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公开(公告)号:US10172741B1
公开(公告)日:2019-01-08
申请号:US15628534
申请日:2017-06-20
Applicant: ARCMASK OPTECH CO., LTD
Inventor: Chien-Hsing Hsieh , Edward Martin , Chia-Hung Chen , Jim Watkins
Abstract: A power saving welding helmet includes a helmet shell and a lens device. The helmet shell includes a mounting hole to contain the lens device. The lens device has an inner surface and an outer surface, and includes a magnetic sensor, a filter control unit, and a filter lens. The control logic module controls the filter lens according to magnetic signals generated by the magnetic sensor. The filter lens includes a first LCD panel and a second LCD panel respectively controlled by different control signals. Therefore, a refresh time of the first LCD panel and a refresh time of the second LCD panel do not synchronize. A welder does not feel the first LCD panel or the second LCD panel flashing, and the welding experiences this as consistent darkness.
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公开(公告)号:US10128808B2
公开(公告)日:2018-11-13
申请号:US15455007
申请日:2017-03-09
Applicant: Seek Thermal, Inc.
Inventor: Jason Wolfe , William J. Parrish , Ross Williams
IPC: H03G3/30 , G01J5/22 , H04N5/365 , H04N5/33 , G01J1/18 , G01J5/34 , G01R27/26 , H01G7/00 , G01J5/00 , G01J1/44
Abstract: An imaging system includes an array of photodetectors and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors. The electronic circuitry can include an integrator with an integrator capacitor having a nominal capacitance, wherein a gain of the electronic circuitry associated with a photodetector can depend at least in part on the actual capacitance of the integrator capacitor, the actual capacitance differing from the nominal capacitance. The imaging system can be configured to determine a gain factor that depends at least in part on the actual capacitance and/or a signal voltage input to the integrator. The imaging system can be configured to apply the gain factor based at least in part on the actual capacitance of the integrator capacitor calculated. The imaging system can be a thermal imaging system and may include an infrared camera core.
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公开(公告)号:US10072976B2
公开(公告)日:2018-09-11
申请号:US14493219
申请日:2014-09-22
Applicant: ams AG
Inventor: Gonggui Xu
CPC classification number: G01J1/46 , G01J1/18 , G01J2001/444 , H03M1/10 , H03M1/12
Abstract: An optical sensor arrangement (10) comprises a light sensor (11), a current source (41), an analog-to-digital converter (12) and a switch (44) which selectively couples the light sensor (11) or the current source (41) to an input (14) of the analog-to-digital converter (12).
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14.
公开(公告)号:US20180183208A1
公开(公告)日:2018-06-28
申请号:US15658001
申请日:2017-07-24
Applicant: Axon Enterprise, Inc.
Inventor: Magne NERHEIM
CPC classification number: H01S5/0683 , F41G1/35 , F41G1/545 , F41H13/0025 , G01J1/18 , G01J1/32 , G01J1/4257 , H01S5/042 , H01S5/0617 , H01S5/06808 , H01S5/06825 , H05C1/00
Abstract: Systems and methods for calibrating, operating, and setting the magnitude of the power of light provided by a laser diode in a conducted electrical weapon (“CEW”). The light of the laser diode assists in targeting by providing a visible indication of the projected point of impact of the tethered electrode of the CEW. The calibration process enables laser diode of a CEW to operate within regional guidelines of the maximum output power of light permitted by a laser. The method further permits the magnitude of the power of the light provided by a laser diode to be set and operated in changing environmental conditions in the field.
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公开(公告)号:US20180164155A1
公开(公告)日:2018-06-14
申请号:US15890533
申请日:2018-02-07
Applicant: STMicroelectronics (Grenoble 2) SAS
Inventor: Pascal Mellot
CPC classification number: G01J1/4204 , G01J1/18 , G01J1/42 , G01J1/44 , G01J2001/4426 , H04N1/00917
Abstract: The following steps are performed in connection with a photodiode circuit: a) resetting the photodiode circuit; b) determining when a photodiode voltage changes in response to illumination to reach a threshold; and c) updating a counter in response to the determination in step b). The steps a) to c) are repeated until an end of a measurement period is reached. The value of the counter at the end of the measurement period is then output to indicate an intensity of the illumination.
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公开(公告)号:US20170292874A1
公开(公告)日:2017-10-12
申请号:US15626763
申请日:2017-06-19
Applicant: ABL IP HOLDING LLC
Inventor: David P. Ramer , Jack C. Rains, JR. , Januk Aggarwal
CPC classification number: G01J1/08 , F21V7/0008 , F21V33/00 , F21Y2101/00 , F21Y2113/13 , F21Y2115/10 , G01J1/18 , G01N21/55 , G01N21/64
Abstract: A system with a machine and a lighting device. The machine includes an image capture device and a machine vision processing system configured to detect a characteristic of a subject in a space for an operation of the machine. The lighting device includes a first light source for generating light to illuminate the space, and a second light source for generating light of a particular wavelength to support detection of the characteristic of the subject via the machine vision processing system. The light of the particular wavelength is output at a sufficient intensity reasonably expected to produce a particular emission from the subject detectable via the image capture device different from an emission produced by exposure of the subject to the light for illumination of the space. The first and second light sources are integrated into the lighting device.
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公开(公告)号:US09595934B2
公开(公告)日:2017-03-14
申请号:US14829490
申请日:2015-08-18
Applicant: Seek Thermal, Inc.
