公开(公告)号：US20180150156A1

公开(公告)日：2018-05-31

申请号：US15879729

申请日：2018-01-25

Applicant: Intel Corporation

Inventor： Sven Albers ,  Klaus Reingruber ,  Teodora Ossiander ,  Andreas Wolter ,  Sonja Koller ,  Georg Seidemann ,  Jan Proschwitz ,  Hans-Joachim Barth ,  Bastiaan Elshof

IPC: G06F3/044 ,  G06F3/045 ,  G06F3/042 ,  G01L1/24 ,  G06F3/0354 ,  G06F3/038 ,  H04B1/3827 ,  G06F1/16

CPC classification number: G06F3/044 ,  G01L1/24 ,  G06F1/163 ,  G06F3/03547 ,  G06F3/038 ,  G06F3/042 ,  G06F3/045 ,  G06F2203/04102 ,  G06F2203/04109 ,  H04B1/385

Abstract: Some forms relate to wearable computing devices that include a “touch pad” like interface. In some forms, the example wearable computing devices may be integrated with (or attached to) textiles (i.e. clothing). In other forms, the example wearable computing devices may be attached directly to the skin of someone (i.e., similar to a bandage) that utilizes any of the example wearable computing devices. The example wearable computing devices include a flexible touch pad that may allow a user of the wearable computing device to more easily operate the wearable computing device. The example wearable computing devices described herein may include a variety of electronics. Some examples include a power supply and/or a communication device among other types of electronics.

公开(公告)号：US09343389B2

公开(公告)日：2016-05-17

申请号：US14827056

申请日：2015-08-14

Applicant: INTEL CORPORATION

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L23/32 ,  H01L23/498 ,  H01L25/065 ,  H01L25/00 ,  H01L23/00

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US20150357311A1

公开(公告)日：2015-12-10

申请号：US14827056

申请日：2015-08-14

Applicant: INTEL CORPORATION

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L25/065

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US20250132259A1

公开(公告)日：2025-04-24

申请号：US18989232

申请日：2024-12-20

Applicant: Intel Corporation

Inventor： Bernd Waidhas ,  Carlton Hanna ,  Stephen Morein ,  Lizabeth Keser ,  Georg Seidemann

IPC: H01L23/538 ,  H01L23/50 ,  H01L23/522

Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate, having a surface, including a first conductive pathway electrically coupled to a power source; a first microelectronic component, having an active side electrically coupled to the surface of the package substrate and an opposing back side, surrounded by an insulating material; a second microelectronic component, having an active side electrically coupled to the surface of the package substrate and an opposing back side, surrounded by the insulating material and including a through-substrate via (TSV) electrically coupled to the first conductive pathway; and a redistribution layer (RDL), on the insulating material, including a second conductive pathway electrically coupling the TSV, the second surface of the second microelectronic component, and the second surface of the first microelectronic component.

公开(公告)号：US12243856B2

公开(公告)日：2025-03-04

申请号：US18217000

申请日：2023-06-30

Applicant: Intel Corporation

Inventor： David O'Sullivan ,  Georg Seidemann ,  Richard Patten ,  Bernd Waidhas

IPC: H01L25/10 ,  H01L21/48 ,  H01L21/56 ,  H01L23/00 ,  H01L23/31 ,  H01L23/538 ,  H01L25/00

Abstract: Embodiments include semiconductor packages and a method of forming the semiconductor packages. A semiconductor package includes a mold over and around a first die and a first via. The semiconductor package has a conductive pad of a first redistribution layer disposed on a top surface of the first die and/or a top surface of the mold. The semiconductor package includes a second die having a solder ball coupled to a die pad on a bottom surface of the second die, where the solder ball of the second die is coupled to the first redistribution layer. The first redistribution layer couples the second die to the first die, where the second die has a first edge and a second edge, and where the first edge is positioned within a footprint of the first die and the second edge is positioned outside the footprint of the first die.

公开(公告)号：US12211796B2

公开(公告)日：2025-01-28

申请号：US17355747

申请日：2021-06-23

Applicant: Intel Corporation

Inventor： Bernd Waidhas ,  Carlton Hanna ,  Stephen Morein ,  Lizabeth Keser ,  Georg Seidemann

IPC: H01L23/538 ,  H01L23/50 ,  H01L23/522

Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate including a first conductive pathway electrically coupled to a power source; a first microelectronic component, embedded in an insulating material on the surface of the package substrate, including a through-substrate via (TSV) electrically coupled to the first conductive pathway; a second microelectronic component embedded in the insulating material; and a redistribution layer on the insulating material including a second conductive pathway electrically coupling the TSV, the second microelectronic component, and the first microelectronic component.

