摘要:
A semiconductor memory device may include a memory cell array, a bit line sense amplifier, a sub word line driver, and an electrode. The memory cell array may include a sub memory cell array connected between sub word lines and bit line pairs and having memory cells which are selected in response to a signal transmitted to the sub word lines and column selecting signal lines. The bit line sense amplifier may be configures to sense and amplify data of the bit line pairs. The sub word line driver may be configured to combine signals transmitted from word selecting signal lines and signals transmitted from main word lines to select the sub word lines. Moreover, the memory cell array may be configured to transmit data between the bit line pairs and local data line pairs and to transmit data between the local data line pairs and global data line pairs. The electrode may be configured to cover the whole memory cell array and to apply a voltage needed for the memory cells. The local data line pairs may be arranged on a first layer above the electrode in the same direction as the sub word line. The column selecting signal lines and the global data line pairs may be arranged on a second layer above the electrode in the same direction as the bit line. The word selecting signal lines and the main word lines may be arranged on a third layer above the electrode in the same direction as the sub word line. Related methods of signal line arrangement are also discussed.
摘要:
A semiconductor memory device includes spaced apart twisted bit line pairs, a respective one of which includes a spaced apart twisted area. A conductive line overlaps the respective twisted areas of the spaced apart twisted line pairs. The conductive line can extend parallel to the memory device word lines, and can provide a power supply ground and/or signal line.
摘要:
An internal reference voltage generating circuit that reduces a standby current and the number of pins of a semiconductor memory device, in which a reference voltage is provided to an input buffer that receives a signal through an input to which an on die transmitor resistor is connected, includes, a voltage dividing circuit outputting the reference voltage by a power voltage; a pull down driver connected to an end of the voltage dividing circuit; and a calibration control circuit comparing a voltage level of the input and a voltage level of an end of the voltage dividing circuits and controlling the on resistor value of the pull down driver according to a result of the comparison. The internal reference voltage generating circuit is operated white the memory controller inputs a signal into a mode register set (MRS) to enable the internal reference voltage generating circuit and the output signal of the MRS is activated.
摘要:
Provided are an input buffer of a memory device, a memory controller, and a memory system making use thereof. The input buffer of a memory device is enabled or disabled in response to a first signal showing chip selection information and a second signal showing power down information, and the input buffer is enabled only when the second signal shows a non-power down mode and the first signal shows a chip selection state. The input buffer is at least one selected from the group consisting of a row address strobe input buffer, a column address strobe input buffer, and an address input buffer.
摘要:
An input/output circuit for a semiconductor memory device, including a data output circuit configured to buffer output data in the semiconductor memory device in response to an input/output enable signal to output the buffered output data to an input/output signal line, a data input circuit configured to receive input data from the input/output signal line and buffer the input data to transfer the buffered input data to the semiconductor memory device, and a load controller configured to control a load on the input/output signal line in response to the input/output enable signal.
摘要:
A method of programming addresses of failed memory locations in a memory device can be provided by generating a plurality of fail address signals corresponding to a plurality of addresses of failed memory locations in the memory device and then programming the plurality of addresses of failed memory locations to programming cells for use by a redundant circuit during read or write operations to the plurality of addresses of failed memory locations.
摘要:
Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ⅛, or 1/16) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.
摘要:
A semiconductor device includes a memory and a power voltage interrupter configured to interrupt an external power voltage applied to circuitry of the semiconductor device responsive to a Deep Power Down (DPD) command signal generated in a DPD mode of the memory. A power voltage shifter is configured to shift a power voltage in the circuitry to a specific level responsive to the DPD command signal.
摘要:
A memory system, memory device, and method for setting an operating mode of a memory device include a memory cell array; row and column decoders which select a row and a column of the memory cell array, respectively, according to a multi-bit address signal; and a mode control circuit which receives at least one bit from the multi-bit address signal used in the selection of the row or the column, and which sets an operating mode of the memory device according to the at least one bit, wherein the operating mode is one of a burst length mode, a DLL reset mode, a test mode, a CAS latency mode, and a burst type mode.
摘要:
A bit line sense amplifier is provided. The bit line sense amplifier includes a first sense amplifier block in which a plurality of first sense amplifiers for sensing and amplifying data of a bit line or a complementary bit line are laid out, and first drivers, which are arranged outside the plurality of first sense amplifiers, for pulling down the bit line or the complementary bit line to a first voltage level. The bit line sense amplifier further includes a second sense amplifier block with a plurality of second sense amplifiers and second drivers for pulling up the bit line or the complementary bit line to a second voltage level. By arranging the drivers outside the bit sense amplifiers, effects caused by variation in critical dimensions (CDs) of gates are minimized and the entire area of the bit line sense amplifier is reduced.