Semiconductor integrated circuit with input/output interface adapted for
small-amplitude operation
    21.
    发明授权
    Semiconductor integrated circuit with input/output interface adapted for small-amplitude operation 失效
    具有适用于小振幅操作的输入/输出接口的半导体集成电路

    公开(公告)号:US5557221A

    公开(公告)日:1996-09-17

    申请号:US76434

    申请日:1993-06-14

    IPC分类号: H03K19/0185 H03F3/45

    CPC分类号: H03K19/018585

    摘要: A semiconductor integrated circuit includes a switch unit for controlling the supply of a power source voltage to a signal amplification circuit for receiving an input signal, and a control unit for selectively turning ON and OFF the switch unit in accordance with the amplitude or frequency of this input signal. By the constitution, it is possible to provide an input circuit or an output circuit capable of being applied to an input/output interface adapted for a small amplitude operation.

    摘要翻译: 半导体集成电路包括用于控制向接收输入信号的信号放大电路提供电源电压的开关单元,以及根据该开关单元的幅度或频率选择性地接通和断开开关单元的控制单元 输入信号。 通过该结构,可以提供能够应用于适于小振幅操作的输入/输出接口的输入电路或输出电路。

    Semiconductor integrated circuit memory
    22.
    发明授权
    Semiconductor integrated circuit memory 有权
    半导体集成电路存储器

    公开(公告)号:US06185149B2

    公开(公告)日:2001-02-06

    申请号:US09340147

    申请日:1999-06-28

    IPC分类号: G11C800

    CPC分类号: G11C7/1018 G11C7/1072

    摘要: A semiconductor memory includes memory cell blocks, a burst-length information generating circuit which generates burst-length information based on a burst length, and a block enable circuit which receives the burst-length information. The block enable circuit selectively enables one of the memory cell blocks when the burst length is equal to or shorter than a predetermined burst length and selectively enables a plurality of memory cell blocks based on the burst length when the burst length is longer than the predetermined burst length. Data are read from the above-mentioned one or plurality of memory cell blocks.

    摘要翻译: 半导体存储器包括存储单元块,基于突发长度生成突发长度信息的突发长度信息产生电路,以及接收脉冲串长度信息的块使能电路。 当突发长度等于或小于预定突发长度时,块使能电路选择性地启用存储单元块中的一个,并且当突发长度长于预定突发时,基于脉冲串长度选择性地启用多个存储单元块 长度。 从上述一个或多个存储单元块读取数据。

    Semiconductor memory device
    25.
    发明授权
    Semiconductor memory device 有权
    半导体存储器件

    公开(公告)号:US06459641B2

    公开(公告)日:2002-10-01

    申请号:US09834945

    申请日:2001-04-16

    IPC分类号: G11C700

    摘要: The present invention is aimed at providing a semiconductor memory device which performs a row-address pipe-line operation in accessing different row addresses so as to achieve high-speed access. The semiconductor memory device according to the present invention includes a plurality of sense-amplifiers which store data when the data is received via bit lines from memory cells corresponding to a selected word line, a column decoder which reads parallel data of a plurality of bits from selected sense amplifiers by simultaneously selecting a plurality of column gates in response to a column address, a data-conversion unit which converts the parallel data into serial data, and a precharge-signal-generation unit which generates an internal precharge signal a first delay-time period after generation of a row-access signal for selecting the selected word line so as to reset the bit lines and said plurality of sense-amplifiers.

    摘要翻译: 本发明的目的在于提供一种在访问不同行地址时执行行地址管线操作以实现高速访问的半导体存储器件。 根据本发明的半导体存储器件包括多个读出放大器,当经由位线从存储器单元接收数据时存储数据,该存储器单元对应于所选择的字线,列解码器从多个位读取多个位的并行数据 选择的读出放大器,通过响应于列地址同时选择多个列门,将并行数据转换为串行数据的数据转换单元,以及产生内部预充电信号的预充电信号产生单元, 生成用于选择所选字线的行访问信号以便复位位线和所述多个感测放大器之后的时间段。

    Semiconductor memory device
    27.
    发明授权
    Semiconductor memory device 有权
    半导体存储器件

    公开(公告)号:US6088291A

    公开(公告)日:2000-07-11

    申请号:US147600

    申请日:1999-01-29

    摘要: The present invention is aimed at providing a semiconductor memory device which performs a row-address pipe-line operation in accessing different row addresses so as to achieve high-speed access. The semiconductor memory device according to the present invention includes a plurality of sense-amplifiers which store data when the data is received via bit lines from memory cells corresponding to a selected word line, a column decoder which reads parallel data of a plurality of bits from selected sense amplifiers by simultaneously selecting a plurality of column gates in response to a column address, a data-conversion unit which converts the parallel data into serial data, and a precharge-signal-generation unit which generates an internal precharge signal a first delay-time period after generation of a row-access signal for selecting the selected word line so as to reset the bit lines and said plurality of sense-amplifiers.

