Managing data transfers in semiconductor devices by separating circuits for lower-speed-type data and higher-speed-type data

    公开(公告)号:US12218665B2

    公开(公告)日:2025-02-04

    申请号:US18181983

    申请日:2023-03-10

    Abstract: Systems, methods, circuits, and devices for managing data transfers in semiconductor devices are provided. In one aspect, an integrated circuit includes: a first interface for receiving higher-speed-type data, a second interface for receiving lower-speed-type data, a first logic circuit coupled to the first interface, a second logic circuit coupled to the second interface, and a driving circuit separately coupled to the first logic circuit and the second logic circuit. The first data interface, the first logic circuit, and the driving circuit are arranged in series to form a first data path for transferring the higher-speed-type data with a first speed. The second data interface, the second logic circuit, and the driving circuit are arranged in series to form a second data path for transferring the lower-speed-type data with a second speed. The first speed is higher the second speed.

    Managing signal transfers in semiconductor devices

    公开(公告)号:US12166486B2

    公开(公告)日:2024-12-10

    申请号:US17983738

    申请日:2022-11-09

    Abstract: Systems, methods, circuits, and apparatus for managing signal transfers in semiconductor devices are provided. In one aspect, an integrated circuit includes: one or more target units each configured to receive a signal and a plurality of inverting units arranged on signal paths to the one or more target units. For each of the one or more target units, one or more corresponding inverting units of the plurality of inverting units are configured to invert the signal multiple times along a corresponding signal path to the target unit to cause a signal width of the inverted signal received by the target unit to be substantially identical to a signal width of the signal.

    MULTI-DIE MEMORY APPARATUS AND IDENTIFICATION METHOD THEREOF

    公开(公告)号:US20210349645A1

    公开(公告)日:2021-11-11

    申请号:US16870848

    申请日:2020-05-08

    Abstract: A multi-die memory apparatus and identification method thereof are provided. The identification method includes: sending an identification initial command and a first start command to a plurality of memory devices by a controller for starting a first identification period; respectively generating a plurality of first target numbers by the memory devices; respectively performing first counting actions and comparing a plurality of first counting numbers with the first target numbers by a plurality of un-identified memory devices to set a first time-up memory device of the memory devices; and, setting an identification code of the first time-up memory device of the un-identified memory devices to be a first value.

    PROGRAMMING METHOD, READING METHOD AND OPERATING SYSTEM FOR MEMORY
    26.
    发明申请
    PROGRAMMING METHOD, READING METHOD AND OPERATING SYSTEM FOR MEMORY 有权
    编程方法,存储器的读取方法和操作系统

    公开(公告)号:US20150220390A1

    公开(公告)日:2015-08-06

    申请号:US14173873

    申请日:2014-02-06

    CPC classification number: G06F11/1072 G06F11/1012 H03M13/1575 H03M13/19

    Abstract: A programming method, a reading method and an operating system for a memory are provided. The programming method includes the following steps. A data is provided. A parity generation is performed to obtain an error-correcting code (ECC). The memory is programmed to record the data and the error-correcting code. The data is transformed before performing the parity generation, such that a hamming distance between two codes corresponding to two adjacent threshold voltage states in the data to be performed the parity generation is 1.

    Abstract translation: 提供了一种用于存储器的编程方法,读取方法和操作系统。 编程方法包括以下步骤。 提供数据。 执行奇偶校验生成以获得纠错码(ECC)。 存储器被编程为记录数据和纠错码。 在执行奇偶校验生成之前变换数据,使得对应于待执行奇偶产生的数据中的两个相邻阈值电压状态的两个代码之间的汉明距离为1。

    MANAGING DATA TRANSFERS IN SEMICONDUCTOR DEVICES

    公开(公告)号:US20250119142A1

    公开(公告)日:2025-04-10

    申请号:US18988186

    申请日:2024-12-19

    Abstract: Systems, methods, circuits, and devices for managing data transfers in semiconductor devices are provided. In one aspect, a method includes: selecting a first interface to receive higher-speed-type data at a first clock frequency; transferring the higher-speed-type data with a first speed along a first data path from the first interface through a first logic circuit to a driving circuit; outputting the higher-speed-type data by the driving circuit; selecting a second interface to receive lower-speed-type data at a second clock frequency that is same as the first clock frequency; transferring the lower-speed-type data with a second speed along a second data path from the second interface through a second logic circuit to the driving circuit, the first speed being higher than the second speed; and outputting the lower-speed-type data by the driving circuit.

    DUTY CYCLE CORRECTION METHOD AND DUTY CYCLE CORRECTION SYSTEM

    公开(公告)号:US20250105832A1

    公开(公告)日:2025-03-27

    申请号:US18475244

    申请日:2023-09-27

    Abstract: A duty cycle correction method and a duty cycle correction system, adapted for correcting a duty cycle of a clock signal by using a duty cycle corrector (DCC) in a high-capacity and high-performance semiconductor product such as a 3D NAND flash, are provided. In the method, training is performed on the DCC to correct the clock signal, and a training result is recorded after the training is finished; and the DCC is updated by the recorded training result before a next toggle of the clock signal.

    Testing bonding pads for chiplet systems

    公开(公告)号:US11984371B2

    公开(公告)日:2024-05-14

    申请号:US18341957

    申请日:2023-06-27

    Abstract: Systems, methods, circuits, and apparatus including computer-readable mediums for testing bonding pads in multi-die packages, e.g., chiplet systems. In one aspect, a chiplet system includes multiple integrated circuit devices electrically connected together. The integrated circuit devices include an integrated circuit device including: an integrated circuit, a plurality of first type bonding pads electrically connected to the integrated circuit and electrically connected to at least one other of the integrated circuit devices, and one or more second type bonding pads electrically isolated from the at least one other of the integrated circuit devices. At least one of the plurality of first type bonding pads is configured to be electrically connected to a corresponding one of the one or more second type bonding pads.

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