Two Mask MTJ Integration For STT MRAM
    32.
    发明申请
    Two Mask MTJ Integration For STT MRAM 有权
    两个掩模MTJ集成为STT MRAM

    公开(公告)号:US20090261437A1

    公开(公告)日:2009-10-22

    申请号:US12405461

    申请日:2009-03-17

    IPC分类号: H01L43/00 H01L43/12

    摘要: A method for forming a magnetic tunnel junction (MTJ) for magnetic random access memory (MRAM) using two masks includes depositing over an interlevel dielectric layer containing an exposed first interconnect metallization, a first electrode, a fixed magnetization layer, a tunneling barrier layer, a free magnetization layer and a second electrode. An MTJ structure including the tunnel barrier layer, free layer and second electrode is defined above the first interconnect metallization by a first mask. A first passivation layer encapsulates the MTJ structure, leaving the second electrode exposed. A third electrode is deposited in contact with the second electrode. A second mask is used to pattern a larger structure including the third electrode, the first passivation layer, the fixed magnetization layer and the first electrode. A second dielectric passivation layer covers the etched plurality of layers, the first interlevel dielectric layer and the first interconnect metallization.

    摘要翻译: 使用两个掩模形成用于磁性随机存取存储器(MRAM)的磁性隧道结(MTJ)的方法包括在包含暴露的第一互连金属化的层间介质层上沉积,第一电极,固定磁化层,隧道势垒层, 自由磁化层和第二电极。 包括隧道势垒层,自由层和第二电极的MTJ结构通过第一掩模限定在第一互连金属化之上。 第一钝化层封装MTJ结构,留下第二电极。 沉积与第二电极接触的第三电极。 使用第二掩模来图案化包括第三电极,第一钝化层,固定磁化层和第一电极的较大结构。 第二电介质钝化层覆盖被蚀刻的多个层,第一层间介质层和第一互连金属化层。

    Magnetic element with storage layer materials
    33.
    发明授权
    Magnetic element with storage layer materials 有权
    磁性元件与存储层材料

    公开(公告)号:US08536669B2

    公开(公告)日:2013-09-17

    申请号:US12352648

    申请日:2009-01-13

    IPC分类号: H01L29/82 G11B5/33 G11C11/02

    摘要: According to an embodiment of the invention, a magnetic tunnel junction (MTJ) element includes a reference ferromagnetic layer, a storage ferromagnetic layer, and an insulating layer. The storage ferromagnetic layer includes a CoFeB sub-layer coupled to a CoFe sub-layer and/or a NiFe sub-layer through a non-magnetic sub-layer. The insulating layer is disposed between the reference and storage ferromagnetic layers.

    摘要翻译: 根据本发明的实施例,磁性隧道结(MTJ)元件包括参考铁磁层,存储铁磁层和绝缘层。 存储铁磁层包括通过非磁性子层耦合到CoFe子层和/或NiFe子层的CoFeB子层。 绝缘层设置在参考和存储铁磁层之间。

    Magnetic random access memory
    34.
    发明授权
    Magnetic random access memory 有权
    磁性随机存取存储器

    公开(公告)号:US08421137B2

    公开(公告)日:2013-04-16

    申请号:US12769353

    申请日:2010-04-28

    摘要: A device includes a magnetic tunnel junction (MTJ) structure and a cap layer in contact with the MTJ structure. The device also includes a spin-on material layer in contact with a sidewall portion of the cap layer and a conducting layer in contact with at least the spin-on material layer and a portion of the MTJ structure. The cap layer has been etched to expose a portion of an electrode contact layer of the MTJ structure. The conducting layer is in electrical contact with the exposed portion of the electrode contact layer of the MTJ structure.

