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公开(公告)号:US10978144B2
公开(公告)日:2021-04-13
申请号:US16572625
申请日:2019-09-17
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chia-En Huang , Hidehiro Fujiwara , Jui-Che Tsai , Yen-Huei Chen , Yih Wang
IPC: G11C7/00 , G11C11/419 , H01L27/11 , G11C5/06 , G11C11/418
Abstract: An integrated circuit and an operating method thereof are provided. The integrated circuit includes memory cells, at least one first word line, second word lines, bit lines and write-assist bit lines. The at least one first word line is electrically connected to at least one row of the memory cells. The second word lines are electrically connected to other rows of the memory cells. Two bit lines are located between a column of the memory cells and two write-assist bit lines. The bit lines and the write-assist bit lines are configured to be electrically disconnected with each other when at least one of the memory cells electrically connected with the at least one first word line is configured to be written, and electrically connected with each other when at least one of the memory cells electrically connected to the second word lines is configured to be written.
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公开(公告)号:US20210066319A1
公开(公告)日:2021-03-04
申请号:US16805868
申请日:2020-03-02
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Meng-Sheng Chang , Chia-En Huang , Yi-Hsun Chiu , Yih Wang
IPC: H01L27/112 , H01L23/525
Abstract: A memory device and a manufacturing method thereof are provided. The memory device includes a transistor, a first embedded insulating structure and a second embedded insulating structure. The transistor is formed on a substrate, and includes a gate structure, channel structures, a source electrode and a drain electrode. The channel structures penetrate through the gate structure, and are in contact with the source and drain electrodes. The first and second embedded insulating structures are disposed in the substrate, and overlapped with the source and drain electrodes. The first and second embedded insulating structures are laterally spaced apart from each other by a portion of the substrate lying under the gate structure.
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公开(公告)号:US10705934B2
公开(公告)日:2020-07-07
申请号:US15700877
申请日:2017-09-11
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Ming-Hung Chang , Atul Katoch , Chia-En Huang , Ching-Wei Wu , Donald G. Mikan, Jr. , Hao-I Yang , Kao-Cheng Lin , Ming-Chien Tsai , Saman M. I. Adham , Tsung-Yung Chang , Uppu Sharath Chandra
IPC: G06F11/263 , G06F1/10 , G06F11/22 , G06F11/267 , G11C29/48 , G11C29/32 , G11C29/12
Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device. The memory device thereafter passes through the serial input sequence of data or the parallel input sequence of data to provide an output sequence of data in the shift mode of operation or the capture mode of operation or passes through the serial input sequence of data to provide a serial output sequence of scan data in the scan mode of operation.
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公开(公告)号:US20170040042A1
公开(公告)日:2017-02-09
申请号:US14980287
申请日:2015-12-28
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Hektor Huang , Yangsyu Lin , Yu-Hao Hsu , Chia-En Huang , Chiting Cheng , Chen-Lin Yang , Jung-Ping Yang , Cheng Hung Lee
Abstract: A power management circuit for an electronic device is disclosed that sequentially activates and/or deactivates electronic circuits of the electronic device. The power management circuit provides a first group of one or more circuit power management signals to activate and/or deactivate a first electronic circuit from among the electronic circuits. Thereafter, the power management circuit provides a corresponding power management signal from among a second group of the one or more circuit power management signals that corresponds to a portion of the first electronic circuit that has been activated and/or deactivated by the first group of the one or more circuit power management signals to activate and/or deactivate a portion of a second electronic circuit from among the electronic circuits. The power management circuit continues to sequentially provide each of the one or more circuit power management signals in a similar manner until the electronic circuits of the electronic device have been activated and/or deactivated.
Abstract translation: 公开了一种用于电子设备的电源管理电路,其顺序地激活和/或去激活电子设备的电子电路。 功率管理电路提供第一组一个或多个电路功率管理信号以激活和/或去激活来自电子电路之间的第一电子电路。 此后,电源管理电路从一个或多个电路电源管理信号的第二组中提供相应的功率管理信号,其对应于已经被第一组的第一组激活和/或去激活的第一电子电路的一部分 一个或多个电路功率管理信号,用于激活和/或去激活来自电子电路的第二电子电路的一部分。 功率管理电路以类似的方式继续顺序提供一个或多个电路功率管理信号中的每一个,直到电子设备的电子电路已经被激活和/或去激活为止。
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公开(公告)号:US09218262B2
公开(公告)日:2015-12-22
申请号:US13972082
申请日:2013-08-21
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Fu-An Wu , Jung-Ping Yang , Chia-En Huang , Cheng Hung Lee
CPC classification number: G06F11/25 , G11C29/00 , G11C29/808 , G11C29/848
Abstract: A memory chip comprises a main memory array having a plurality of memory columns, a redundancy memory column associated with the main memory array, and a hit logic circuitry configured to generate a plurality of hit logic signals by a plurality of hit logic units in the hit logic circuitry to enable dynamic replacement of a defective memory cell in one of the memory columns for dynamic replacement by the redundancy memory column when the memory array is in operation.
