VERTICAL DIE-TO-DIE INTERCONNECTS BRIDGE

    公开(公告)号:US20210384130A1

    公开(公告)日:2021-12-09

    申请号:US16987405

    申请日:2020-08-07

    Abstract: The present disclosure relates to a semiconductor package that may include a substrate. The substrate may have a top surface and a bottom surface. The semiconductor package may include an opening in the substrate. The semiconductor package may include a bridge disposed in the opening. The bridge may have an upper end at the top surface of the substrate and a lower end at the bottom surface of the substrate. The semiconductor package may include a first die on the top surface of the substrate at least partially extending over a first portion of the upper end of the bridge. The semiconductor package may include a second die on the bottom surface of the substrate at least partially extending over the lower end of the bridge. The bridge may couple the first die to the second die.

    MULTI-CHIP PACKAGE WITH EXTENDED FRAME

    公开(公告)号:US20220068782A1

    公开(公告)日:2022-03-03

    申请号:US17089749

    申请日:2020-11-05

    Abstract: According to the various aspects, a multi-chip semiconductor package includes a package substrate, an interconnect frame extending beyond a first side edge of the package substrate, the interconnect frame including a bottom surface positioned over and coupled to a top surface of the package substrate, a first semiconductor device positioned at least partially over and coupled to the interconnect frame, and a second semiconductor device positioned on the bottom surface of the interconnect frame alongside of the package substrate. The interconnect frame further includes a redistribution layer and a frame construct layer, and a plurality of vias coupled to the redistribution layer, with the frame construct layer further includes a recessed area, and the first semiconductor device is positioned in the recessed area.

    SEMICONDUCTOR PACKAGE WITH HYBRID MOLD LAYERS

    公开(公告)号:US20210335698A1

    公开(公告)日:2021-10-28

    申请号:US17367684

    申请日:2021-07-06

    Abstract: According to various examples, a device is described. The device may include a first package substrate. The device may also include a first mold layer with a first thickness. The device may also include a second mold layer with a second thickness proximal to the first mold layer. The second thickness may be larger than the first thickness. The first mold layer may include a plurality of first interconnects coupled to the first package substrate. The second mold layer may include a plurality of second interconnects configured to couple the first package substrate to a printed circuit board.

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