    摘要翻译: 一种装置包括磁隧道结(MTJ)结构和与MTJ结构接触的盖层。 该装置还包括与盖层的侧壁部分接触的旋涂材料层和与至少旋涂材料层和MTJ结构的一部分接触的导电层。 已经蚀刻了盖层以暴露MTJ结构的电极接触层的一部分。 导电层与MTJ结构的电极接触层的暴露部分电接触。

    Configurable Memory Array
    35.
    发明申请
    Configurable Memory Array 有权
    可配置内存阵列

    公开(公告)号:US20120218805A1

    公开(公告)日:2012-08-30

    申请号:US13034763

    申请日:2011-02-25

    摘要: Embodiments disclosed include a memory array having a plurality of bit lines and a plurality of source lines disposed in columns. A plurality of word lines is disposed in rows. A plurality of storage elements have a first subset of storage elements electrically decoupled from the memory array and a second subset of storage elements coupled to the memory array. The memory array further includes a plurality of bit cells, each including one storage element from the second subset of storage elements coupled to at least two transistors. The bit cells are coupled to the plurality of bit lines and the plurality source lines. Each transistor is coupled to one word line. The memory array can further include logic to select a high performance mode and a high density mode.

    摘要翻译: 所公开的实施例包括具有多个位线和多个排列成列的源极线的存储器阵列。 多行字线被排列成行。 多个存储元件具有与存储器阵列电分离的存储元件的第一子集和耦合到存储器阵列的存储元件的第二子集。 存储器阵列还包括多个位单元,每个位单元包括来自耦合到至少两个晶体管的存储元件的第二子集的一个存储元件。 位单元耦合到多个位线和多个源极线。 每个晶体管耦合到一个字线。 存储器阵列还可以包括选择高性能模式和高密度模式的逻辑。

    Magnetic Element With Storage Layer Materials
    36.
    发明申请
    Magnetic Element With Storage Layer Materials 有权
    磁性元素与存储层材料

    公开(公告)号:US20100176471A1

    公开(公告)日:2010-07-15

    申请号:US12352648

    申请日:2009-01-13

    IPC分类号: H01L29/82 H01L21/00

    摘要: According to an embodiment of the invention, a magnetic tunnel junction (MTJ) element includes a reference ferromagnetic layer, a storage ferromagnetic layer, and an insulating layer. The storage ferromagnetic layer includes a CoFeB sub-layer coupled to a CoFe sub-layer and/or a NiFe sub-layer through a non-magnetic sub-layer. The insulating layer is disposed between the reference and storage ferromagnetic layers.

    摘要翻译: 根据本发明的实施例,磁性隧道结(MTJ)元件包括参考铁磁层,存储铁磁层和绝缘层。 存储铁磁层包括通过非磁性子层耦合到CoFe子层和/或NiFe子层的CoFeB子层。 绝缘层设置在参考和存储铁磁层之间。

    Non-volatile memory array configurable for high performance and high density
    37.
    发明授权
    Non-volatile memory array configurable for high performance and high density 有权
    非易失性存储器阵列可配置为高性能和高密度

    公开(公告)号:US08587982B2

    公开(公告)日:2013-11-19

    申请号:US13034763

    申请日:2011-02-25

    IPC分类号: G11C5/06

    摘要: Embodiments include a memory array having a plurality of bit lines and a plurality of source lines disposed in columns. A plurality of word lines is disposed in rows. A plurality of storage elements have a first subset of storage elements electrically decoupled from the memory array and a second subset of storage elements coupled to the memory array. The memory array further includes a plurality of bit cells, each including one storage element from the second subset of storage elements coupled to at least two transistors. The bit cells are coupled to the plurality of bit lines and the plurality source lines. Each transistor is coupled to one word line. The memory array can further include logic to select a high performance mode and a high density mode.

