PHOTOELECTRIC CONVERSION APPARATUS AND IMAGE PICKUP SYSTEM USING PHOTOELECTRIC CONVERSION APPARATUS
    21.
    发明申请
    PHOTOELECTRIC CONVERSION APPARATUS AND IMAGE PICKUP SYSTEM USING PHOTOELECTRIC CONVERSION APPARATUS 有权
    使用光电转换装置的光电转换装置和图像拾取系统

    公开(公告)号:US20110027934A1

    公开(公告)日:2011-02-03

    申请号:US12904269

    申请日:2010-10-14

    IPC分类号: H01L31/18

    摘要: A photoelectric conversion apparatus includes: a first interlayer insulation film disposed on a semiconductor substrate; a first plug disposed in a first hole in the first interlayer insulation film, and serving to electrically connect between a plurality of active regions disposed in the semiconductor substrate, between gate electrodes of a plurality of MOS transistors, or between the active region and the gate electrode of the MOS transistor, not through the wiring of the wiring layer; and a second plug disposed in a second hole in the first interlayer insulation film, the second plug being electrically connected to the active region, wherein a wiring arranged over the second plug and closest to the second plug is electrically connected to the second plug, and the wiring electrically connected to the second plug forms a portion of dual damascene structure. By such a structure, incidence efficiency of light onto a photoelectric conversion element can be improved.

    摘要翻译: 光电转换装置包括:设置在半导体衬底上的第一层间绝缘膜; 第一插头,其设置在第一层间绝缘膜中的第一孔中,并且用于电连接多个MOS晶体管的栅电极之间或者在有源区和栅极之间设置在半导体衬底中的多个有源区之间 MOS晶体管的电极,不通过布线层的布线; 以及设置在所述第一层间绝缘膜中的第二孔中的第二插头,所述第二插头电连接到所述有源区域,其中布置在所述第二插头上并且最靠近所述第二插头的布线电连接到所述第二插头,以及 电连接到第二插头的布线形成双镶嵌结构的一部分。 通过这样的结构,可以提高光到光电转换元件的入射效率。

    Photoelectric conversion apparatus and image pickup system using photoelectric conversion apparatus
    22.
    发明授权
    Photoelectric conversion apparatus and image pickup system using photoelectric conversion apparatus 有权
    光电转换装置和使用光电转换装置的摄像系统

    公开(公告)号:US07838918B2

    公开(公告)日:2010-11-23

    申请号:US12026623

    申请日:2008-02-06

    IPC分类号: H01L31/00

    摘要: A photoelectric conversion apparatus includes: a first interlayer insulation film disposed on a semiconductor substrate; a first plug disposed in a first hole in the first interlayer insulation film, and serving to electrically connect between a plurality of active regions disposed in the semiconductor substrate, between gate electrodes of a plurality of MOS transistors, or between the active region and the gate electrode of the MOS transistor, not through the wiring of the wiring layer; and a second plug disposed in a second hole in the first interlayer insulation film, the second plug being electrically connected to the active region, wherein a wiring arranged over the second plug and closest to the second plug is electrically connected to the second plug, and the wiring electrically connected to the second plug forms a portion of dual damascene structure. By such a structure, incidence efficiency of light onto a photoelectric conversion element can be improved.

    摘要翻译: 光电转换装置包括:设置在半导体衬底上的第一层间绝缘膜; 第一插头,其设置在第一层间绝缘膜中的第一孔中,并且用于电连接多个MOS晶体管的栅电极之间或者在有源区和栅极之间设置在半导体衬底中的多个有源区之间 MOS晶体管的电极,不通过布线层的布线; 以及设置在所述第一层间绝缘膜中的第二孔中的第二插头,所述第二插头电连接到所述有源区域,其中布置在所述第二插头上并且最靠近所述第二插头的布线电连接到所述第二插头,以及 电连接到第二插头的布线形成双镶嵌结构的一部分。 通过这样的结构,可以提高光到光电转换元件的入射效率。

    Photoelectric conversion apparatus and image pickup system using photoelectric conversion apparatus
    23.
    发明授权
    Photoelectric conversion apparatus and image pickup system using photoelectric conversion apparatus 有权
    光电转换装置和使用光电转换装置的摄像系统

    公开(公告)号:US08304278B2

    公开(公告)日:2012-11-06

    申请号:US12904269

    申请日:2010-10-14

    IPC分类号: H01L31/18

    摘要: A photoelectric conversion apparatus includes: a first interlayer insulation film disposed on a semiconductor substrate; a first plug disposed in a first hole in the first interlayer insulation film, and serving to electrically connect between a plurality of active regions disposed in the semiconductor substrate, between gate electrodes of a plurality of MOS transistors, or between the active region and the gate electrode of the MOS transistor, not through the wiring of the wiring layer; and a second plug disposed in a second hole in the first interlayer insulation film, the second plug being electrically connected to the active region, wherein a wiring arranged over the second plug and closest to the second plug is electrically connected to the second plug, and the wiring electrically connected to the second plug forms a portion of dual damascene structure. By such a structure, incidence efficiency of light onto a photoelectric conversion element can be improved.

