摘要:
Novel superhard dielectric compounds useful as gate dielectrics in microelectronic devices have been discovered. Low temperature methods for making thin films of the compounds on substrate silicon are provided. The methods comprise the step of contacting a precursor having the formula H3X—O—XH3, wherein X is silicon or carbon with a compound comprising boron or nitrogen In a chemical vapor deposition (CVD) chamber or with one or more atomic elements in a molecular beam epitaxial deposition (MBE) chamber. These thin film constructs are useful as components of microelectronic devices, and specifically as gate dielectrics in CMOS devices.
摘要:
Novel superhard dielectric compounds useful as gate dielectrics discovered. Low temperature methods for making thin films of the compounds on substrate silicon are provided. The methods comprise the step of contacting a precursor having the formula H3X—O—XH3, wherein X is silicon or carbon with a compound comprising boron or nitrogen in a chemical vapor deposition (CVD) chamber or with one or more atomic elements in a molecular beam epitaxial deposition (MBE) chamber. These thin film constructs are useful as components of microelectronic devices, and specifically as gate dielectrics in CMOS devices.
摘要:
A novel method for synthesizing device-quality alloys and ordered phases in a Si—Ge—Sn system uses a UHV-CVD process and reactions of SnD4 with SiH3GeH3. Using the method, single-phase SixSnyGe1-x-y semiconductors (x≦0.25, y≦0.11) are grown on Si via Ge1-xSnx buffer layers The Ge1-xSnx buffer layers facilitate heteroepitaxial growth of the SixSnyGe1-x-y, films and act as compliant templates that can conform structurally and absorb the differential strain imposed by the more rigid Si and Si—Ge—Sn materials. The SiH3GeH3 species was prepared using a new and high yield method that provided high purity semiconductor grade material.
摘要翻译:在Si-Ge-Sn系统中合成器件质量合金和有序相的新方法使用UHV-CVD工艺,并且SnD <4> sub>与SiH 3 GeH SUB> 3 SUB>。 使用该方法,生长单相Si x 1 Sn y y Ge 1-xy x半导体(x <= 0.25,y <= 0.11) 在Si上通过Ge 1-x Sn Sn x缓冲层。Ge 1-x Sn 3 x缓冲层有利于异质外延 膜的生长,并且作为可以在结构上符合并吸收由 更硬的Si和Si-Ge-Sn材料。 使用提供高纯度半导体级材料的新的高产率法制备SiH 3 GeH 3 N 3种类。
摘要:
The invention provides compounds of, and methods for the preparation of compounds of, the molecular formula, SixGeyHz—aXa; wherein X is halogen, and x, y, z, and a are defined herein, and methods for the deposition of high-Ge content Si films on silicon substrates using compounds of the invention.
摘要:
The present disclosure describes methods for preparing semiconductor structures, comprising forming a Ge layer on a semiconductor substrate using an admixture of (a) (GeH3)2CH2 and Ge2H6; (b) GeH3CH3 and Ge2H6; or (c) (GeH3)2CH2, GeH3CH3 and Ge2H6, wherein in all cases, Ge2H6 is in excess. The disclosure further provides semiconductor structures formed according to the methods of the invention as well as compositions comprising an admixture of (GeH3)2CH2 and/or GeH3CH3 and Ge2H6 in a ratio of between about 1:5 and 1:30. The methods herein provide, and the semiconductor structures provide, Ge layers formed on semiconductor substrates having threading dislocation density below 105/cm2 which can be useful in semiconductor devices.
摘要翻译:本公开描述了制备半导体结构的方法,包括使用(a)(GeH 3)2 CH 2和Ge 2 H 6的混合物在半导体衬底上形成Ge层; (b)GeH 3 CH 3和Ge 2 H 6; 或(c)(GeH 3)2 CH 2,GeH 3 CH 3和Ge 2 H 6,其中在所有情况下,Ge 2 H 6过量。 本发明还提供了根据本发明方法形成的半导体结构以及包含(GeH 3)2 CH 2和/或GeH 3 CH 3和Ge 2 H 6的混合物的比例为约1:5至1:30的组合物。 本文提供的方法,并且半导体结构提供了在半导体衬底上形成的穿透位错密度低于105 / cm 2的Ge层,其可用于半导体器件。
摘要:
An extended solid bulk composition carbon nitride (C.sub.3 N.sub.4) having an atomic ratio of carbon to nitrogen in the range of 3:4 to 3.2:4 as a bulk solid, produced by thermal decomposition and chemical vapor deposition of precursors having formula (I):C.sub.3 N.sub.3 XX'N(MR.sub.3)(M'R'.sub.3) (I)wherein C3N3 is a cyclic 1,3,5-triazine group, X is a halogen selected from the group consisting of fluorine, chlorine, bromine, and iodine, X' is a halogen selected from the group consisting of fluorine, chlorine, bromine, and iodine, M is a group IV metal, M' is a group IV metal, R is an alkyl substituent, and R' is an alkyl substituent, producing a decomposition gas decomposition gas having formula II:XMR.sub.3 (II)
摘要翻译:通过热分解和化学气相沉积具有式(I)的前体制备的作为大量固体的碳/氮原子比在3:4至3.2:4范围内的固体本体组合物碳氮化物(C 3 N 4): C3N3XX'N(MR3)(M'R'3)(I)其中C3N3是环状1,3,5-三嗪基,X是选自氟,氯,溴和碘的卤素,X '是选自氟,氯,溴和碘的卤素,M是IV族金属,M'是Ⅳ族金属,R是烷基取代基,R'是烷基取代基,产生 具有式II的分解气体分解气体:XMR3(II)
摘要:
The present invention provides novel silicon-germanium hydride compounds, methods for their synthesis, methods for their deposition, and semiconductor structures made using the novel compounds.
摘要:
The invention provides compounds of, and methods for the preparation of compounds of, the molecular formula, SixGeyHz—aXa; wherein X is halogen, and x, y, z, and a are defined herein, and methods for the deposition of high-Ge content Si films on silicon substrates using compounds of the invention.
摘要:
The present invention provides novel silicon-germanium hydride compounds, methods for their synthesis, methods for their deposition, and semiconductor structures made using the novel compounds.