for said temperature rise/fall characteristic is automatically selected out of a plurality of temperature control programs written in advance; the semiconductor substrate is controlled on the basis of the selected temperature control program. Also is provided a susceptor to reduce contamination of the semiconductor substrate with the metal impurities containing gas flow at the time of forming a thin film on the semiconductor substrate, and a gas phase thin film growth apparatus using such susceptor. The susceptor is formed with a gas flow deflector jutting downwardly from the peripheral portion of the reverse side of the susceptor to deflect the gas flow moving upon rotation along the reverse side of the susceptor from the center thereof to the peripheral portion thereof.

    摘要翻译: 控制半导体基板的温度的方法,即使在具有不同温度上升/下降特性的半导体的半导体衬底的事件中,也可以将半导体衬底的各个半导体衬底进行氧化,扩散, 或化学气相沉积工艺。 在加热的反应器中的半导体衬底中的各个点测量温度; 其温度上升/下降特性通过计算测量值中的温度升高速率和面内温度分布来确定; 可以从预先书写的多个温度控制程序中自动选择适合于所述温度上升/下降特性的温度控制程序; 基于所选择的温度控制程序来控制半导体衬底。 还提供了一种感受器,用于在半导体衬底上形成薄膜时减少含有气体流的金属杂质的半导体衬底的污染,以及使用这种感受体的气相薄膜生长装置。 基座形成有从基座的相反侧的周边部分向下突出的气流导流器,以使沿基座的相反侧旋转的气流从其中心偏转到其周边部分。

    Wafer heating device and method of controlling the same
    2.
    发明授权
    Wafer heating device and method of controlling the same 有权
    晶圆加热装置及其控制方法

    公开(公告)号:US06250914B1

    公开(公告)日:2001-06-26

    申请号:US09556943

    申请日:2000-04-21

    IPC分类号: F27D706

    摘要: The present invention provides a wafer heating device which can improve uniformity of a temperature distribution within a surface area of a wafer, with a relatively simple structure. A wafer is supported on a susceptor of annular shape. A first heater of disc shape is disposed below the wafer, and a second heater of annular shape is disposed to surround the first heater. Radiation thermometers are arranged at a ceiling portion of a reaction chamber. The first radiation thermometer measures a temperature of a central area of the wafer, the second radiation thermometer measures a temperature of a peripheral area of the wafer, and the third radiation thermometer measures a temperature of the susceptor. The first heater and the second heater are controlled by independent closed loops. When a wafer is set on the susceptor, a power of the second heater is controlled by using a value measured by the second radiation thermometer as a feedback signal. When no wafer is set on the susceptor, the power of the second heater is controlled by using a value measured by the third radiation thermometer as a feedback signal.

    摘要翻译: 本发明提供了一种晶片加热装置,其可以以相对简单的结构提高晶片表面积内的温度分布的均匀性。 晶片支撑在环形基座上。 圆盘形状的第一加热器设置在晶片的下方,并且围绕第一加热器设置环形的第二加热器。 辐射温度计布置在反应室的顶部。 第一辐射温度计测量晶片的中心区域的温度,第二辐射温度计测量晶片的周边区域的温度,并且第三辐射温度计测量基座的温度。 第一个加热器和第二个加热器由独立的闭环控制。 当晶片设置在基座上时,通过使用由第二辐射温度计测量的值作为反馈信号来控制第二加热器的功率。 当基座上没有设置晶片时,通过使用由第三辐射温度计测量的值作为反馈信号来控制第二加热器的功率。

    Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition
    8.
    发明授权
    Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition 有权
    光化学射线或辐射敏感性树脂组合物和使用该组合物形成图案的方法

    公开(公告)号:US09052590B2

    公开(公告)日:2015-06-09

    申请号:US13393173

    申请日:2010-08-31

    摘要: According to one embodiment, an actinic-ray- or radiation-sensitive resin composition includes a resin (P) containing not only at least one repeating unit (A) that when exposed to actinic rays or radiation, is decomposed to thereby generate an acid and is expressed by any of general formulae (I) to (III) below but also a repeating unit (B) containing at least an aromatic ring group provided that the repeating unit (B) does not include any of those of general formulae (I) to (III). (The characters used in general formulae (I) to (III) have the meanings mentioned in the description.)

    摘要翻译: 根据一个实施方案,光化射线或辐射敏感性树脂组合物包括不仅含有至少一个重复单元(A)的树脂(P),当暴露于光化射线或辐射时,其被分解,从而产生酸, 由下述通式(I)〜(III)中的任何一个表示,但也包含至少含有芳环基的重复单元(B),条件是重复单元(B)不包括通式(I) 至(III)。 (通式(I)〜(III)中使用的字符具有说明书中提及的含义。)

    Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition
    9.
    发明授权
    Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition 有权
    光化学射线或辐射敏感性树脂组合物和使用该组合物形成图案的方法

    公开(公告)号:US09005870B2

    公开(公告)日:2015-04-14

    申请号:US13015169

    申请日:2011-01-27

    IPC分类号: G03F7/004 G03F7/039 G03F7/20

    摘要: According to one embodiment, an actinic-ray- or radiation-sensitive resin composition includes a resin (P) containing a repeating unit (A) that when exposed to actinic rays or radiation, is decomposed to thereby generate an acid and at least two types of repeating units B1), (B2) that when acted on by an acid, are decomposed to thereby generate an alkali-soluble group, wherein the alkali-soluble group generated by the repeating unit (B1) is different from the alkali-soluble group generated by the repeating unit (B2).

    摘要翻译: 根据一个实施方案,光化射线或辐射敏感性树脂组合物包括含有重复单元(A)的树脂(P),其在暴露于光化射线或辐射时被分解,从而产生酸和至少两种类型 重复单元B1),(B2),当被酸作用时分解,从而产生碱溶性基团,其中由重复单元(B1)产生的碱溶性基团不同于碱溶性基团 由重复单元(B2)生成。

    ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND PATTERN-FORMING METHOD USING THE SAME
    10.
    发明申请
    ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND PATTERN-FORMING METHOD USING THE SAME 审中-公开
    化学敏感性或辐射敏感性树脂组合物,耐腐蚀膜和使用其的图案形成方法

    公开(公告)号:US20140127627A1

    公开(公告)日:2014-05-08

    申请号:US13669530

    申请日:2012-11-06

    IPC分类号: G03F7/004

    摘要: Provided is an actinic ray-sensitive or radiation-sensitive resin composition, a resist film formed with the composition, and a pattern-forming method using the same. The actinic ray-sensitive or radiation-sensitive resin composition includes (P) a resin that contains the following repeating units (A), (B) and (C); and a solvent having a boiling temperature of 150° C. or less, (A) a repeating unit containing a group capable of decomposing and forming an acid upon irradiation with an actinic ray or radiation, (B) a repeating unit containing a group capable of decomposing and forming a carboxylic acid by the action of an acid, and (C) a repeating unit containing a carbon-carbon unsaturated bond.

    摘要翻译: 提供了一种光化射线敏感或辐射敏感性树脂组合物,由该组合物形成的抗蚀剂膜和使用其的图案形成方法。 光化射线敏感性或辐射敏感性树脂组合物包含(P)含有以下重复单元(A),(B)和(C)的树脂; 和沸点为150℃以下的溶剂,(A)含有能够在光化射线或辐射照射时能够分解形成酸的基团的重复单元,(B)含有能够具有基团的重复单元 通过酸的作用分解和形成羧酸,和(C)含有碳 - 碳不饱和键的重复单元。