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公开(公告)号:US20050286336A1
公开(公告)日:2005-12-29
申请号:US10641210
申请日:2003-08-13
Applicant: Eliyahou Harari , Robert Norman , Sanjay Mehrotra
Inventor: Eliyahou Harari , Robert Norman , Sanjay Mehrotra
IPC: G11C16/02 , G06F3/06 , G06F11/10 , G06F12/00 , G06F12/02 , G06F12/08 , G06F12/12 , G06F12/16 , G11C5/00 , G11C8/02 , G11C8/12 , G11C11/56 , G11C16/06 , G11C16/10 , G11C16/16 , G11C16/34 , G11C17/00 , G11C29/00 , G11C29/04 , G11C29/26 , G11C29/34 , G11C29/52 , H01L21/82 , H01L21/8247 , H01L27/115 , H01L29/788 , H01L29/792
CPC classification number: G11C29/26 , G06F3/0601 , G06F3/0616 , G06F3/064 , G06F3/0652 , G06F3/0679 , G06F3/068 , G06F3/0688 , G06F11/1068 , G06F12/0246 , G06F12/0802 , G06F12/0804 , G06F12/0866 , G06F12/0875 , G06F12/123 , G06F2003/0694 , G06F2212/2022 , G06F2212/312 , G06F2212/7201 , G06F2212/7203 , G06F2212/7205 , G06F2212/7207 , G06F2212/7208 , G11C7/1039 , G11C8/12 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/00 , G11C29/34 , G11C29/52 , G11C29/765 , G11C29/82 , G11C2211/5621 , G11C2211/5634 , G11C2211/5643 , G11C2216/18
Abstract: A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.
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公开(公告)号:US06914846B2
公开(公告)日:2005-07-05
申请号:US10331081
申请日:2002-12-26
Applicant: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
Inventor: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
IPC: G11C16/02 , G06F3/06 , G06F11/10 , G06F12/00 , G06F12/02 , G06F12/08 , G06F12/12 , G06F12/16 , G11C5/00 , G11C8/02 , G11C8/12 , G11C11/56 , G11C16/06 , G11C16/10 , G11C16/16 , G11C16/34 , G11C17/00 , G11C29/00 , G11C29/04 , G11C29/26 , G11C29/34 , G11C29/52 , H01L21/82 , H01L21/8247 , H01L27/115 , H01L29/788 , H01L29/792 , G11C8/00 , G11C7/00 , G11C16/04
CPC classification number: G11C29/26 , G06F3/0601 , G06F3/0616 , G06F3/064 , G06F3/0652 , G06F3/0679 , G06F3/068 , G06F3/0688 , G06F11/1068 , G06F12/0246 , G06F12/0802 , G06F12/0804 , G06F12/0866 , G06F12/0875 , G06F12/123 , G06F2003/0694 , G06F2212/2022 , G06F2212/312 , G06F2212/7201 , G06F2212/7203 , G06F2212/7205 , G06F2212/7207 , G06F2212/7208 , G11C7/1039 , G11C8/12 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/00 , G11C29/34 , G11C29/52 , G11C29/765 , G11C29/82 , G11C2211/5621 , G11C2211/5634 , G11C2211/5643 , G11C2216/18
Abstract: A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.
Abstract translation: 具有控制电路的闪存EEprom存储器芯片的系统用作诸如由磁盘驱动器提供的非易失性存储器。 改进包括选择性多扇区擦除,其中Flash扇区的任何组合可以一起被擦除。 所选组合中的选择扇区也可以在擦除操作期间被取消选择。 另一个改进是使用替代细胞重新映射和替换有缺陷的细胞的能力。 一旦检测到有缺陷的单元,就会自动执行重新映射。 当Flash扇区的缺陷数量变大时,整个扇区被重新映射。 另一个改进是使用写高速缓存来减少写入闪存EEPROM存储器的数量,从而最小化对器件进行过多写/擦循环的应力。
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公开(公告)号:US06747941B2
公开(公告)日:2004-06-08
申请号:US10373751
申请日:2003-02-27
Applicant: Hitoshi Miwa , Hiroaki Kotani
Inventor: Hitoshi Miwa , Hiroaki Kotani
IPC: G11C1134
CPC classification number: G11C16/32 , G11C7/1006 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C16/3427 , G11C16/3431 , G11C16/3454 , G11C16/3459 , G11C2211/5621 , G11C2211/5641 , G11C2211/5642 , G11C2211/5643 , G11C2211/5647 , G11C2211/565
Abstract: A non volatile memory apparatus including a control circuit, plural terminals having clock, command and other terminals, plural nonvolatile memory cells, and first and second volatile memories. The clock and command terminals respectively receive a first clock signal and commands including read and program commands. In response to the read command, the control circuit controls reading data from the memory cells, stores read data to the second volatile memory, transfers data to first volatile memory, and outputs data via the other terminal except the command terminal in response to the first clock signal. In response to the program command, the control circuit controls receiving data via the other terminal except the command terminal in response to the first clock signal, stores received data to the first volatile memory, transfers data to the second volatile memory, and writes data to the memory cells.
