LnCuO(S,Se,Te)monocrystalline thin film, its manufacturing method, and optical device or electronic device using the monocrystalline thin film
    44.
    发明授权
    LnCuO(S,Se,Te)monocrystalline thin film, its manufacturing method, and optical device or electronic device using the monocrystalline thin film 有权
    LnCuO(S,Se,Te)单晶薄膜,其制造方法,以及使用单晶薄膜的光学器件或电子器件

    公开(公告)号:US07323356B2

    公开(公告)日:2008-01-29

    申请号:US10505219

    申请日:2003-02-19

    IPC分类号: H01L21/06 C30B1/02 C04B35/50

    摘要: Disclosed is a method of producing an LnCuOX single-crystal thin film (wherein Ln is at least one selected from the group consisting of lanthanide elements and yttrium, and X is at least one selected from the group consisting of S, Se and Te), which comprises the steps of growing a base thin film on a single-crystal substrate, depositing an amorphous or polycrystalline LnCuOX thin film on the base thin film to form a laminated film, and then annealing the laminated film at a high temperature of 500° C. or more. While a conventional LnCuOX film produced by growing an amorphous film through a sputtering process under appropriate conditions and then annealing the film at a high temperature was unexceptionally a polycrystalline substance incapable of achieving high emission efficiency and electron mobility required for a material of light-emitting devices or electronic devices, the method of the present invention can grow a thin film with excellent crystallinity suitable as a single crystal to an building black of light-emitting diodes, semiconductor leasers, filed-effect transistors, or a hetero-bipolar transistors.

    摘要翻译: 公开了一种LnCuOX单晶薄膜的制造方法(其中Ln为选自镧系元素和钇中的至少一种,X为选自S,Se和Te中的至少一种), 其包括以下步骤:在单晶衬底上生长基底薄膜,在基底薄膜上沉积非晶或多晶LnCuOX薄膜以形成层压膜,然后在500℃的高温下对层压膜进行退火 。 或者更多。 虽然通过在适当条件下通过溅射工艺生长非晶膜然后在高温下退火膜而制备的常规LnCuOX膜通常是不能实现发光器件材料所需的高发射效率和电子迁移率的多晶物质 或电子器件,本发明的方法可以将适合作为单晶的优异结晶度的薄膜生长到发光二极管,半导体雷达,场效应晶体管或异质双极晶体管的建筑物黑色。

    Natural-superlattice homologous single crystal thin film, method for preparation thereof, and device using said single crystal thin film
    46.
    发明授权
    Natural-superlattice homologous single crystal thin film, method for preparation thereof, and device using said single crystal thin film 有权
    天然超晶格同源单晶薄膜,其制备方法和使用所述单晶薄膜的器件

    公开(公告)号:US07061014B2

    公开(公告)日:2006-06-13

    申请号:US10494247

    申请日:2002-10-31

    IPC分类号: H01L29/10 H01L29/12

    摘要: Disclosed is a natural-superlattice homologous single-crystal thin film, which includes a complex oxide which is epitaxially grown on either one of a ZnO epitaxial thin film formed on a single-crystal substrate, the single-crystal substrate after disappearance of the ZnO epitaxial thin film and a ZnO single crystal. The complex oxide is expressed by the formula: M1M2O3 (ZnO)m, wherein M1 is at least one selected from the group consisting of Ga, Fe, Sc, In, Lu, Yb, Tm, Er, Ho and Y, M2 is at least one selected from the group consisting of Mn, Fe, Ga, In and Al, and m is a natural number of 1 or more. A natural-superlattice homologous single-crystal thin film formed by depositing the complex oxide and subjecting the obtained layered film to a thermal anneal treatment can be used in optimal devices, electronic devices and X-ray optical devices.

    摘要翻译: 公开了一种天然超晶格同源单晶薄膜,其包括外延生长在单晶衬底上形成的ZnO外延薄膜之一上的复合氧化物,ZnO外延消失后的单晶衬底 薄膜和ZnO单晶。 复合氧化物由下式表示:其中M(M)2 O 3(ZnO)m,其中M 至少一种选自Ga,Fe,Sc,In,Lu,Yb,Tm,Er,Ho和Y中的至少一种,M 2至少为 选自Mn,Fe,Ga,In和Al中的一种,m为1以上的自然数。 通过沉积复合氧化物并使得到的层状膜进行热退火处理而形成的天然超晶格同晶单晶薄膜可以用于最佳器件,电子器件和X射线光学器件中。

    Integrated circuits utilizing amorphous oxides
    48.
    发明授权
    Integrated circuits utilizing amorphous oxides 有权
    采用无定形氧化物的集成电路

    公开(公告)号:US08203146B2

    公开(公告)日:2012-06-19

    申请号:US12882404

    申请日:2010-09-15

    IPC分类号: H01L31/20

    CPC分类号: H01L29/7869

    摘要: Semiconductor devices and circuits with use of transparent oxide film are provided. The semiconductor device having a P-type region and an N-type region, wherein amorphous oxides with electron carrier concentration less than 1018/cm3 is used for the N-type region.

    摘要翻译: 提供了使用透明氧化膜的半导体器件和电路。 具有P型区域和N型区域的半导体器件,其中电子载流子浓度小于1018 / cm3的非晶形氧化物用于N型区域。