Abstract translation: 存储器芯片包括具有多个存储器列的主存储器阵列,与主存储器阵列相关联的冗余存储器列,以及命中逻辑电路,其被配置为通过命中中的多个命中逻辑单元产生多个命中逻辑信号 逻辑电路,用于在存储器列之一中动态替换存储器列之一中的有缺陷的存储器单元,以便在存储器阵列运行时由冗余存储器列进行动态替换。
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公开(公告)号:US11996409B2
公开(公告)日:2024-05-28
申请号:US17116552
申请日:2020-12-09
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Yu-Xuan Huang , Chia-En Huang , Ching-Wei Tsai , Kuan-Lun Cheng
IPC: H01L27/092 , H01L21/8238 , H01L23/528 , H01L29/06 , H01L29/423
CPC classification number: H01L27/092 , H01L21/823878 , H01L23/5286 , H01L29/0665 , H01L29/42392
Abstract: A semiconductor structure includes a power rail, a first source/drain feature disposed over the power rail, a via connecting the power rail to the first source/drain feature; an isolation feature disposed over the first source/drain feature, and a second source/drain feature disposed over the isolation feature, where the first and the second source/drain features are of opposite conductivity types.
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公开(公告)号:US20240015976A1
公开(公告)日:2024-01-11
申请号:US18152585
申请日:2023-01-10
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Meng-Han Lin , Sai-Hooi Yeong , Chia-En Huang , Chi On Chui
IPC: H10B51/20 , H01L29/51 , H01L29/66 , H01L29/78 , H01L23/528
CPC classification number: H10B51/20 , H01L29/516 , H01L29/6684 , H01L29/78391 , H01L23/5283
Abstract: In an embodiment, a device includes a first gate structure over a substrate, the first gate structure including a first gate electrode over a first side of a first gate dielectric; a first electrode and a second electrode disposed over a second side of the first gate dielectric opposite the first side; a second gate structure disposed between the first electrode and the second electrode, the second gate structure including a second gate electrode and a second gate dielectric, the second gate dielectric at least laterally surrounding the second gate electrode; and a semiconductor film disposed between the first electrode and the second electrode and at least laterally surrounding the second gate structure, wherein at least one of the first gate dielectric or the second gate dielectric is a memory film.
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公开(公告)号:US11737260B2
公开(公告)日:2023-08-22
申请号:US17034727
申请日:2020-09-28
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Hsin-Wen Su , Yu-Kuan Lin , Lien-Jung Hung , Ping-Wei Wang , Chia-En Huang
IPC: H01L21/321 , H10B20/20 , H01L29/66 , H01L29/04 , H01L29/06
CPC classification number: H10B20/20 , H01L29/045 , H01L29/0692 , H01L29/66545
Abstract: A memory device includes a substrate, an active region, a first gate structure, a second gate structure, a first word line, and a second word line. The active region protrudes from a top surface of the substrate. The active region has at least one ring structure, in which when viewed from above, the ring structure has a first linear portion, a second linear portion, a first curved portion, and a second curved portion, the first curved portion connects first sides of the first and second linear portions, and the second curved portion connects second sides of the first and second linear portions. The first gate structure and the second gate structure are over the substrate and cross the active region. The first word line and the second word line are electrically connected to the first gate structure and the second gate structure, respectively.
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公开(公告)号:US11424339B2
公开(公告)日:2022-08-23
申请号:US17081012
申请日:2020-10-27
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Meng-Han Lin , Chia-En Huang
IPC: H01L29/49 , H01L29/78 , H01L29/66 , H01L29/08 , H01L21/3215 , H01L21/762 , H01L29/06
Abstract: An integrated chip includes a substrate, an isolation structure and a poly gate structure. The isolation structure includes dielectric materials within the substrate and having sidewalls defining an active region. The active region has a channel region, a source region, and a drain region separated from the source region by the channel region along a first direction. The source region has a first width along a second direction perpendicular to the first direction, the drain region has a second width along the second direction, and the channel region has a third width along the second direction and larger than the first and second widths. The poly gate structure extends over the channel region. The poly gate structure includes a first doped region having a first type of dopants and a second doped region having a second type of dopants. The second type is different from the first type.
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公开(公告)号:US11342341B2
公开(公告)日:2022-05-24
申请号:US17025563
申请日:2020-09-18
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Meng-Sheng Chang , Chien-Ying Chen , Chia-En Huang , Yih Wang
IPC: H01L27/112 , G06F30/392 , H01L23/528 , H01L23/522
Abstract: A method of generating an IC layout diagram includes positioning a first active region between second and third active regions, intersecting the first active region with first through fourth gate regions to define gate locations of first and second anti-fuse bits, aligning first and second conductive regions between the first and second active regions, thereby intersecting the first conductive region with the first gate region and the second conductive region with the fourth gate region, and aligning third and fourth conductive regions between the first and third active regions, thereby either intersecting the third and fourth conductive regions with the first and third gate regions, or intersecting the third and fourth conductive regions with the second and fourth gate regions. At least one of positioning or intersecting the first active region, or aligning the first and second or third and fourth conductive regions is executed by a processor.
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