Abstract translation: 一种非易失性存储装置,包括控制电路,具有时钟,命令和其他终端的多个终端,多个非易失性存储单元以及第一和第二易失性存储器。 时钟和命令终端分别接收第一时钟信号和包括读取和编程命令的命令。 响应于读取命令,控制电路控制从存储器单元读取数据,将读取的数据存储到第二易失性存储器,将数据传送到第一易失性存储器,并且响应于第一可变存储器,经由除命令终端之外的另一终端输出数据 时钟信号。 响应于程序命令,控制电路响应于第一时钟信号控制除了命令终端之外的另一终端的接收数据,将接收的数据存储到第一易失性存储器,将数据传送到第二易失性存储器,并将数据写入 记忆细胞。
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公开(公告)号:US20040080988A1
公开(公告)日:2004-04-29
申请号:US09759119
申请日:2001-01-11
Applicant: SanDisk Corporation
Inventor: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
IPC: G11C007/00
CPC classification number: G11C29/26 , G06F3/0601 , G06F3/0616 , G06F3/064 , G06F3/0652 , G06F3/0679 , G06F3/068 , G06F3/0688 , G06F11/1068 , G06F12/0246 , G06F12/0802 , G06F12/0804 , G06F12/0866 , G06F12/0875 , G06F12/123 , G06F2003/0694 , G06F2212/2022 , G06F2212/312 , G06F2212/7201 , G06F2212/7203 , G06F2212/7205 , G06F2212/7207 , G06F2212/7208 , G11C7/1039 , G11C8/12 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/00 , G11C29/34 , G11C29/52 , G11C29/765 , G11C29/82 , G11C2211/5621 , G11C2211/5634 , G11C2211/5643 , G11C2216/18
Abstract: A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.
Abstract translation: 具有控制电路的闪存EEprom存储器芯片的系统用作诸如由磁盘驱动器提供的非易失性存储器。 改进包括选择性多扇区擦除,其中Flash扇区的任何组合可以一起被擦除。 所选组合中的选择扇区也可以在擦除操作期间被取消选择。 另一个改进是使用替代细胞重新映射和替换有缺陷的细胞的能力。 一旦检测到有缺陷的单元,就会自动执行重新映射。 当Flash扇区的缺陷数量变大时,整个扇区被重新映射。 另一个改进是使用写高速缓存来减少写入闪存EEPROM存储器的数量,从而最小化对器件进行过多写/擦循环的应力。
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公开(公告)号:US20040057310A1
公开(公告)日:2004-03-25
申请号:US10664977
申请日:2003-09-22
Applicant: Kabushiki Kaisha Toshiba
Inventor: Koji Hosono , Hiroshi Nakamura , Ken Takeuchi , Kenichi Imamiya
IPC: G11C007/00
CPC classification number: G11C16/0483 , G11C5/145 , G11C7/1006 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C11/5642 , G11C16/10 , G11C16/24 , G11C16/26 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C2211/5621 , G11C2211/5641 , G11C2211/5642 , G11C2211/5643
Abstract: A non-volatile semiconductor device has a memory cell array having electrically erasable programmable non-volatile memory cells, reprogramming and retrieval circuits that temporarily store data to be programmed in the memory cell array and sense data retrieved from the memory cell array. Each reprogramming and retrieval circuit has a first latch and a second latch that are selectively connected to the memory cell array and transfer data each other. A controller controls the reprogramming and retrieval circuits on data-reprogramming operation to and data-retrieval operation from the memory cell array. Each reprogramming and retrieval circuit has a multilevel logical operation mode and a caching operation mode. In the multilevel logical operation mode, re-programming and retrieval of upper and lower bits of two-bit four-level data is performed using the first and the second latches in storing the two-bit four-level data in one of the memory cells in a predetermined threshold level range. In the caching operation mode, data transfer between one of the memory cells selected in accordance with a first address and the first latch is performed while data transfer is performed between the second latch and input/output terminals in accordance with a second address with respect to one-bit two-level data to be stored in one of the memory cells.
