Chemical vapor deposition apparatus
    12.
    发明授权
    Chemical vapor deposition apparatus 失效
    化学气相沉积装置

    公开(公告)号:US6143077A

    公开(公告)日:2000-11-07

    申请号:US905766

    申请日:1997-08-04

    CPC分类号: C23C16/4557 C23C16/45572

    摘要: A source gas delivery system 4 which delivers the source gas to the surface of the heated substrate 20 is furnished with a gas delivery guide 44 of a shape such that the distance from the substrate 20 becomes narrower either gradually on in steps from the edge of the gas delivery port 443 on the same axis as the substrate 20 toward the outer edge, and delivers the source gas in such a way that the thickness distribution of the boundary layer which is the region in the vicinity of the surface of the substrate 20 where the velocity of the flow of source gas along the surface of the substrate is essentially zero is almost constant or gradually becomes narrower in the direction of the flow.

    摘要翻译: 将源气体输送到加热的基板20的表面的源气体输送系统4配备有气体输送引导件44,其形状使得从基板20的距离逐渐变窄, 气体输送口443在与基板20相同的轴上朝向外边缘,并且以这样的方式输送源气体,使得作为基板20的表面附近的区域的边界层的厚度分布 源气体沿着衬底表面的流动速度基本上为零,几乎是恒定的或在流动方向上逐渐变窄。

    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    16.
    发明申请
    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE 失效
    制造半导体器件的方法

    公开(公告)号:US20100221890A1

    公开(公告)日:2010-09-02

    申请号:US12557981

    申请日:2009-09-11

    IPC分类号: H01L21/762 H01L21/28

    摘要: In forming an element isolation trench, an insulating film formed above a semiconductor substrate is etched such that relatively thin insulating film situated in the memory cell region is fully removed whereas relatively thick insulating film situated in the peripheral circuit region is etched so as to leave a remainder insulating film. Then, using the remainder insulating film in the peripheral circuit region as an etch stopper, the semiconductor substrate is etched, whereafter the remainder insulating film in the peripheral circuit region is fully removed to subsequently etch the semiconductor substrate.

    摘要翻译: 在形成元件隔离沟槽时,蚀刻形成在半导体衬底之上的绝缘膜,使得位于存储单元区域中的相对薄的绝缘膜被完全去除,而位于外围电路区域中的相对较厚的绝缘膜被蚀刻以便留下 剩余绝缘膜。 然后,使用外围电路区域中的剩余绝缘膜作为蚀刻停止层,对半导体衬底进行蚀刻,然后完全除去外围电路区域中剩下的绝缘膜,随后蚀刻半导体衬底。

    PROCESS FOR FORMING HIGH RESISTIVITY THIN METALLIC FILM
    17.
    发明申请
    PROCESS FOR FORMING HIGH RESISTIVITY THIN METALLIC FILM 审中-公开
    形成高电阻薄金属膜的方法

    公开(公告)号:US20100136313A1

    公开(公告)日:2010-06-03

    申请号:US12326000

    申请日:2008-12-01

    IPC分类号: C23C16/34 B32B9/00 C01B33/00

    摘要: A process for forming metallic nitride film by atomic layer deposition (ALD), which comprises steps for feeding into a reaction space vapor phase alternated pulses of metal source material and silicon source material in a plurality of cycles, and feeding into the reaction space vapor phase pulses of nitrogen source material. wherein a nitrogen source pulse is fed intermittently in selected cycles such that a ratio of nitrogen source pulses to silicon source pulses is less than 1:1 and a ratio of nitrogen source pulses to metal source pulses is less than 1:1, the ratio selected to produce the thin film with a resistivity between 1,000 μΩcm and 15,000 μΩcm.

    摘要翻译: 一种用于通过原子层沉积(ALD)形成金属氮化物膜的方法,包括以多个循环的方式将金属源材料和硅源材料的交替脉冲进入反应空间的步骤,并将其进料到反应空间气相 脉冲氮源材料。 其中氮源脉冲以选定的循环间歇地进给,使得氮源脉冲与硅源脉冲的比例小于1:1,并且氮源脉冲与金属源脉冲的比率小于1:1,选择的比率 以产生电阻率在1000μΩ-OHgr·cm和15000μ&OHgr·cm之间的薄膜。

    Method and system for forming copper thin film
    18.
    发明授权
    Method and system for forming copper thin film 有权
    形成铜薄膜的方法和系统

    公开(公告)号:US06726954B2

    公开(公告)日:2004-04-27

    申请号:US09874066

    申请日:2001-06-06

    IPC分类号: C23C1618

    摘要: In a method and a system for forming a copper thin film in which a raw material gas is introduced into a substrate processing chamber storing a substrate and being under a reduced pressure to form a copper thin film on the substrate, an addition gas is introduced into the substrate processing chamber in addition to the raw material gas at the initial stage of deposition. Thereafter, the introduction of the addition gas is stopped, while the introduction of the raw material gas is continued. Alternatively, an addition gas is introduced into the substrate processing chamber before the start of the deposition process, and the addition gas is introduced into the substrate processing chamber in addition to the raw material gas at the initial stage of deposition. Thereafter, the introduction of the addition gas is stopped, while the introduction of the raw material gas is continued.

    摘要翻译: 在形成铜薄膜的方法和系统中,其中原料气体被引入存储基板并在减压下的基板处理室中,以在基板上形成铜薄膜,将加成气体引入 基板处理室除了在沉积的初始阶段的原料气体之外。 此后,停止引入加料气体,同时继续引入原料气体。 或者,在开始沉积处理之前,将添加气体引入到基板处理室中,并且在沉积的初始阶段除了原料气体之外还将添加气体引入基板处理室。 此后,停止引入加料气体,同时继续引入原料气体。

    METHOD FOR CONTROLLING FLOW AND CONCENTRATION OF LIQUID PRECURSOR
    20.
    发明申请
    METHOD FOR CONTROLLING FLOW AND CONCENTRATION OF LIQUID PRECURSOR 有权
    用于控制液体前体流动和浓度的方法

    公开(公告)号:US20100178423A1

    公开(公告)日:2010-07-15

    申请号:US12353076

    申请日:2009-01-13

    IPC分类号: C23C16/455 F17D1/16

    摘要: A method for controlling flow and concentration of a liquid precursor includes: supplying a carrier gas to a first auto-pressure regulator and outputting therefrom the carrier gas at a first pressure to a precursor reservoir; outputting the mixture of the vaporized precursor and the carrier gas from the precursor reservoir; and supplying the mixture to a second auto-pressure regulator and outputting therefrom the mixture at a second pressure to a reactor via an orifice.

    摘要翻译: 用于控制液体前体的流动和浓缩的方法包括:将载气供应到第一自动压力调节器,并将载体气体以第一压力从其输出到前体储存器; 从前体储存器输出蒸发的前体和载气的混合物; 以及将所述混合物供应到第二自动压力调节器,并且通过孔口将所述混合物以第二压力从所述反应器输出。