公开(公告)号：US12033692B2

公开(公告)日：2024-07-09

申请号：US18124334

申请日：2023-03-21

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G11C11/54 ,  G06N3/045 ,  G11C16/04 ,  G11C16/10 ,  G11C16/14 ,  H01L29/423 ,  H01L29/788 ,  H10B41/30

CPC classification number: G11C11/54 ,  G06N3/045 ,  G11C16/0483 ,  G11C16/10 ,  G11C16/14 ,  H01L29/42324 ,  H01L29/42328 ,  H01L29/7883 ,  H10B41/30

Abstract: A neural network device with synapses having memory cells each having a floating gate and a first gate over first and second portions of a channel region disposed between source and drain regions, and a second gate over the floating gate or the source region. First lines each electrically connect the first gates in one of the memory cell rows, second lines each electrically connect the second gates in one of the memory cell rows, third lines each electrically connect the source regions in one of the memory cell columns, and fourth lines each electrically connect the drain regions in one of the memory cell columns. The synapses receive a first plurality of inputs as electrical voltages on the first or second lines, and provide a first plurality of outputs as electrical currents on the third or fourth lines.

公开(公告)号：US20240112736A1

公开(公告)日：2024-04-04

申请号：US18536186

申请日：2023-12-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Stephen Trinh ,  Anh Ly ,  Nhan Do ,  Mark Reiten

IPC: G11C16/08 ,  G11C11/54 ,  G11C16/24

CPC classification number: G11C16/08 ,  G11C11/54 ,  G11C16/24 ,  G11C2216/04

Abstract: In one example, a non-volatile memory system, comprises an array of non-volatile memory cells arranged in rows and columns, each non-volatile memory cell comprising a source and a drain; a plurality of bit lines, each of the plurality of bit lines coupled to the drain or each non-volatile memory cell in a column of non-volatile memory cells; a source line coupled to the source of each non-volatile memory cell; and an adaptive bias decoder for providing a voltage to the source line of the array during operation.

公开(公告)号：US20240104357A1

公开(公告)日：2024-03-28

申请号：US18077686

申请日：2022-12-08

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Stephen Trinh ,  Stanley Hong ,  Thuan Vu ,  Nghia Le ,  Hien Pham

IPC: G06N3/048

CPC classification number: G06N3/048

Abstract: Numerous examples are disclosed of input circuitry and associated methods in an artificial neural network. In one example, a system comprises a plurality of address decoders to receive an address and output a plurality of row enabling signals in response to the address; a first plurality of registers to store, sequentially, activation data in response to the plurality of row enabling signals; and a second plurality of registers to store, in parallel, activation data received from the first plurality of registers.

公开(公告)号：US11908513B2

公开(公告)日：2024-02-20

申请号：US18103383

申请日：2023-01-30

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Vipin Tiwari

IPC: G11C11/54 ,  G11C16/04 ,  G06N3/063 ,  G11C16/26 ,  G11C16/28 ,  H03F3/00 ,  H03M1/16 ,  G06N3/065 ,  H03M1/38

CPC classification number: G11C11/54 ,  G06N3/063 ,  G06N3/065 ,  G11C16/0416 ,  G11C16/0425 ,  G11C16/26 ,  G11C16/28 ,  H03F3/005 ,  H03M1/164 ,  H03M1/38

Abstract: Numerous embodiments of analog neural memory arrays are disclosed. In one embodiment, a system comprises a first array of non-volatile memory cells, wherein the cells are arranged in rows and columns and the non-volatile memory cells in one or more of the columns stores W+ values, and wherein one of the columns in the first array is a dummy column; and a second array of non-volatile memory cells, wherein the cells are arranged in rows and columns and the non-volatile memory cells in one or more of the columns stores W− values, and wherein one of the columns in the second array is a dummy column; wherein pairs of cells from the first array and the second array store a differential weight, W, according to the formula W=(W+)−(W−).

公开(公告)号：US11853856B2

公开(公告)日：2023-12-26

申请号：US16746852

申请日：2020-01-18

Applicant: Silicon Storage Technology, Inc. ,  The Regents of the University of California

Inventor： Farnood Merrikh Bayat ,  Xinjie Guo ,  Dmitri Strukov ,  Nhan Do ,  Hieu Van Tran ,  Vipin Tiwari ,  Mark Reiten

IPC: G11C16/04 ,  G06N3/04 ,  G06N3/063 ,  G11C11/54 ,  G11C16/34 ,  G11C29/38 ,  G06N3/045 ,  G11C16/08 ,  G11C16/12 ,  G11C16/16 ,  G06F3/06

CPC classification number: G06N3/04 ,  G06F3/061 ,  G06F3/0655 ,  G06F3/0688 ,  G06N3/045 ,  G06N3/063 ,  G11C11/54 ,  G11C16/08 ,  G11C16/12 ,  G11C16/16 ,  G11C16/3436 ,  G11C29/38

Abstract: An artificial neural network device that utilizes one or more non-volatile memory arrays as the synapses. The synapses are configured to receive inputs and to generate therefrom outputs. Neurons are configured to receive the outputs. The synapses include a plurality of memory cells, wherein each of the memory cells includes spaced apart source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over and insulated from a first portion of the channel region and a non-floating gate disposed over and insulated from a second portion of the channel region. Each of the plurality of memory cells is configured to store a weight value corresponding to a number of electrons on the floating gate. The plurality of memory cells are configured to multiply the inputs by the stored weight values to generate the outputs. Various algorithms for tuning the memory cells to contain the correct weight values are disclosed.

