BITLINE DRIVER ISOLATION FROM PAGE BUFFER CIRCUITRY IN MEMORY DEVICE

    公开(公告)号:US20220020435A1

    公开(公告)日:2022-01-20

    申请号:US16947091

    申请日:2020-07-17

    IPC分类号: G11C16/24 G11C16/26 G11C16/04

    摘要: A page buffer circuit in a memory device includes a logic element configured to perform a series of calculations pertaining to one or more memory access operations and generate a plurality of calculation results associated with the series of calculations and a dynamic memory element coupled with the logic element and configured to store the plurality of calculation results. The page buffer circuit further includes an isolation element coupled between the logic element and the dynamic memory element, the isolation element to permit a calculation result from the logic element to pass to the dynamic memory element when activated and one or more bitline driver circuits coupled to the dynamic memory element and configured to perform pre-charging operations associated with the one or more memory access operations and based at least in part on the plurality of calculation results stored in the dynamic memory element. The one or more bitline driver circuits can perform a first pre-charging operation on the memory array based at least in part on a first calculation result stored in the dynamic memory element during a first period of time when the isolation element is deactivated to disconnect the logic element from the dynamic memory element, and the logic element is configured to concurrently generate a second calculation result during the first period of time.

    CHECKING STATUS OF MULTIPLE MEMORY DIES IN A MEMORY SUB-SYSTEM

    公开(公告)号:US20220011959A1

    公开(公告)日:2022-01-13

    申请号:US16946869

    申请日:2020-07-09

    IPC分类号: G06F3/06 G06F13/16

    摘要: A processing device in a memory sub-system determines whether to check a status of one or more memory dies of the memory device and sends a multi-unit status command to the memory device, the multi-unit status command specifying a plurality of memory units associated with the one or more memory dies of the memory device. The processing device further receives a response to the multi-unit status command, the response comprising a multi-bit value comprising a plurality of bits, wherein each bit of the plurality of bits represents a status of one or more parameters of a plurality of parameters for a corresponding one of the plurality of memory units.

    Partially written superblock treatment

    公开(公告)号:US10949291B2

    公开(公告)日:2021-03-16

    申请号:US16776600

    申请日:2020-01-30

    摘要: The present disclosure relates to partially written superblock treatment. An example apparatus includes a memory device operable as a multiplane memory resource including blocks organized as superblocks. The memory device is configured to maintain, internal to the memory device, included in a status of an open superblock, a page indicator corresponding to a last written page of the open superblock. The memory device is further configured, responsive to receipt, from a controller, of a read request to a page of the open superblock, determine from page map information maintained internal to the memory device and from the indicator of the last written page, which of a number of different read trim sets to use to read the page of the open superblock corresponding to the read request.

    One check fail byte (CFBYTE) scheme

    公开(公告)号:US10762974B2

    公开(公告)日:2020-09-01

    申请号:US16430086

    申请日:2019-06-03

    摘要: Various embodiments, disclosed herein, can include apparatus and methods to perform a one check failure byte (CFBYTE) scheme in programming of a memory device. In programming memory cells in which each memory cell can store multiple bits, the multiple bits being a n-tuple of bits of a set of n-tuples of bits with each n-tuple of the set associated with a level of a set of levels of threshold voltages for the memory cells. Verification of a program algorithm can be structured based on a programming algorithm that proceeds in a progressive manner by placing a threshold voltage of one level/distribution at a time. The routine of this progression can be used to perform just one failure byte check for that specific target distribution only, thus eliminating the need to check failure byte for all subsequent target distribution during every stage of program algorithm. Additional apparatus, systems, and methods are disclosed.

    Partially written superblock treatment

    公开(公告)号:US10552254B2

    公开(公告)日:2020-02-04

    申请号:US15677736

    申请日:2017-08-15

    IPC分类号: G06F11/10 G11C11/56 H03M13/37

    摘要: The present disclosure relates to partially written superblock treatment. An example apparatus includes a memory device operable as a multiplane memory resource including blocks organized as superblocks. The memory device is configured to maintain, internal to the memory device, included in a status of an open superblock, a page indicator corresponding to a last written page of the open superblock. The memory device is further configured, responsive to receipt, from a controller, of a read request to a page of the open superblock, determine from page map information maintained internal to the memory device and from the indicator of the last written page, which of a number of different read trim sets to use to read the page of the open superblock corresponding to the read request.

    APPARATUSES AND METHODS FOR AUTOMATED DYNAMIC WORD LINE START VOLTAGE

    公开(公告)号:US20190355422A1

    公开(公告)日:2019-11-21

    申请号:US16530100

    申请日:2019-08-02

    摘要: The present disclosure relates to apparatuses and methods for an automated dynamic word line start voltage. An example apparatus includes a controller and a memory device. The memory device is configured to maintain, internal to the memory device, a status of a number of open blocks in the memory device. The status can include a programming operation being initiated in the respective number of open blocks. Responsive to receipt of, from the controller, a request to direct initiation of the programming operation to a word line, determine a group of memory cells associated with the word line that programs first relative to other groups of memory cells associated with the word line and maintain, included in the status of an open block, a voltage at which the group of memory cells is the first group to program.

    One check fail byte (CFBYTE) scheme

    公开(公告)号:US10354738B2

    公开(公告)日:2019-07-16

    申请号:US15717554

    申请日:2017-09-27

    IPC分类号: G11C16/34 G11C16/10 G11C16/04

    摘要: Various embodiments, disclosed herein, can include apparatus and methods to perform a one check failure byte (CFBYTE) scheme in programming of a memory device. In programming memory cells in which each memory cell can store multiple bits, the multiple bits being a n-tuple of bits of a set of n-tuples of bits with each n-tuple of the set associated with a level of a set of levels of threshold voltages for the memory cells. Verification of a program algorithm can be structured based on a programming algorithm that proceeds in a progressive manner by placing a threshold voltage of one level/distribution at a time. The routine of this progression can be used to perform just one failure byte check for that specific target distribution only, thus eliminating the need to check failure byte for all subsequent target distribution during every stage of program algorithm. Additional apparatus, systems, and methods are disclosed.