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公开(公告)号:US11667523B2
公开(公告)日:2023-06-06
申请号:US17121955
申请日:2020-12-15
Applicant: Texas Instruments Incorporated
Inventor: Simon Joshua Jacobs
CPC classification number: B81C1/00317 , B81B3/0083 , B81B7/0067 , B81C1/00595 , G02B1/115 , G02B26/0833 , H01L33/483 , H01L33/486 , B81B2201/042 , B81B2207/015 , B81C1/00047 , B81C1/00119 , B81C1/00261 , B81C1/00269 , B81C2201/014 , B81C2203/0109 , B81C2203/0118 , B81C2203/0127 , B81C2203/0145 , B81C2203/0735 , B81C2203/0771
Abstract: An optical electronics device includes first, second and third wafers. The first wafer has a semiconductor substrate with a dielectric layer on a side of the semiconductor substrate. The second wafer has a transparent substrate with an anti-reflective coating on a side of the transparent substrate. The first wafer is bonded to the second wafer at a silicon dioxide layer between the semiconductor substrate and the anti-reflective coating. The first and second wafers include a cavity extending from the dielectric layer through the semiconductor substrate and through the silicon dioxide layer to the anti-reflective coating. The third wafer includes micromechanical elements. The third wafer is bonded to the dielectric layer, and the micromechanical elements are contained within the cavity.
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公开(公告)号:US20230095040A1
公开(公告)日:2023-03-30
申请号:US17490938
申请日:2021-09-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Argyrios Dellis , Adam Fruehling , Simon Joshua Jacobs
Abstract: A stackable molecular spectroscopy cell includes a hollow body, a first cap affixed to a first surface of the hollow body, covering a first opening in the hollow body, and a second cap affixed to a second surface of the hollow body, covering a second opening in the hollow body, and forming a sealed cavity within the hollow body. The sealed cavity contains a dipolar gas having a pressure of less than 0.5 mbar. The stackable molecular spectroscopy cell also includes a metal layer covering an inner surface of the hollow body and an inner surface of the first and second caps, including a first aperture in the metal layer covering the inner surface of the first cap and a second aperture in the metal layer covering the inner surface of the second cap.
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公开(公告)号:US11535945B2
公开(公告)日:2022-12-27
申请号:US16731788
申请日:2019-12-31
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Simon Joshua Jacobs , Kathryn Anne Schuck
IPC: B32B15/01 , C25D3/12 , C25D3/48 , C25D7/12 , C23C18/08 , C23C18/32 , C23C18/42 , H01L21/768 , C23C18/16 , C25D3/46
Abstract: A bonding structure formed on a substrate includes an indium layer and a passivating nickel plating formed on the indium layer. The nickel plating serves to prevent a reaction involving the indium layer.
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公开(公告)号:US11430758B2
公开(公告)日:2022-08-30
申请号:US16729018
申请日:2019-12-27
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Simon Joshua Jacobs
IPC: H01L25/065 , B23K1/005 , H01L23/00 , H01L25/00
Abstract: A semiconductor device includes a solder supporting material above a substrate. The semiconductor device also includes a solder on the solder supporting material. The semiconductor device further includes selective laser annealed or laser ablated portions of the solder and underlying solder supporting material to form a semiconductor device having 3D features.
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公开(公告)号:US20210098635A1
公开(公告)日:2021-04-01
申请号:US16588592
申请日:2019-09-30
Applicant: Texas Instruments Incorporated
Inventor: Simon Joshua Jacobs
IPC: H01L31/02 , H01L31/0232 , H01L31/0203 , H01L31/18
Abstract: Windowed wafer assemblies having interposers are described. A described example integrated circuit (IC) package includes first and second dies, where at least one of the first or second dies includes an optical window with a light transmittance wavelength range between 0.1 micrometers and 1.0 millimeter, and an interposer die between the first and second dies, where the interposer die is coupled to the first die at a first surface of the interposer to form a first bonded interface, where the interposer is coupled to the second die at a second surface of the interposer die to form a second bonded interface, where the second surface is opposite the first surface, where the first and second bonded interfaces form a sealed cavity of the IC package that is at least partially formed by the optical window, and where the interposer die includes electrical routing.
