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公开(公告)号：US10602082B2
公开(公告)日：2020-03-24
申请号：US14856046
申请日：2015-09-16
申请人： Fluke Corporation
发明人： Michael D. Stuart , Paul H. Heydron , Joseph V. Ferrante , Michael A. Schoch , Hilton G. Hammond
IPC分类号： H04N5/33 , G01R31/302 , H04N5/225 , G01D21/02 , G01R13/00
摘要： Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.
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公开(公告)号：US10516296B2
公开(公告)日：2019-12-24
申请号：US15891950
申请日：2018-02-08
发明人： Sichao Liu , Jinbiao Huang , Dongdong Yuan
IPC分类号： H02J50/10 , H02J7/02 , G01R31/02 , G01R31/302 , H02J50/60
摘要： A device comprises a positive current sense apparatus having two inputs connected to a drain and a source of a power switch respectively, the positive current sense apparatus comprising a first amplifier, a first sense switch and a second sense switch, a negative current sense apparatus having two inputs connected to the drain and the source of the power switch respectively, the negative current sense apparatus comprising a second amplifier, a third sense switch and a fourth sense switch and a current sense processing apparatus connected to the positive current sense apparatus and the negative current sense apparatus respectively.
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公开(公告)号：US10366969B2
公开(公告)日：2019-07-30
申请号：US15783710
申请日：2017-10-13
发明人： Alberto Pagani , Giovanni Girlando
IPC分类号： H01L25/065 , H01L29/82 , H01L23/48 , H01L23/522 , H01L23/64 , H01L23/66 , H01L23/00 , H01L25/10 , H01Q1/22 , H01Q1/36 , H01Q7/00 , H01L49/02 , H01Q1/38 , H01L25/16 , G01R1/073 , G01R31/302
摘要： An embodiment of an integrated electronic device having a body, made at least partially of semiconductor material and having a top surface, a bottom surface, and a side surface, and a first antenna, which is integrated in the body and enables magnetic or electromagnetic coupling of the integrated electronic device with a further antenna. The integrated electronic device moreover has a coupling region made of magnetic material, which provides, in use, a communication channel between the first antenna and the further antenna.
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公开(公告)号：US10163601B1
公开(公告)日：2018-12-25
申请号：US15856211
申请日：2017-12-28
申请人： Intel Corporation
IPC分类号： G01R31/305 , G01R31/306 , G01R31/302 , G01R31/311 , H01J37/073 , H01J37/06 , H01J37/244 , H01J37/14 , H01J37/28
摘要： A probe assembly for analyzing a test device that includes a housing with an electron source disposed therein for emitting primary electrons. A photon source is positioned to emit photons that strike the electron source such that when the photons strike the electron source, the electron source emits the primary electrons. Detection circuitry is provided that is configured to detect secondary electrons emitted from a test device of a test assembly and to form an excitation waveform.
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公开(公告)号：US20180348165A1
公开(公告)日：2018-12-06
申请号：US15780293
申请日：2016-11-15
发明人： Tomonori NAKAMURA
IPC分类号： G01N27/72 , G01R31/302 , G02B27/28 , G01R33/032
CPC分类号： G01N27/72 , G01R31/302 , G01R31/311 , G01R33/032 , G01R33/0322 , G02B21/0016 , G02B21/0092 , G02B21/361 , G02B26/0816 , G02B27/28
摘要： An inspection apparatus comprises a light output unit configured to output first light having a first wavelength and second light having a second wavelength, a magneto-optical crystal arranged so that a reflection film faces a measurement target, a light detection unit configured to detect the first light and the second light, and a light guide optical system configured to guide the first light and the second light toward the magneto-optical crystal and the measurement target, and guide the first light reflected by the magneto-optical crystal and the second light reflected by the measurement target toward the light detection unit. The light guide optical system comprises an optical path switching element configured to perform switching between optical paths of a plurality of optical elements so that the first light and the second light are selectively incident on the light detection unit.
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公开(公告)号：US20180342574A1
公开(公告)日：2018-11-29
申请号：US16052777
申请日：2018-08-02
IPC分类号： H01L49/02 , H01L23/00 , G01R31/28 , H01L23/66 , H01L23/58 , H01L23/528 , H01L29/06 , H01L23/544 , H01L25/065 , G01R31/302 , H01L21/66
CPC分类号： H01L28/10 , G01R31/2834 , G01R31/2889 , G01R31/3025 , H01L22/32 , H01L22/34 , H01L23/528 , H01L23/544 , H01L23/564 , H01L23/585 , H01L23/66 , H01L24/05 , H01L25/0657 , H01L29/0642 , H01L2223/6677 , H01L2224/02166 , H01L2224/0401 , H01L2224/04042 , H01L2224/05553 , H01L2224/16225 , H01L2224/48091 , H01L2224/48465 , H01L2924/15311 , H01L2924/181 , H01L2924/30107 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要： A probe card for integrated circuit testing includes a printed circuit support and a probe head having a first surface mounted to a surface of the printed circuit support. A flexible substrate is positioned adjacent to a second surface of the probe head and includes at least one flexible extension which extends beyond an edge of the probe head and includes a bend to make contact with the surface of the printed circuit support. The flexible substrate further includes a test antenna configured to support a wireless communications channel with an integrated circuit under test. The integrated circuit under test includes at least one conductive structure that extends in the peripheral portion on different planes of metallizations to form an integrated antenna that is coupled for communication and/or power transfer to the test antenna.
