摘要:
In one embodiment, a method of operating a resistive switching device includes applying a signal comprising a pulse on a first terminal of a two terminal resistive switching device having the first terminal and a second terminal. The resistive switching device has a first state and a second state. The pulse includes a first ramp from a first voltage to a second voltage over a first time period. The first time period is at least 0.1 times a total time period of the pulse.
摘要:
In one embodiment, a method of operating a resistive switching device includes applying a signal comprising a pulse on a first terminal of a two terminal resistive switching device having the first terminal and a second terminal. The resistive switching device has a first state and a second state. The pulse includes a first ramp from a first voltage to a second voltage over a first time period. The first time period is at least 0.1 times a total time period of the pulse.
摘要:
An N-channel transistor protection circuit and method are disclosed that prevent gated diode breakdown in N-channel transistors that have a high voltage on their drain. The disclosed N-channel protection circuit may be switched in a high voltage mode between a high voltage level and a lower rail voltage. A high voltage conversion circuit prevents gated diode breakdown in N-channel transistors by dividing the high voltage across two N-channel transistors, MXU0 and MXU1, such that no transistor exceeds the breakdown voltage, Vbreakdown. An intermediate voltage drives the top N-channel transistor, MXU0. The top N-channel transistor, MXU0, is gated with a voltage level that is at least one N-channel threshold, Vtn, below the high voltage level, Vep, using the intermediate voltage level, nprot. The drain voltage of MXU0 will be at least one N-channel threshold, Vtn, lower than the input voltage level, nprot, and the drain voltage Vd of the bottom N-channel transistor, MXU1, is limited to less than the breakdown voltage, Vbreakdown.
摘要:
An non-volatile read only memory transistor for use in a memory array is disclosed. The non-volatile read only memory transistor features a substantially vertically oriented channel fabricated in a trench formed in the substrate. The channel length is dependent upon the depth of the trench and therefore a dense array of NROM transistors can be formed without adversely affecting the channel length and therefore the operational performance of the transistor.
摘要:
A method for boosting potential in the channel of unselected memory cells on a selected bit-line. In this method, a first voltage is applied to all the word-lines of the memory cells in the string. A second voltage is then applied to word-lines adjacent the selected word lines to isolate the selected memory cell. Next, a programming voltage is applied to the selected word-line. In one embodiment, a time delay is applied between applying the second voltage and applying the third voltages to ensure isolation of the selected memory cell before applying the third voltage.
摘要:
A refresh mechanism refreshes a supplied capacitor of a capacitor divider circuit at an interval that keeps an amount of charge degradation at a coupled up capacitor to less than a predetermined threshold. A node between the supplied capacitor and the coupled up capacitor provides a voltage sampling node having a divided voltage. Timing for the refresh operations may be established via internal clocks or internal oscillators running at multiples of other circuits already internal to the device utilizing the divided voltage. The divided voltage is then utilized for comparison, feedback (voltage regulation, for example), or other purposes. The invention is applicable to all types of circuits where degradation occurs due any type of leakage or other permutations affecting circuit operations.
摘要:
A block decoder includes a p-well. A low voltage source is coupled to the p-well for asserting a body bias voltage to the p-well. An n-type word line pass transistor is positioned within the p-well and is coupled to a word line for passing programming voltages to the word line. A high voltage source is coupled to pass circuitry configured to assert a voltage on a gate of the pass transistor. The low voltage source is configured to apply a voltage of approximately 10 volts or more to the p-well during programming, thus reducing the voltage between the source and body region (and thus the threshold voltage as well) of NMOS transistors disposed within the p-well. Therefore, the amount of voltage needed to be applied to the pass transistors is reduced. Furthermore, the pass circuitry can work for lower supply voltages since the supply voltage is limited by the threshold voltage of the n-type transistors within the p-well.
摘要:
A method of converging threshold voltages of memory cells in a flash EEPROM array after the memory cells have been erased, the method including applying a gate voltage having an initial negative value which is increased to a more positive value in steps during application of a drain disturb voltage. By applying a gate voltage with an initial negative value, leakage current during convergence is reduced enabling all cells on bit lines of the array to be converged in parallel.
摘要:
A gate power supply for supplying power to the gates of flash EEPROM memory cells in a multi-density or low voltage supply memory array to determine the states stored by the memory cells. The gate power supply includes a multi-phase voltage pump to increase voltage supplied to the gates of the memory cells above a system voltage supply, V.sub.CC to increase the working margin between memory cell states. The gate power supply further includes a low power supply standby pump to maintain the boosted voltage during an inactive mode. The wordline decoder for the memory is divided into sections with a large n-well parasitic capacitance of each decoder section acting as a reservoir to store the charge supplied by the low power standby pump. In an active mode, the parasitic capacitance in unselected decoder sections supplies power to the input of the selected diecoder section while the multi-phase pump is turning on. Zener regulation diodes are coupled to the inputs of each decoder section to regulate the voltage supplied to each section. A reference supply feeds back power from the input of the selected decoder section to the input of a reference array. The reference supply further provides circuitry to reduce mismatches between the memory array and the reference array.