    摘要翻译: 光电转换装置包括:设置在半导体衬底上的第一层间绝缘膜; 第一插头,其设置在第一层间绝缘膜中的第一孔中,并且用于电连接多个MOS晶体管的栅电极之间或者在有源区和栅极之间设置在半导体衬底中的多个有源区之间 MOS晶体管的电极,不通过布线层的布线; 以及设置在所述第一层间绝缘膜中的第二孔中的第二插头,所述第二插头电连接到所述有源区域,其中布置在所述第二插头上并且最靠近所述第二插头的布线电连接到所述第二插头,以及 电连接到第二插头的布线形成双镶嵌结构的一部分。 通过这样的结构,可以提高光到光电转换元件的入射效率。

    METHOD AND LINE FOR MANUFACTURING SEMICONDUCTOR DEVICE
    24.
    发明申请
    METHOD AND LINE FOR MANUFACTURING SEMICONDUCTOR DEVICE 审中-公开
    用于制造半导体器件的方法和线路

    公开(公告)号:US20090130782A1

    公开(公告)日:2009-05-21

    申请号:US12266725

    申请日:2008-11-07

    IPC分类号: H01L21/66 H01L21/67

    摘要: A method is provided for manufacturing a semiconductor device that includes a multilayer wiring structure in which insulating layers and wiring layers each with a plurality of conductor lines are alternately stacked on each other. The method includes steps of forming a first wiring layer on a first insulating layer, detecting a defect in the first wiring layer on the first insulating layer, and determining whether or not the defect is to be irradiated with a focused ion beam, according to a detection result. If it is determined that the defect is to be irradiated, the defect is irradiated with a focused ion beam and then a second insulating layer is formed on the first wiring layer disposed on the first insulating layer. If it is determined that the defect is not to be irradiated with a focused ion beam, the second insulating layer is formed on the first wiring layer disposed on the first insulating layer without irradiating the defect.

    摘要翻译: 提供一种用于制造半导体器件的方法,该半导体器件包括多层布线结构,其中每个具有多条导体线的绝缘层和布线层彼此交替堆叠。 该方法包括以下步骤:在第一绝缘层上形成第一布线层,检测第一绝缘层上的第一布线层中的缺陷,以及确定是否要用聚焦离子束照射缺陷,根据 检测结果。 如果确定要照射缺陷,则用聚焦离子束照射缺陷,然后在布置在第一绝缘层上的第一布线层上形成第二绝缘层。 如果确定不用聚焦离子束照射缺陷,则在不照射缺陷的情况下,在布置在第一绝缘层上的第一布线层上形成第二绝缘层。

    Photoelectric Conversion Device and Camera Using Photoelectric Conversion Device
    27.
    发明申请
    Photoelectric Conversion Device and Camera Using Photoelectric Conversion Device 有权
    光电转换装置及相机使用光电转换装置

    公开(公告)号:US20080230685A1

    公开(公告)日:2008-09-25

    申请号:US12111342

    申请日:2008-04-29

    IPC分类号: H01J40/14

    摘要: A photoelectric conversion device is configured to include a light receiving region, for converting light to signal charges, and transistors. An insulation film is arranged on a surface of the light receiving region and under gate electrodes of the transistors. A first reflection prevention film of a refractive index higher than that of the insulation film is arranged at least above the light receiving region, to sandwich the insulation film between the first reflection prevention film and the light receiving region, and includes a silicon nitride film. An interlayer insulation film is arranged on the first reflection prevention film, and a second reflection prevention film is laminated between the first reflection prevention film and the interlayer insulation film. At least one of side walls of the gate electrodes of the transistors includes the silicon nitride film and a silicon oxide film arranged between the silicon nitride film and the gate electrodes. A transistor having a gate electrode with such a side wall includes a source or drain region of an LDD structure, in which a heavily doped region of the source or drain region of the LDD structure is self aligned to the side wall formed from the silicon nitride film and the silicon oxide film.

    摘要翻译: 光电转换装置被配置为包括用于将光转换为信号电荷的光接收区域和晶体管。 绝缘膜布置在光接收区域的表面和晶体管的栅电极下方。 折射率高于绝缘膜的第一防反射膜至少布置在光接收区域的上方,以将绝缘膜夹在第一防反射膜和受光区之间,并且包括氮化硅膜。 在第一反射防止膜上设置层间绝缘膜,在第一防反射膜与层间绝缘膜之间层叠第二防反射膜。 晶体管的栅电极的至少一个侧壁包括氮化硅膜和布置在氮化硅膜和栅电极之间的氧化硅膜。 具有具有这种侧壁的栅电极的晶体管包括LDD结构的源极或漏极区域,其中LDD结构的源极或漏极区域的重掺杂区域与由氮化硅形成的侧壁自对准 膜和氧化硅膜。

    Method of manufacturing semiconductor devices
    30.
    发明授权
    Method of manufacturing semiconductor devices 失效
    制造半导体器件的方法

    公开(公告)号:US5561317A

    公开(公告)日:1996-10-01

    申请号:US478447

    申请日:1995-06-07

    摘要: Disclosed is a method of manufacturing semiconductor devices in which a desired pattern having an area size larger than the field size that can be obtained in one exposure process step of an exposure device is formed. The manufacturing method includes the steps of dividing the desired pattern into a plurality of portions, and conducting exposure on the dividing patterns in a joined fashion.

    摘要翻译: 公开了一种制造半导体器件的方法,其中形成了具有比在曝光装置的一个曝光处理步骤中可获得的场尺寸大的面积尺寸的期望图案。 该制造方法包括以下步骤:将期望的图案分成多个部分,并以连接的方式在分割图案上进行曝光。