Inventor: Jason Wolfe , William J. Parrish , Ross Williams
CPC classification number: H03G3/3084 , G01J1/18 , G01J1/44 , G01J5/22 , G01J5/34 , G01J2001/4406 , G01J2001/444 , G01J2005/0048 , G01J2005/0077 , G01R27/2605 , H01G7/00 , H04N5/33 , H04N5/3651 , H04N5/3655
Abstract: An imaging system includes an array of photodetectors and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors. The electronic circuitry can include an integrator with an integrator capacitor having a nominal capacitance, wherein a gain of the electronic circuitry associated with a photodetector can depend at least in part on the actual capacitance of the integrator capacitor, the actual capacitance differing from the nominal capacitance. The imaging system can be configured to determine a gain factor that depends at least in part on the actual capacitance and/or a signal voltage input to the integrator. The imaging system can be configured to apply the gain factor based at least in part on the actual capacitance of the integrator capacitor calculated. The imaging system can be a thermal imaging system and may include an infrared camera core.
Abstract translation: 成像系统包括与光电检测器相关联的光电检测器和电子电路的阵列,以从光电检测器读取强度值。 电子电路可以包括具有标称电容的积分器电容器的积分器,其中与光电检测器相关联的电子电路的增益至少部分取决于积分电容器的实际电容,实际电容不同于标称电容 。 成像系统可以被配置为确定至少部分地取决于输入到积分器的实际电容和/或信号电压的增益因子。 成像系统可以被配置为至少部分地基于所计算的积分电容器的实际电容来施加增益因子。 成像系统可以是热成像系统,并且可以包括红外相机芯。
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公开(公告)号:US09411180B2
公开(公告)日:2016-08-09
申请号:US13354827
申请日:2012-01-20
Applicant: Jacques Gollier , Shandon Dee Hart , Garrett Andrew Piech , James Andrew West
Inventor: Jacques Gollier , Shandon Dee Hart , Garrett Andrew Piech , James Andrew West
IPC: G01R31/26 , G02F1/13 , G01J1/18 , G02F1/1335 , G01J1/42
CPC classification number: G02F1/1309 , G01J1/18 , G01J1/4228 , G01J2001/4247 , G02F1/133502
Abstract: An apparatus and method for determining and quantifying “sparkle”—the random noise that is generated when a pixelated image is viewed through a roughened surface of a transparent sample. The apparatus includes a pixelated source and an imaging system located in an optical path originating from the pixelated source, wherein a transparent sample may be placed in the optical path between the pixelated source and the optical system. The degree of sparkle is determined by obtaining an integrated image for the pixelated image; and calculating a standard deviation of the integrated pixel power. An objective level of sparkle can be defined by correlating the amount of sparkle provided by the apparatus with visual impressions.
Abstract translation: 用于确定和量化“闪烁”的装置和方法 - 当通过透明样品的粗糙表面观察像素化图像时产生的随机噪声。 该装置包括位于源自像素化源的光路中的像素化源和成像系统,其中可以将透明样品放置在像素化源和光学系统之间的光路中。 通过获得用于像素化图像的积分图像来确定闪光度; 并计算积分像素功率的标准偏差。 可以通过将设备提供的闪光量与视觉印象相关联来定义闪光的客观水平。
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19.
公开(公告)号:US20160109288A1
公开(公告)日:2016-04-21
申请号:US14918233
申请日:2015-10-20
Inventor: Michael N. Mercier , Joseph M. Schlupf
CPC classification number: G01J1/18 , G01J1/0219 , G01J1/4228 , G01J2001/4247
Abstract: A method of determining the point source quality of a set of pixels associated with a detected energy signature is discussed that pre-records ideal test point source signatures at various sub-pixel locations and radiant intensities throughout the overall sensor field of view in a focal plane array, determines the sub-pixel location of an observed source, and compares the signature at a pixel of the observed source to the pre-recorded “ideal source” signatures at the determined sub-pixel location. to determine point source correlation.
Abstract translation: 讨论了确定与检测到的能量签名相关联的一组像素的点源质量的方法,其预先记录在焦平面中的整个传感器视场中的各个子像素位置处的理想测试点源特征和辐射强度 阵列,确定观测源的子像素位置,并且将所观测源的像素处的签名与所确定的子像素位置处的预先记录的“理想源”签名进行比较。 确定点源相关。
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公开(公告)号:US09074876B2
公开(公告)日:2015-07-07
申请号:US13713951
申请日:2012-12-13
Applicant: Semiconductor Components Industries, LLC
Inventor: Yoshihisa Tabuchi , Yasunori Nagata
CPC classification number: G01B11/14 , G01B11/002 , G01J1/18 , G02B27/646 , G03B2205/0007
Abstract: A position of a lens is detected by detecting, using a phototransistor, light that is emitted from a photodiode and that varies depending on lens position. A control unit divides a moving range of the lens into a plurality of areas, approximates a relationship between lens positions and current of the phototransistor for each of the areas, corrects a current of the phototransistor using the approximated relationship so as to obtain a corrected detection current having a linear relationship with respect to lens positions, and detects the position of the lens using the obtained corrected detection current.
Abstract translation: 通过使用光电晶体管检测从光电二极管发出并根据透镜位置而变化的光来检测透镜的位置。 控制单元将透镜的移动范围分成多个区域,近似每个区域的透镜位置和光电晶体管的电流之间的关系,使用近似关系校正光电晶体管的电流,以获得校正检测 电流相对于透镜位置具有线性关系,并且使用获得的校正检测电流来检测透镜的位置。
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