Apparatus and methods for determining data states of memory cells

    公开(公告)号:US10854303B2

    公开(公告)日:2020-12-01

    申请号:US16908832

    申请日:2020-06-23

    摘要: Methods of operating a memory, as well as memory configured to perform such methods, might include determining a plurality of read voltages for a read operation during a precharge phase of the read operation, determining a pass voltage for the read operation during the precharge phase of the read operation, applying the pass voltage to each unselected access line of a plurality of access lines, and, for each read voltage of the plurality of read voltages, applying that read voltage to a selected access line of the plurality of access lines and sensing a data state of a memory cell connected to the selected access line.

    Methods for determining data states of memory cells

    公开(公告)号:US10714196B2

    公开(公告)日:2020-07-14

    申请号:US16152897

    申请日:2018-10-05

    摘要: Methods of operating a memory might include sensing a state of each data line of a plurality of data lines while increasing a voltage level applied to each access line of a plurality of access lines commonly connected to a plurality of strings of series-connected memory cells, determining a particular voltage level at which the state of each data line of a first subset of the plurality of data lines has changed, decreasing a voltage level applied to a particular access line of the plurality of access lines, and sensing a state of each data line of a second subset of the plurality of data lines while applying the particular voltage level to the particular access line. Methods of operating a memory might further include determining a pass voltage and plurality of read voltages for a read operation during a precharge phase of the read operation, applying the pass voltage to each unselected access line of a plurality of access lines, and, for each read voltage of the plurality of read voltages, applying that read voltage to a selected access line of the plurality of access lines and sensing a data state of a memory cell connected to the selected access line.

    APPARATUS AND METHODS FOR DETERMINING DATA STATES OF MEMORY CELLS

    公开(公告)号:US20200211660A1

    公开(公告)日:2020-07-02

    申请号:US16267488

    申请日:2019-02-05

    摘要: Methods of operating a memory, and memory configured to perform similar methods, might include sensing a state of each data line of a plurality of data lines while increasing a voltage level applied to each access line of a plurality of access lines commonly connected to a plurality of strings of series-connected memory cells, ceasing increasing the voltage level applied to each access line of the plurality of access lines in response to the state of each data line of the plurality of data lines having a particular condition, changing a voltage level applied to a particular access line of the plurality of access lines to a particular voltage level, and sensing a state of each data line of a subset of the plurality of data lines while applying the particular voltage level to the particular access line.

    METHODS FOR DETERMINING DATA STATES OF MEMORY CELLS

    公开(公告)号:US20200111534A1

    公开(公告)日:2020-04-09

    申请号:US16152897

    申请日:2018-10-05

    IPC分类号: G11C16/34 G11C16/26 G11C16/08

    摘要: Methods of operating a memory might include sensing a state of each data line of a plurality of data lines while increasing a voltage level applied to each access line of a plurality of access lines commonly connected to a plurality of strings of series-connected memory cells, determining a particular voltage level at which the state of each data line of a first subset of the plurality of data lines has changed, decreasing a voltage level applied to a particular access line of the plurality of access lines, and sensing a state of each data line of a second subset of the plurality of data lines while applying the particular voltage level to the particular access line. Methods of operating a memory might further include determining a pass voltage and plurality of read voltages for a read operation during a precharge phase of the read operation, applying the pass voltage to each unselected access line of a plurality of access lines, and, for each read voltage of the plurality of read voltages, applying that read voltage to a selected access line of the plurality of access lines and sensing a data state of a memory cell connected to the selected access line.

    Memory devices having differently configured blocks of memory cells

    公开(公告)号:US10409673B2

    公开(公告)日:2019-09-10

    申请号:US15414699

    申请日:2017-01-25

    摘要: A memory device has a plurality of individually erasable blocks of memory cells and a controller configured to configure a first block of the plurality of blocks of memory cells in a first configuration comprising one or more groups of overhead data memory cells, to configure a second block of the plurality of blocks of memory cells in a second configuration comprising a group of user data memory cells and a group of overhead data memory cells, and to configure a third block of the plurality of blocks of memory cells in a third configuration comprising only a group of user data memory cells. The group of overhead data memory cells of the second block of memory cells has a different storage capacity than at least one group of overhead data memory cells of the one or more groups of overhead data memory cells of the first block.

    Memory as a programmable logic device

    公开(公告)号:US10395740B2

    公开(公告)日:2019-08-27

    申请号:US16003357

    申请日:2018-06-08

    摘要: Memories including a data line, a plurality of strings of series-connected memory cells selectively connected to the data line, a plurality of first access lines each coupled to a control gate of a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells, and a plurality of second access lines each coupled to a control gate of a respective memory cell of a respective string of series-connected memory cells of the plurality of strings of series-connected memory cells, as well as methods of operating similar memories.

    Pre-compensation of memory threshold voltage

    公开(公告)号:US10134481B2

    公开(公告)日:2018-11-20

    申请号:US15449426

    申请日:2017-03-03

    摘要: Methods of operating a memory include storing a first target data state of multiple possible data states of a first memory cell to be programmed in a target data latch coupled to a data node, storing at least one bit of a second target data state of the multiple possible data states of a second memory cell to be programmed in an aggressor data latch coupled to the data node, and programming the first memory cell and performing a program verify operation for the first target data state to determine if the first memory cell is verified for the first target data state. The program verify operation including: an intermediate verify corresponding to an amount of aggression to apply a voltage to the data node when performing the intermediate verify, based on the at least one bit of the second target state stored in the aggressor data latch; and a program verify corresponding to a condition of no aggression to apply to the voltage to the data node when performing the program verify, based on the at least one bit of the second target state stored in the aggressor data latch. The methods including inhibiting the first memory cell from further programming if the first memory cell is verified during the intermediate verify and the at least one bit in the aggressor data latch corresponds to the particular amount of aggression, or the first memory cell is verified during the program verify and the at least one bit in the aggressor data latch corresponds to the condition of no aggression. The second memory cell is a neighbor of the first memory cell.