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公开(公告)号:US09378834B2
公开(公告)日:2016-06-28
申请号:US14486673
申请日:2014-09-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Xiaozhou Qian , Yao Zhou , Bin Sheng , Jiaxu Peng , Yaohua Zhu
CPC classification number: G11C16/24 , G11C5/145 , G11C5/147 , G11C7/04 , G11C7/1048 , G11C7/12 , G11C16/26 , G11C16/28 , G11C16/30 , G11C16/3418 , G11C29/021 , G11C29/028 , G11C29/28 , G11C2029/1204
Abstract: A bitline regulator for use in a high speed flash memory system is disclosed. The bitline regulator is responsive to a set of trim bits that are generated by comparing the bias voltage of a bitline to a reference voltage.
Abstract translation: 公开了一种用于高速闪存系统的位线调节器。 位线调节器响应于通过将位线的偏置电压与参考电压进行比较而产生的一组修整位。
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公开(公告)号:US10586595B2
公开(公告)日:2020-03-10
申请号:US16118272
申请日:2018-08-30
Applicant: Silicon Storage Technology, Inc.
Inventor: Xiaozhou Qian , Kai Man Yue , Guang Yan Luo
Abstract: A method and apparatus are disclosed for reducing the coupling that otherwise can arise between word lines and control gate lines in a flash memory system due to parasitic capacitance and parasitic resistance. The flash memory system comprises an array of flash memory cells organized into rows and columns, where each row is coupled to a word line and a control gate line.
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13.
公开(公告)号:US20180075914A1
公开(公告)日:2018-03-15
申请号:US15690159
申请日:2017-08-29
Applicant: Silicon Storage Technology, Inc.
IPC: G11C16/28
CPC classification number: G11C16/28 , G11C16/0425 , G11C16/08
Abstract: The present invention relates to an improved sense amplifier for reading values in flash memory cells in an array. In one embodiment, a sense amplifier comprises an improved pre-charge circuit for pre-charging a bit line during a pre-charge period to increase the speed of read operations. In another embodiment, a sense amplifier comprises simplified address decoding circuitry to increase the speed of read operations.
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公开(公告)号:US20170194055A1
公开(公告)日:2017-07-06
申请号:US15371496
申请日:2016-12-07
Applicant: Silicon Storage Technology, Inc.
Inventor: Xiaozhou Qian , Xiao Yan Pi , Kai Man Yue , Qing Rao , Lisa Bian
CPC classification number: G11C16/26 , G11C7/062 , G11C7/067 , G11C7/14 , G11C16/0483 , G11C16/24 , G11C16/28 , G11C16/32 , G11C2207/2254
Abstract: Multiple embodiments of a low power sense amplifier for use in a flash memory system are disclosed. In some embodiments, the loading on a sense amplifier can be adjusted by selectively attaching one or more bit lines to the sense amplifier, where the one or more bit lines each is coupled to an extraneous memory cell.
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15.
公开(公告)号:US09633735B2
公开(公告)日:2017-04-25
申请号:US14486687
申请日:2014-09-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Jinho Kim , Nhan Do , Yuri Tkachev , Kai Man Yue , Xiaozhou Qian , Ning Bai
CPC classification number: G11C16/14 , G11C16/0425 , G11C16/12 , G11C16/16 , G11C29/021 , G11C29/028
Abstract: A system and method to inhibit the erasing of a portion of a sector of split gate flash memory cells while allowing the remainder of the sector to be erased is disclosed. The inhibiting is controlled by control logic that applies one or more bias voltages to the portion of the sector whose erasure is to be inhibited.
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公开(公告)号:US09431072B2
公开(公告)日:2016-08-30
申请号:US14386815
申请日:2013-03-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Yao Zhou , Xiaozhou Qian
CPC classification number: G11C7/08 , G11C7/062 , G11C16/26 , G11C2207/002 , G11C2207/2254
Abstract: A trimmable sense amplifier for use in a memory device is disclosed.
Abstract translation: 公开了一种用于存储器件的可调整读出放大器。
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17.
公开(公告)号:US20160006444A1
公开(公告)日:2016-01-07
申请号:US14486694
申请日:2014-09-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Yao Zhou , Yuou Cao , Xiaozhou Qian , Ning Bai , Xinyan Xu
CPC classification number: H03L7/0814 , H03K5/133 , H03K5/135 , H03L7/0816
Abstract: A system and method for a digitally controlled delay-locked loop reference generator is disclosed.
Abstract translation: 公开了一种用于数字控制延迟锁定环路参考发生器的系统和方法。
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公开(公告)号:US20150078081A1
公开(公告)日:2015-03-19
申请号:US14386814
申请日:2013-03-15
Applicant: Silicon Storage Technology, Inc.
Inventor: Yao Zhou , Xiaozhou Qian , Kai Man Yue , Guangming Lin
IPC: G11C16/26
CPC classification number: G11C16/26 , G11C7/14 , G11C16/28 , G11C29/021 , G11C29/026 , G11C29/028
Abstract: A trimmable current reference generator for use in a sense amplifier is disclosed
Abstract translation: 公开了一种用于读出放大器的可调整电流参考发生器
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公开(公告)号:US20220130477A1
公开(公告)日:2022-04-28
申请号:US17571443
申请日:2022-01-07
Applicant: Silicon Storage Technology, Inc.
Inventor: Guangming Lin , Xiaozhou Qian , Xiao Yan Pl , Vipin Tiwari , Zhenlin Ding
Abstract: The present embodiments relate to systems and methods for implementing wear leveling in a flash memory device that emulates an EEPROM. The embodiments utilize an index array, which stores an index word for each logical address in the emulated EEPROM. The embodiments comprise a system and method for receiving an erase command and a logical address, the logical address corresponding to a sector of physical words of non-volatile memory cells in an array of non-volatile memory cells, the sector comprising a first physical word, a last physical word, and one or more physical words between the first physical word and the last physical word; when a current word, identified by an index bit, is the last physical word in the sector, erasing the sector; and when the current word is not the last physical word in the sector, changing a next index bit.
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公开(公告)号:US11074980B2
公开(公告)日:2021-07-27
申请号:US16813317
申请日:2020-03-09
Applicant: Silicon Storage Technology, Inc.
Inventor: Xiaozhou Qian , Xiao Yan Pi , Vipin Tiwari
Abstract: A memory device that includes a memory array having pluralities of non-volatile memory cells, a plurality of index memory cells each associated with a different one of the pluralities of the non-volatile memory cells, and a controller. The controller is configured to erase the pluralities of non-volatile memory cells, set each of the index memory cells to a first state, and program first data into the memory array by reading the plurality of index memory cells and determining that a first one of the index memory cells is in the first state, programming the first data into the plurality of the non-volatile memory cells associated with the first one of the index memory cells, and setting the first one of the index memory cells to a second state different from the first state.
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