Avalanche photodiode device with a curved absorption region

    公开(公告)号:US11600734B2

    公开(公告)日:2023-03-07

    申请号:US17373084

    申请日:2021-07-12

    Applicant: IMEC VZW

    Abstract: An avalanche photodiode (APD) device, in particular, a lateral separate absorption charge multiplication (SACM) APD device, and a method for its fabrication is provided. The APD device comprises a first contact region and a second contact region formed in a semiconductor layer. Further, the APD device comprises an absorption region formed on the semiconductor layer, wherein the absorption region is at least partly formed on a first region of the semiconductor layer, wherein the first region is arranged between the first contact region and the second contact region. The APD device further includes a charge region formed in the semiconductor layer between the first region and the second contact region, and an amplification region formed in the semiconductor layer between the charge region and the second contact region. At least the absorption region is curved on the semiconductor layer.

    Method for Fabricating an Avalanche Photodiode Device

    公开(公告)号:US20220013682A1

    公开(公告)日:2022-01-13

    申请号:US17370578

    申请日:2021-07-08

    Applicant: IMEC VZW

    Abstract: A method is provided for fabricating an avalanche photodiode (APD) device, in particular, a separate absorption charge multiplication (SACM) APD device. The method includes forming a first contact region and a second contact region in a semiconductor layer. Further, the method includes forming a first mask layer above at least a first contact region of the semiconductor layer adjacent to the first contact region, and forming a second mask layer above and laterally overlapping the first mask layer. Thereby, a mask window is defined by the first mask layer and the second mask layer, and the first mask layer and/or the second mask layer are formed above a second contact region of the semiconductor layer adjacent to the second contact region. Further, the method includes forming a charge region in the semiconductor layer through the mask window, wherein the charge region is formed between the first contact region and the second contact region, and comprises forming an absorption region on the first contact region using the first mask layer. An APD fabricated by the disclosed method is also provided.

    III-V semiconductor waveguide nanoridge structure

    公开(公告)号:US10690852B2

    公开(公告)日:2020-06-23

    申请号:US16228486

    申请日:2018-12-20

    Applicant: IMEC vzw

    Abstract: A III-V semiconductor waveguide nanoridge structure having a narrow supporting base with a freestanding wider body portion on top, is disclosed. In one aspect, the III-V waveguide includes a PIN diode. The waveguide comprises a III-V semiconductor waveguide core formed in the freestanding wider body portion; at least one heterojunction incorporated in the III-V semiconductor waveguide core; a bottom doped region of a first polarity positioned at a bottom of the narrow supporting base, forming a lower contact; and an upper doped region of a second polarity, forming an upper contact. The upper contact is positioned in at least one side wall of the freestanding wider body portion.

    Active-Passive Waveguide Photonic System
    17.
    发明申请

    公开(公告)号:US20190101711A1

    公开(公告)日:2019-04-04

    申请号:US16150898

    申请日:2018-10-03

    Abstract: Example embodiments relate to active-passive waveguide photonic systems. An example embodiment includes a monolithic integrated active/passive waveguide photonic system. The system includes a substrate having positioned thereon at least one active waveguide and at least one passive waveguide. The at least one active waveguide and the at least one passive waveguide are monolithically integrated and are arranged for evanescent wave coupling between the waveguides. The at least one active waveguide and the at least one passive waveguide are positioned so that at least a portion of each waveguide does not overlap the other waveguide, both in a height direction and in a lateral direction with respect to the substrate.

    Integrated avalanche germanium photodetector
    18.
    发明申请
    Integrated avalanche germanium photodetector 有权
    集成雪崩锗光电探测器

    公开(公告)号:US20160204298A1

    公开(公告)日:2016-07-14

    申请号:US14757617

    申请日:2015-12-23

    Abstract: An integrated avalanche photodetector and a method for fabrication thereof. The integrated avalanche photodetector comprises a Ge body adapted to conduct an optical mode. The Ge body comprises a first p-doped region that extends from a first main surface to a second main surface of the Ge body. The Ge body further comprises a first n-doped region that extends from the first main surface towards the second main surface of the Ge body. An intrinsic region occupies the undoped part of the Ge body. A first avalanche junction is formed by the first n-doped region that is located aside the p-doped region. The Ge body further comprises an incidence surface, suitable for receiving an optical mode, and a second n-doped Ge region that covers the Ge body and forms a second avalanche junction with the first p-doped region at the first main surface.

    Abstract translation: 一种综合雪崩光电探测器及其制造方法。 集成雪崩光电检测器包括适于进行光学模式的Ge体。 Ge体包括从Ge体的第一主表面延伸到第二主表面的第一p掺杂区域。 Ge体还包括从Ge体的第一主表面朝向第二主表面延伸的第一n掺杂区域。 内在区域占据Ge体的未掺杂部分。 第一个雪崩结由位于p掺杂区域的第一n掺杂区域形成。 Ge体还包括适于接收光学模式的入射表面和覆盖Ge体并与第一主表面处的第一p掺杂区域形成第二雪崩结的第二n掺杂Ge区域。

    Monolithic III-V-on-silicon opto-electronic phase modulator with a ridge waveguide

    公开(公告)号:US11556043B2

    公开(公告)日:2023-01-17

    申请号:US17348049

    申请日:2021-06-15

    Applicant: IMEC VZW

    Abstract: A monolithic integrated electro-optical phase modulator, a Mach-Zehnder modulator including one or more of the phase modulators, and method for fabricating the phase modulator by III-V-on-silicon semiconductor processing are provided. The phase modulator includes a silicon-based n-type substrate base layer, and a III-V n-type ridge waveguide for propagating light, wherein the ridge waveguide protrudes from and extends along the n-type substrate base layer. Further, the phase modulator includes one or more insulating layers provided on the ridge waveguide, wherein the one or more insulating layers have together a thickness of 1-100 nm, and a silicon-based p-type top cover layer provided on the one or more insulating layers at least above the ridge waveguide.

    MONOLITHIC III-V-ON-SILICON OPTO-ELECTRONIC PHASE MODULATOR WITH A RIDGE WAVEGUIDE

    公开(公告)号:US20220011641A1

    公开(公告)日:2022-01-13

    申请号:US17348049

    申请日:2021-06-15

    Applicant: IMEC VZW

    Abstract: A monolithic integrated electro-optical phase modulator, a Mach-Zehnder modulator including one or more of the phase modulators, and method for fabricating the phase modulator by III-V-on-silicon semiconductor processing are provided. The phase modulator includes a silicon-based n-type substrate base layer, and a III-V n-type ridge waveguide for propagating light, wherein the ridge waveguide protrudes from and extends along the n-type substrate base layer. Further, the phase modulator includes one or more insulating layers provided on the ridge waveguide, wherein the one or more insulating layers have together a thickness of 1-100 nm, and a silicon-based p-type top cover layer provided on the one or more insulating layers at least above the ridge waveguide.

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