公开(公告)号：US11849577B2

公开(公告)日：2023-12-19

申请号：US17845782

申请日：2022-06-21

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Hung Quoc Nguyen ,  Nhan Do

IPC: G11C16/04 ,  H10B41/40 ,  G11C16/14 ,  G11C16/26 ,  H01L29/423 ,  H01L29/788 ,  H10B41/10 ,  H10B41/30

CPC classification number: H10B41/40 ,  G11C16/0408 ,  G11C16/14 ,  G11C16/26 ,  H01L29/42328 ,  H01L29/7881 ,  H10B41/10 ,  H10B41/30

Abstract: A memory device with memory cell pairs each having a single continuous channel region, first and second floating gates over first and second portions of the channel region, an erase gate over a third portion of the channel region between the first and second channel region portions, and first and second control gates over the first and second floating gates. For each of the pairs of memory cells, the first region is electrically connected to the second region of an adjacent pair of memory cells in the same active region, and the second region is electrically connected to the first region of an adjacent pair of the memory cells in the same active region.

公开(公告)号：US11847557B2

公开(公告)日：2023-12-19

申请号：US17885437

申请日：2022-08-10

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do

IPC: G11C11/56 ,  G06N3/065 ,  G06F3/06 ,  G06F17/16 ,  G06N3/08 ,  G11C13/00 ,  G11C16/04 ,  G11C16/28 ,  G06N3/048

CPC classification number: G06N3/065 ,  G06F3/061 ,  G06F3/0688 ,  G06F17/16 ,  G06N3/048 ,  G06N3/08 ,  G11C11/5642 ,  G11C13/004 ,  G11C16/0425 ,  G11C16/28 ,  G11C2211/563 ,  G11C2213/15

Abstract: Numerous embodiments are disclosed for compensating for differences in the slope of the current-voltage characteristic curve among reference transistors, reference memory cells, and flash memory cells during a read operation in an analog neural memory in a deep learning artificial neural network. In one embodiment, a method comprises receiving an input voltage, multiplying the input voltage by a coefficient to generate an output voltage, applying the output voltage to a gate of a selected memory cell, performing a sense operating using the selected memory cell and a reference device to determine a value stored in the selected memory cell, wherein a slope of a current-voltage characteristic curve of the reference device and a slope of the current-voltage characteristic curve of the selected memory cell are approximately equal during the sense operation.

公开(公告)号：US11829859B2

公开(公告)日：2023-11-28

申请号：US17233006

申请日：2021-04-16

Applicant: Silicon Storage Technology, Inc. ,  The Regents of the University of California

Inventor： Farnood Merrikh Bayat ,  Xinjie Guo ,  Dmitri Strukov ,  Nhan Do ,  Hieu Van Tran ,  Vipin Tiwari ,  Mark Reiten

IPC: G06N3/04 ,  G06N3/063 ,  G11C11/54 ,  G11C16/34 ,  G11C29/38 ,  G06N3/045 ,  G11C16/08 ,  G11C16/12 ,  G11C16/16 ,  G06F3/06

CPC classification number: G06N3/04 ,  G06F3/061 ,  G06F3/0655 ,  G06F3/0688 ,  G06N3/045 ,  G06N3/063 ,  G11C11/54 ,  G11C16/08 ,  G11C16/12 ,  G11C16/16 ,  G11C16/3436 ,  G11C29/38

Abstract: Numerous embodiments are disclosed for verifying a weight programmed into a selected non-volatile memory cell in a neural memory. In one embodiment, a circuit for verifying a weight programmed into a selected non-volatile memory cell in a neural memory comprises a converter for converting a target weight into a target current and a comparator for comparing the target current to an output current from the selected non-volatile memory cell during a verify operation. In another embodiment, a circuit for verifying a weight programmed into a selected non-volatile memory cell in a neural memory comprises a digital-to-analog converter for converting a target weight comprising digital bits into a target voltage, a current-to-voltage converter for converting an output current from the selected non-volatile memory cell during a verify operation into an output voltage, and a comparator for comparing the output voltage to the target voltage during a verify operation.

公开(公告)号：US20230368011A1

公开(公告)日：2023-11-16

申请号：US18227254

申请日：2023-07-27

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G06N3/065 ,  G06F17/16 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34 ,  G11C16/26 ,  G11C11/56 ,  G11C16/14 ,  G06N3/044

CPC classification number: G06N3/065 ,  G06F17/16 ,  G11C16/0425 ,  G11C16/10 ,  G11C16/3459 ,  G11C16/26 ,  G11C11/5628 ,  G11C11/5635 ,  G11C16/14 ,  G06N3/044 ,  G11C2216/04

Abstract: In one example, a method comprises performing a first programming process on a selected non-volatile memory cell, the first programming process comprising a plurality of program-verify cycles, wherein a programming voltage duration of increasing period is applied to one of a floating gate, a control gate terminal, an erase gate terminal, and a source line terminal of the selected non-volatile memory cell in each program-verify cycle after the first program-verify cycle.

公开(公告)号：US20230325646A1

公开(公告)日：2023-10-12

申请号：US17848381

申请日：2022-06-23

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  THUAN VU ,  STANLEY HONG ,  STEPHEN TRINH ,  STEVEN LEMKE ,  LOUISA SCHNEIDER ,  NHAN DO

IPC: G06N3/063

CPC classification number: G06N3/063

Abstract: Numerous examples are disclosed of an artificial neural network comprising a plurality of reference arrays used for configuration of a vector-by-matrix multiplication array. In one example, a system comprises a vector-by-matrix multiplication array in an artificial neural network; and a plurality of reference arrays characterized by different I-V curves, wherein one or more of the plurality of reference arrays are used to generate input voltage the vector-by-matrix multiplication array during operation.