    摘要翻译: PCT No.PCT / JP98 / 02443 Sec。 371日期1999年1月29日第 102(e)日期1999年1月29日PCT提交1998年6月3日PCT公布。 第WO98 / 56004号公报 日期:1998年12月10日本发明旨在提供一种在访问不同行地址时执行行地址管线操作以实现高速访问的半导体存储器件。 根据本发明的半导体存储器件包括多个读出放大器,当经由位线从存储器单元接收数据时存储数据,该存储器单元对应于所选择的字线,列解码器从多个位读取多个位的并行数据 选择的读出放大器,通过响应于列地址同时选择多个列门,将并行数据转换为串行数据的数据转换单元,以及产生内部预充电信号的预充电信号产生单元, 生成用于选择所选字线的行访问信号以便复位位线和所述多个感测放大器之后的时间段。

    Semiconductor integrated circuit device with voltage patterns
    28.
    发明授权
    Semiconductor integrated circuit device with voltage patterns 失效
    具有电压模式的半导体集成电路器件

    公开(公告)号:US5986293A

    公开(公告)日:1999-11-16

    申请号:US931935

    申请日:1997-09-17

    CPC分类号: G05F1/465

    摘要: A semiconductor integrated circuit device includes a reference voltage generating circuit outputting a reference voltage from a step-up voltage, a step-up circuit stepping up the reference voltage within a range lower than an external power supply voltage and thus outputting the above step-up voltage, a step-down circuit stepping down the external power supply voltage and thus outputting a step-down voltage equal to the reference voltage, and an internal circuit receiving, as a power supply voltage thereof, the step-down voltage.

    摘要翻译: 一种半导体集成电路器件,包括从升压电压输出参考电压的基准电压产生电路,在比外部电源电压低的范围内升压参考电压的升压电路,从而输出上述升压 电压,降压电路降低外部电源电压,从而输出等于参考电压的降压电压,内部电路作为其电源电压接收降压电压。

    Electronic instrument and semiconductor memory device
    29.
    发明授权
    Electronic instrument and semiconductor memory device 有权
    电子仪器和半导体存储器件

    公开(公告)号:US06172938B2

    公开(公告)日:2001-01-09

    申请号:US09338597

    申请日:1999-06-23

    IPC分类号: G11C800

    摘要: An electronic instrument includes a memory device, clock lines through which complementary clock signals are transmitted to be used for synchronization of a data output operation and a data input operation for the memory device, and strobe signal lines through which a first output strobe signal, a second output strobe signal, a first input strobe signal and a second input strobe signal are transmitted to be used to settle output data from the memory device in the data output operation and to settle input data supplied to the memory device, the first and second output strobe signals being in complementary relation to each other, the first and second input strobe signals being in complementary relation to each other.

    摘要翻译: 一种电子仪器,包括:存储器件,传输互补时钟信号的时钟线,用于数据输出操作的同步和存储器件的数据输入操作;以及选通信号线,第一输出选通信号, 发送第二输出选通信号,第一输入选通信号和第二输入选通信号,以在数据输出操作中用于建立来自存储器件的输出数据,并且提供提供给存储器件的输入数据,第一和第二输出 选通信号彼此互补,第一和第二输入选通信号彼此互补。

    Semiconductor memory device having an SRAM and a DRAM on a single chip
    30.
    发明授权
    Semiconductor memory device having an SRAM and a DRAM on a single chip 失效
    在单个芯片上具有SRAM和DRAM的半导体存储器件

    公开(公告)号:US06735141B2

    公开(公告)日:2004-05-11

    申请号:US09917913

    申请日:2001-07-31

    IPC分类号: G11C700

    CPC分类号: G11C11/005

    摘要: A semiconductor memory device includes an SRAM provided on a chip, the SRAM including an SRAM cell array. A DRAM is provided on the chip, the DRAM including a DRAM cell array. An address input circuit receives an address signal, the address signal having a first portion and a second portion, the first portion carrying a unique value of row-column address information provided to access one of memory locations in one of the SRAM and DRAM cell arrays, the second portion carrying a unique value of SRAM/DRAM address information provided to select one of the SRAM and the DRAM.

    摘要翻译: 半导体存储器件包括设置在芯片上的SRAM,SRAM包括SRAM单元阵列。 在芯片上提供DRAM,DRAM包括DRAM单元阵列。 地址输入电路接收地址信号,地址信号具有第一部分和第二部分,第一部分承载提供用于访问SRAM和DRAM单元阵列之一中的存储单元之一的行列地址信息的唯一值 ,第二部分承载提供用于选择SRAM和DRAM之一的SRAM / DRAM地址信息的唯一值。