Source/Drain Technology for the Carbon Nano-tube/Graphene CMOS with a Single Self-Aligned Metal Silicide Process
    101.
    发明申请
    Source/Drain Technology for the Carbon Nano-tube/Graphene CMOS with a Single Self-Aligned Metal Silicide Process 有权
    碳纳米管/石墨烯CMOS单源自对准金属硅化物工艺的源/排水技术

    公开(公告)号:US20110253980A1

    公开(公告)日:2011-10-20

    申请号:US12762832

    申请日:2010-04-19

    IPC分类号: H01L29/775 H01L21/336

    摘要: Electronic devices having carbon-based materials and techniques for making contact to carbon-based materials in electronic devices are provided. In one aspect, a device is provided having a carbon-based material; and at least one electrical contact to the carbon-based material comprising a metal silicide, germanide or germanosilicide. The carbon-based material can include graphene or carbon nano-tubes. The device can further include a segregation region, having an impurity, separating the carbon-based material from the metal silicide, germanide or germanosilicide, wherein the impurity has a work function that is different from a work function of the metal silicide, germanide or germanosilicide. A method for fabricating the device is also provided.

    摘要翻译: 提供了具有碳基材料的电子器件和用于与电子器件中的碳基材料接触的技术。 一方面,提供一种具有碳基材料的装置; 以及与包含金属硅化物,锗化锗或锗硅化物的碳基材料的至少一个电接触。 碳基材料可包括石墨烯或碳纳米管。 该装置还可以包括具有杂质的偏析区域,从金属硅化物,锗化锗或锗硅化物中分离碳基材料,其中该杂质具有不同于金属硅化物,锗化锗或锗硅酸盐的功函数 。 还提供了一种用于制造该装置的方法。

    Method for forming a protection layer over metal semiconductor contact and structure formed thereon
    103.
    发明授权
    Method for forming a protection layer over metal semiconductor contact and structure formed thereon 失效
    用于在金属半导体接触和其上形成的结构上形成保护层的方法

    公开(公告)号:US08030154B1

    公开(公告)日:2011-10-04

    申请号:US12849223

    申请日:2010-08-03

    IPC分类号: H01L21/8238

    摘要: In one embodiment, a method of forming a semiconductor device is provided that includes providing a gate structure on a semiconductor substrate. Sidewall spacers may be formed adjacent to the gate structure. A metal semiconductor alloy may be formed on the upper surface of the gate structure and on an exposed surface of the semiconductor substrate that is adjacent to the gate structure. An upper surface of the metal semiconductor alloy is converted to an oxygen-containing protective layer. The sidewall spacers are removed using an etch that is selective to the oxygen-containing protective layer. A strain-inducing layer is formed over the gate structure and the semiconductor surface, in which at least a portion of the strain-inducing layer is in direct contact with the sidewall surface of the gate structure. In another embodiment, the oxygen-containing protective layer of the metal semiconductor alloy is provided by a two stage annealing process.

    摘要翻译: 在一个实施例中,提供了一种形成半导体器件的方法,其包括在半导体衬底上提供栅极结构。 侧壁间隔件可以与栅极结构相邻地形成。 可以在栅极结构的上表面和与栅极结构相邻的半导体衬底的暴露表面上形成金属半导体合金。 将金属半导体合金的上表面转化为含氧保护层。 使用对含氧保护层具有选择性的蚀刻来去除侧壁间隔物。 应变诱导层形成在栅极结构和半导体表面上,其中应变诱导层的至少一部分与栅极结构的侧壁表面直接接触。 在另一个实施方案中,金属半导体合金的含氧保护层通过两阶段退火工艺提供。

    Bipolar transistor with silicided sub-collector
    104.
    发明授权
    Bipolar transistor with silicided sub-collector 有权
    双极晶体管,带硅化子集电极

    公开(公告)号:US07679164B2

    公开(公告)日:2010-03-16

    申请号:US11620242

    申请日:2007-01-05

    IPC分类号: H01L27/102

    摘要: Embodiments of the invention provide a semiconductor device including a collector in an active region; a first and a second sub-collector, the first sub-collector being a heavily doped semiconductor material adjacent to the collector and the second sub-collector being a silicided sub-collector next to the first sub-collector; and a silicided reach-through in contact with the second sub-collector, wherein the first and second sub-collectors and the silicided reach-through provide a continuous conductive pathway for electrical charges collected by the collector from the active region. Embodiments of the invention also provide methods of fabricating the same.

    摘要翻译: 本发明的实施例提供了一种在有源区域中包括集电极的半导体器件; 第一和第二子集电极,所述第一子集电极是与所述集电极相邻的重掺杂半导体材料,所述第二子集电极是靠近所述第一子集电极的硅化副集电极; 以及与所述第二子集电器接触的硅化物到达通道,其中所述第一和第二子集电极和所述硅化物到达通道为所述集电器从所述有源区域收集的电荷提供连续的导电路径。 本发明的实施例还提供了制造该方法的方法。

    SILICIDE GATE FIELD EFFECT TRANSISTORS AND METHODS FOR FABRICATION THEREOF
    110.
    发明申请
    SILICIDE GATE FIELD EFFECT TRANSISTORS AND METHODS FOR FABRICATION THEREOF 失效
    硅锗栅场效应晶体管及其制造方法

    公开(公告)号:US20070254478A1

    公开(公告)日:2007-11-01

    申请号:US11380528

    申请日:2006-04-27

    IPC分类号: H01L21/44

    摘要: A method for fabricating a silicide gate field effect transistor includes masking a silicon source/drain region prior to forming the silicide gate by annealing a metal silicide forming metal layer contacting a silicon-containing gate. The silicide gate may be either a fully silicided gate or a partially silicided gate. After unmasking the source/drain region a silicide layer may be formed upon the source/drain region, and also upon the partially silicided gate. The second silicide layer and the partially silicided gate also provide a fully silicided gate.

    摘要翻译: 一种用于制造硅化物栅极场效应晶体管的方法,包括:在形成硅化物栅极之前,通过使接触含硅栅极的金属硅化物形成金属层退火来掩蔽硅源/漏极区。 硅化物栅极可以是完全硅化的栅极或部分硅化的栅极。 在去掩蔽源/漏区之后,可以在源极/漏极区上形成硅化物层,并且还可以在部分硅化物栅极上形成硅化物层。 第二硅化物层和部分硅化物栅极还提供完全硅化的栅极。