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公开(公告)号：US10095659B2
公开(公告)日：2018-10-09
申请号：US13830772
申请日：2013-03-14
申请人： Fluke Corporation
IPC分类号： G06F17/00 , G01R15/12 , H04L29/08 , H04L29/06 , G01R31/302 , G01R1/04 , G01R1/067 , G01D21/00
摘要： Embodiments of the present disclosure are generally directed to handheld systems, individual components, and methods of using such systems and components for measuring parameters, such as electrical, mechanical, and physical measurement parameters. In one embodiment of the present disclosure, a gateway device for a measurement system generally includes a first communication system for receiving at least one signal containing data according to a first protocol, wherein the at least one signal includes at least one measurement value from at least one handheld measurement device, a signal translator for translating the signal containing the data to another signal containing the data according to a second protocol different from the first protocol, and a data memory system for storing data on the gateway device.
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公开(公告)号：US10088522B2
公开(公告)日：2018-10-02
申请号：US15257401
申请日：2016-09-06
发明人： Juan Felipe Torres , Kei Matsuoka
IPC分类号： G01R31/302 , G01R31/08 , G01R31/308 , G01R31/311 , G01R1/30 , G01R1/07 , G01R31/26 , G01R31/28
摘要： An apparatus according to embodiments detects locations of faults in a multilayer semiconductor (MLS). The apparatus comprises a laser source that outputs a laser beam, an optical system that directs the laser beam selectively onto a target region in the MLS to generate an irradiated zone in the MLS, a stage and a scanner that control a relative position between the irradiated zone and the MLS so that the irradiated zone moves along the target region, a controller system that measures electrical signals or electrical signal changes induced by a temperature increase in the MLS, and identifies a location of the target region and locations of faults in the MLS based on the measured electrical signal or the measured electrical signal changes. The target region is made of a material of which thermal conductivity is higher than that of a material around the target region and has a structure penetrating from shallow layers to deep layers of the MLS.
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19.发明授权公开(公告)号：US10088521B2
公开(公告)日：2018-10-02
申请号：US15455550
申请日：2017-03-10
发明人： Joo-sung Yun , Woon-sup Choi , Moon-ho Lee , Seong-seob Shin
摘要： A test board includes: a board substrate; a device under test (DUT) socket connected to the board substrate and configured to accommodate a semiconductor package; a test controller; a wireless signal unit configured to wirelessly exchange signals with a server; and a wireless power unit configured to be wirelessly charged by an external source and configured to supply electric power to the test controller and the DUT socket, wherein the test controller is configured to independently perform a test on the semiconductor package accommodated in the DUT socket in response to a test pattern command being wirelessly received from the server via the wireless signal unit.
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公开(公告)号：US09927484B2
公开(公告)日：2018-03-27
申请号：US15193667
申请日：2016-06-27
发明人： Oh Kee Kwon , Young Tak Han , Ki Soo Kim , Su Hwan Oh , Chul Wook Lee , Young Ahn Leem
IPC分类号： G01R31/302 , G01R31/265 , H01L21/66 , H01L23/66 , H01L23/00 , H01L23/535 , G01R1/07
CPC分类号： G01R31/2656 , G01R1/06772 , G01R1/07 , G01R31/2635 , H01L22/32 , H01L23/535 , H01L23/66 , H01L24/05 , H01L24/45 , H01L2223/6611 , H01L2223/6627 , H01L2223/6655 , H01L2224/04042 , H01L2924/00014 , H01P3/00 , H01P5/085 , H01S5/0014 , H01S5/0427 , H01L2224/45099
摘要： Provided herein is a radio frequency probe apparatus including a RF waveguide including a ground electrode and a signal electrode, a register connected to the signal electrode, a RF connector including an outer conductor connected to the ground electrode, an inner conductor connected to the signal electrode, and a dielectric body filling a portion between the outer conductor and the inner conductor, and a single tip probe connected to the signal electrode of the RF waveguide, or the register.
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