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公开(公告)号:US20210050459A1
公开(公告)日:2021-02-18
申请号:US16539442
申请日:2019-08-13
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Steven Alfred Kummerl , Simon Joshua Jacobs , James Richard Huckabee , Jo Bito , Rongwei Zhang
IPC: H01L31/0216 , H01L31/0203 , H01L31/02 , H01L23/00 , H01L31/024 , G02B5/20
Abstract: An integrated filter optical package including an ambient light sensor that incorporates an infrared (IR) filter in an integrated circuit (IC) stacked-die configuration is provided. The integrated filter optical package incorporates an infrared (IR) coated glass layer to filter out or block IR light while allowing visible (ambient) light to pass through to a light sensitive die having a light sensor. The ambient light sensor detects an amount of visible light that passes through the IR coated glass layer and adjusts a brightness or intensity of a display screen on an electronic device accordingly so that the display screen is readable.
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公开(公告)号:US10894712B2
公开(公告)日:2021-01-19
申请号:US15975349
申请日:2018-05-09
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Simon Joshua Jacobs
Abstract: An optical electronics device includes first, second and third wafers. The first wafer has a semiconductor substrate with a dielectric layer on a side of the semiconductor substrate. The second wafer has a transparent substrate with an anti-reflective coating on a side of the transparent substrate. The first wafer is bonded to the second wafer at a silicon dioxide layer between the semiconductor substrate and the anti-reflective coating. The first and second wafers include a cavity extending from the dielectric layer through the semiconductor substrate and through the silicon dioxide layer to the anti-reflective coating. The third wafer includes micromechanical elements. The third wafer is bonded to the dielectric layer, and the micromechanical elements are contained within the cavity.
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公开(公告)号:US10589986B2
公开(公告)日:2020-03-17
申请号:US15696245
申请日:2017-09-06
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Adam Joseph Fruehling , Juan Alejandro Herbsommer , Simon Joshua Jacobs , Benjamin Stassen Cook , James F. Hallas , Randy Long
Abstract: An electronic device includes a package substrate, a circuit assembly, and a housing. The circuit assembly is mounted on the package substrate. The circuit assembly includes a first sealed cavity formed in a device substrate. The housing is mounted on the package substrate to form a second sealed cavity about the circuit assembly.
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公开(公告)号:US20180257930A1
公开(公告)日:2018-09-13
申请号:US15975349
申请日:2018-05-09
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Simon Joshua Jacobs
CPC classification number: B81C1/00317 , B81B3/0083 , B81B7/0067 , B81B2201/042 , B81B2207/015 , B81C1/00047 , B81C1/00119 , B81C1/00261 , B81C1/00269 , B81C1/00595 , B81C2201/014 , B81C2203/0109 , B81C2203/0118 , B81C2203/0127 , B81C2203/0145 , B81C2203/0735 , B81C2203/0771 , G02B1/115 , G02B26/0833
Abstract: An optical electronics device includes first, second and third wafers. The first wafer has a semiconductor substrate with a dielectric layer on a side of the semiconductor substrate. The second wafer has a transparent substrate with an anti-reflective coating on a side of the transparent substrate. The first wafer is bonded to the second wafer at a silicon dioxide layer between the semiconductor substrate and the anti-reflective coating. The first and second wafers include a cavity extending from the dielectric layer through the semiconductor substrate and through the silicon dioxide layer to the anti-reflective coating. The third wafer includes micromechanical elements. The third wafer is bonded to the dielectric layer, and the micromechanical elements are contained within the cavity.
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30.
公开(公告)号:US10029908B1
公开(公告)日:2018-07-24
申请号:US15395029
申请日:2016-12-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Simon Joshua Jacobs , Molly Nelis Sing , Kelly Jay Taylor
Abstract: In described examples, a method of forming a microelectromechanical device comprises: forming a first metallic layer comprising a conducting layer on a substrate; forming a first dielectric layer on the first metallic layer, wherein the first dielectric layer comprises one or more individual dielectric layers; forming a sacrificial layer on the first dielectric layer; forming a second dielectric layer on the sacrificial layer; forming a second metallic layer on the second dielectric layer; and removing the sacrificial layer to form a spacing between the second dielectric layer and the first dielectric layer. Removing the sacrificial layer enables movement of the second dielectric layer relative to the first dielectric layer in at least one direction.
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