Abstract:
At least one example embodiment discloses a method of soft-decision Wu decoding a code. The code is one of a generalized Reed-Solomon type and an alternant type. The method includes obtaining a module of the code. The module is a sub-module of at least a first extension module and a second extension module. The first extension module is defined by a set of first type constraints and the second extension module is defined by a set of second type constraints. The first type constraints are applicable to a first interpolation algorithm and a second interpolation algorithm and the second type constraints are applicable to the first interpolation algorithm. The method further includes determining a basis for the first extension module and converting the basis for the first extension module to a basis for the module.
Abstract:
A memory device includes a memory including memory cells, each of the memory cells being configured to store multiple bits of data. The memory device includes a controller configured to map the levels of the memory cells to bits such that a first half of the levels have a bit with a first binary value in a desired bit position and a second half of the levels have a bit with a second binary value in the desired bit position. The first half of the levels are a first group of consecutive levels, and the second half of the levels are a second group of consecutive levels. The controller is configured to generate a distribution for writing the data to the memory cells based on the mapping, and write the data to the memory cells based on the determined distribution.
Abstract:
A resistive memory system having a plurality of memory cells includes a memory device having a resistive memory cell array and a controller. The controller generates write data to be written to the memory cell array by encoding input data such that the input data corresponds to an erase state and a plurality of programming states that a memory cell may have. The input data is encoded such that at least one of the number of memory cells assigned a first programming state and the number of memory cells assigned a second programming state is smaller than at least one of the numbers of memory cells in the erase state and the other programming states. The first programming state has a highest resistance level among the plurality of programming states, and the second programming state has a second highest resistance level among the plurality of programming states.
Abstract:
A method of operating a memory controller includes receiving a first data sequence and generating a coset representative sequence that can be divided into m-bit strings, where “m” is a natural number of at least 2; performing a first XOR operation on each of the m-bit strings in the coset representative sequence and binary bits; calculating all possible branch metrics according to a result of the first XOR operation; determining a survivor path sequence based on the all possible branch metrics; and performing a second XOR operation on the coset representative sequence and the survivor path sequence and generating an output sequence.
Abstract:
A storage device including, a plurality of non-volatile memories configured to include a memory cell region including at least one first metal pad; and a peripheral circuit region including at least one second metal pad and vertically connected to the memory cell region by the at least one first metal pad and the at least one second metal pad, and a controller connected to the plurality of non-volatile memories through a plurality of channels and configured to control the plurality of non-volatile memories, wherein the controller selects one of a first read operation mode and a second read operation mode and transfers a read command corresponding to the selected read operation mode to the plurality of non-volatile memories, wherein one sensing operation is performed to identify one program state among program sates in the first read operation mode, and wherein at least two sensing operations are performed to identify the one program state among the program states in the second read operation mode.
Abstract:
A storage device including, a plurality of non-volatile memories configured to include a memory cell region including at least one first metal pad; and a peripheral circuit region including at least one second metal pad and vertically connected to the memory cell region by the at least one first metal pad and the at least one second metal pad, and a controller connected to the plurality of non-volatile memories through a plurality of channels and configured to control the plurality of non-volatile memories, wherein the controller selects one of a first read operation mode and a second read operation mode and transfers a read command corresponding to the selected read operation mode to the plurality of non-volatile memories, wherein one sensing operation is performed to identify one program state among program sates in the first read operation mode, and wherein at least two sensing operations are performed to identify the one program state among the program states in the second read operation mode.
Abstract:
A non-volatile memory device including: a page buffer configured to latch a plurality of page data constituting one bit page of a plurality of bit pages, and a control logic configured to compare results of a plurality of read operations performed in response to a high-priority read signal set to select one of a plurality of read signals included in the high-priority read signal set as a high-priority read signal, and determine a low-priority read signal corresponding to the high-priority read signal, wherein the high-priority read signal set is for reading high-priority page data, and the low-priority read signal is for reading low-priority page data.
Abstract:
Disclosed are a semiconductor memory device, a controller, and a memory system. The semiconductor memory device includes a memory cell array including a plurality of memory cells, and an error correcting code (ECC) decoder configured to receive first data and a parity output from selected memory cells of the memory cell array. The ECC decoder generates a syndrome based on the first data and the parity, generates a decoding status flag (DSF) indicating a type of an error of the first data by the syndrome, and outputs the second data and the DSF to an external device outside of the semiconductor memory device when a read operation of the semiconductor memory device is performed.
Abstract:
A non-volatile memory device including: a page buffer configured to latch a plurality of page data constituting one bit page of a plurality of bit pages, and a control logic configured to compare results of a plurality of read operations performed in response to a high-priority read signal set to select one of a plurality of read signals included in the high-priority read signal set as a high-priority read signal, and determine a low-priority read signal corresponding to the high-priority read signal, wherein the high-priority read signal set is for reading high-priority page data, and the low-priority read signal is for reading low-priority page data.
Abstract:
A method of encoding generalized concatenated error-correcting codes includes providing a parity matrix {tilde over (H)}j of a j-th layer code and predefined syndrome {tilde over (s)} of length n−{tilde over (k)}j, where the first n-kl coordinates are zero, n is a length of a codeword c of a first layer BCH code Cl of dimension {tilde over (k)}j, codeword c satisfies {tilde over (H)}jc={tilde over (s)}, a first layer code includes only a BCH code, and each subsequent layer includes a Reed-Solomon (RS) stage followed by a BCH code; finding a square matrix R, of dimension (n−{tilde over (k)}j)(n−{tilde over (k)}j) such that Rj{tilde over (H)}j=(A|I), where A is an arbitrary matrix, Rj=(Qj|Tj), where Q has n−kl columns Tj and has k1−{tilde over (k)}j columns; finding a vector c−(a b) where a is a vector of length {tilde over (k)}j and b is a vector of length n−{tilde over (k)}j; and solving ( A | I ) ( a b ) = ( Q j | T j ) s ~ = T j s where a = 0 and b = T j s , where a=0 and b=Tjs, and codeword c is nonzero only on the last n−{tilde over (k)}j=n−kj bits.