    摘要翻译: 实施例包括具有多个位线和多个排列成列的源极线的存储器阵列。 多行字线被排列成行。 多个存储元件具有与存储器阵列电分离的存储元件的第一子集和耦合到存储器阵列的存储元件的第二子集。 存储器阵列还包括多个位单元,每个位单元包括来自耦合到至少两个晶体管的存储元件的第二子集的一个存储元件。 位单元耦合到多个位线和多个源极线。 每个晶体管耦合到一个字线。 存储器阵列还可以包括选择高性能模式和高密度模式的逻辑。

    Magnetic Tunnel Junction (MTJ) and Methods, and Magnetic Random Access Memory (MRAM) Employing Same
    39.
    发明申请
    Magnetic Tunnel Junction (MTJ) and Methods, and Magnetic Random Access Memory (MRAM) Employing Same 有权
    磁隧道结(MTJ)和方法,以及使用相同的磁性随机存取存储器(MRAM)

    公开(公告)号:US20100258887A1

    公开(公告)日:2010-10-14

    申请号:US12423298

    申请日:2009-04-14

    IPC分类号: H01L29/82 H01L21/00

    摘要: Magnetic tunnel junctions (MTJs) and methods of forming same are disclosed. A pinned layer is disposed in the MTJ such that a free layer of the MTJ can couple to a drain of an access transistor when provided in a magnetic random access memory (MRAM) bitcell. This structure alters the write current flow direction to align the write current characteristics of the MTJ with write current supply capability of an MRAM bitcell employing the MTJ. As a result, more write current can be provided to switch the MTJ from a parallel (P) to anti-parallel (AP) state. An anti-ferromagnetic material (AFM) layer is provided on the pinned layer to fix pinned layer magnetization. To provide enough area for depositing the AFM layer to secure pinned layer magnetization, a pinned layer having a pinned layer surface area greater than a free layer surface area of the free layer is provided.

    摘要翻译: 公开了磁隧道结(MTJ)及其形成方法。 被钉扎层设置在MTJ中,使得当提供在磁性随机存取存储器(MRAM)位单元中时,MTJ的自由层可以耦合到存取晶体管的漏极。 该结构改变写入电流流动方向,以使MTJ的写入电流特性与使用MTJ的MRAM位单元的写入电流供应能力对准。 结果,可以提供更多的写入电流以将MTJ从并行(P)切换到反并行(AP)状态。 在钉扎层上提供反铁磁材料(AFM)层以固定钉扎层的磁化强度。 为了提供足够的用于沉积AFM层以确保钉扎层磁化的区域,提供了具有大于自由层的自由层表面积的钉扎层表面积的钉扎层。

    Reducing Spin Pumping Induced Damping of a Free Layer of a Memory Device
    40.
    发明申请
    Reducing Spin Pumping Induced Damping of a Free Layer of a Memory Device 有权
    减少旋转泵送引起的存储器件自由层的阻尼

    公开(公告)号:US20100074092A1

    公开(公告)日:2010-03-25

    申请号:US12236956

    申请日:2008-09-24

    IPC分类号: G11B9/00

    摘要: A system and method of reducing spin pumping induced damping of a free layer of a memory device is disclosed. The memory device includes an anti-ferromagnetic material (AFM) pinning layer in contact with a bit line access electrode. The memory device also includes a pinned layer in contact with the AFM pinning layer, a tunnel barrier layer in contact with the pinned layer, and a free layer in contact with the tunnel barrier layer. The memory device includes a spin torque enhancing layer in contact with the free layer and in contact with an access transistor electrode. The spin torque enhancing layer is configured to substantially reduce spin pumping induced damping of the free layer.

    摘要翻译: 公开了一种降低自旋泵送诱发的存储器件自由层阻尼的系统和方法。 存储器件包括与位线接入电极接触的反铁磁材料(AFM)钉扎层。 存储器件还包括与AFM钉扎层接触的钉扎层,与钉扎层接触的隧道势垒层和与隧道势垒层接触的自由层。 存储器件包括与自由层接触并与存取晶体管电极接触的自旋转矩增强层。 自旋扭矩增强层被配置为基本上减少自由层的自旋泵送引起的阻尼。