公开(公告)号：US20240429221A1

公开(公告)日：2024-12-26

申请号：US18339685

申请日：2023-06-22

Applicant: Intel Corporation

Inventor： Bernd Waidhas ,  Thomas Wagner ,  Georg Seidemann ,  Nicolas Richaud ,  Manisha Dutta ,  Georgios Dogiamis ,  Harshit Dhakad ,  Michael Langenbuch

IPC: H01L25/18 ,  H01L23/31 ,  H01L25/00 ,  H01L27/01 ,  H01Q1/22 ,  H01Q9/04

Abstract: Glass layers and capacitors for use with integrated circuit packages are disclosed. An example integrated circuit (IC) package includes a semiconductor die, a glass layer, and a capacitor electrically coupled to the semiconductor die, at least one side of the capacitor enclosed by the glass layer, the capacitor positioned closer to the glass layer than the semiconductor die is to the glass layer.

公开(公告)号：US12125815B2

公开(公告)日：2024-10-22

申请号：US17131663

申请日：2020-12-22

Applicant: Intel Corporation

Inventor： Bernd Waidhas ,  Andreas Wolter ,  Georg Seidemann ,  Thomas Wagner

IPC: H01L23/31 ,  H01L23/00 ,  H01L23/538

CPC classification number: H01L24/20 ,  H01L23/3157 ,  H01L23/5386 ,  H01L24/06 ,  H01L24/13 ,  H01L2924/3511 ,  H01L2924/381

Abstract: Embodiments disclosed herein include electronic package and methods of forming such packages. In an embodiment, an electronic package comprises a mold layer and a first die embedded in the mold layer. In an embodiment, the first die comprises first pads at a first pitch and second pads at a second pitch. In an embodiment, the electronic package further comprises a second die embedded in the mold layer, where the second die comprises third pads at the first pitch and fourth pads at the second pitch. In an embodiment, a bridge die is embedded in the mold layer, and the bridge die electrically couples the second pads to the fourth pads.

公开(公告)号：US11877403B2

公开(公告)日：2024-01-16

申请号：US17486462

申请日：2021-09-27

Applicant: Intel Corporation

Inventor： Georg Seidemann ,  Sonja Koller ,  Bernd Waidhas

IPC: H05K3/34 ,  H01L23/498

CPC classification number: H05K3/3436 ,  H01L23/49816

Abstract: A printed wiring-board island relieves added complexity to a printed circuit board. The printed wiring-board island creates an island form factor in the printed circuit board. Coupling of a semiconductive device package to the printed wiring-board island includes a ball-grid array. The ball-grid array can at least partially penetrate the printed wiring-board island.

公开(公告)号：US20230197599A1

公开(公告)日：2023-06-22

申请号：US17554112

申请日：2021-12-17

Applicant: Intel Corporation

Inventor： Bernd Waidhas ,  Harald Gossner ,  Wolfgang Molzer ,  Georg Seidemann ,  Michael Langenbuch ,  Martin Ostermayr ,  Joachim Singer ,  Thomas Wagner ,  Klaus Herold

IPC: H01L23/522 ,  H01L21/8238 ,  H01L23/528 ,  H01L23/535 ,  H01L27/092

CPC classification number: H01L23/5226 ,  H01L21/823821 ,  H01L21/823871 ,  H01L23/5286 ,  H01L23/535 ,  H01L27/0924

Abstract: IC devices including BPRs with integrated decoupling capacitance are disclosed. An example IC device includes a first layer comprising a transistor and a support structure adjoining the first layer. The support structure includes BPRs, which are power rails buried in the support structure, and a decoupling capacitor based on the BPRs. The conductive cores of the BPRs are the electrodes of the decoupling capacitor. The dielectric barriers of the BPRs can be the dielectric of the decupling capacitor. The dielectric of the decupling capacitor may also include a dielectric element between the BPRs. Additionally or alternatively, the IC device includes another decoupling capacitor at the backside of the support structure. The other decoupling capacitor is coupled to the BPRs and can provide additional decoupling capacitance for stabilizing power supply facilitated by the BPRs.