Abstract translation: 非易失性半导体器件具有存储单元阵列,其具有电可擦除可编程非易失性存储器单元,重新编程和检索电路,其临时存储要存储在存储单元阵列中的要编程的数据并感测从存储器单元阵列检索的数据。 每个重新编程和检索电路具有选择性地连接到存储单元阵列并且彼此传送数据的第一锁存器和第二锁存器。 一个控制器控制重新编程和检索电路的数据重新编程操作和数据检索操作从存储单元阵列。 每个重新编程和检索电路都具有多级逻辑操作模式和缓存操作模式。 在多级逻辑操作模式中,使用第一和第二锁存器在存储单元之一中存储两位四电平数据来执行二位四电平数据的高位和低位的重新编程和检索 在预定的阈值电平范围内。 在高速缓存操作模式中,根据第一地址选择的存储器单元之一和第一锁存器之间的数据传输是在第二锁存器和输入/输出端子之间根据第二地址相对于 要存储在其中一个存储单元中的一位二电平数据。
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公开(公告)号:US06684345B2
公开(公告)日:2004-01-27
申请号:US10330455
申请日:2002-12-26
Applicant: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
Inventor: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
IPC: G06F1100
CPC classification number: G11C29/26 , G06F3/0601 , G06F3/0616 , G06F3/064 , G06F3/0652 , G06F3/0679 , G06F3/068 , G06F3/0688 , G06F11/1068 , G06F12/0246 , G06F12/0802 , G06F12/0804 , G06F12/0866 , G06F12/0875 , G06F12/123 , G06F2003/0694 , G06F2212/2022 , G06F2212/312 , G06F2212/7201 , G06F2212/7203 , G06F2212/7205 , G06F2212/7207 , G06F2212/7208 , G11C7/1039 , G11C8/12 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/00 , G11C29/34 , G11C29/52 , G11C29/765 , G11C29/82 , G11C2211/5621 , G11C2211/5634 , G11C2211/5643 , G11C2216/18
Abstract: A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.
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公开(公告)号:US20030016557A1
公开(公告)日:2003-01-23
申请号:US10223370
申请日:2002-08-20
Inventor: Hitoshi Miwa , Hiroaki Kotani
IPC: G11C011/34
CPC classification number: G11C16/32 , G11C7/1006 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C16/3427 , G11C16/3431 , G11C16/3454 , G11C16/3459 , G11C2211/5621 , G11C2211/5641 , G11C2211/5642 , G11C2211/5643 , G11C2211/5647 , G11C2211/565
Abstract: At the data programming time, data of a plurality of bits are transformed by a data transforming logic circuit into data (multi-value data) according to the combination of the bits, and the transformed data are sequentially transferred to a latch circuit connected to the bit lines of a memory array. A program pulse is generated according to the data latched in the latch circuit and is applied to a memory element of a selected state correspondingly to the multi-value data. At the data reading operation, the states of the memory elements are read out by changing the read voltage to intermediate values of the individual threshold values and are transferred to and latched in a register for storing the multi-value data, so that the original data may be restored by a data inverse transforming logic circuit on the basis of the multi-value data stored in the register. As a result, the peripheral circuit scale of the memory array can be suppressed to a relatively small size, and programming operation performed in a short time can be realized.
Abstract translation: 在数据编程时,根据比特的组合,由数据变换逻辑电路将多个比特的数据变换为数据(多值数据),并将变换后的数据依次传送到与 存储器阵列的位线。 根据锁存在锁存电路中的数据产生编程脉冲,并将其应用于与多值数据对应的选择状态的存储元件。 在数据读取操作中,通过将读取的电压改变为各个阈值的中间值来读出存储元件的状态,并将其传送到并存储在用于存储多值数据的寄存器中,使得原始数据 可以通过基于存储在寄存器中的多值数据的数据逆变换逻辑电路来恢复。 结果,可以将存储器阵列的外围电路规模抑制到相对小的尺寸,并且可以实现在短时间内执行的编程操作。
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公开(公告)号:US06366495B2
公开(公告)日:2002-04-02
申请号:US09817021
申请日:2001-03-27
Applicant: Hitoshi Miwa , Hiroaki Kotani
Inventor: Hitoshi Miwa , Hiroaki Kotani
IPC: G11C1134
CPC classification number: G11C16/32 , G11C7/1006 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C16/3427 , G11C16/3431 , G11C16/3454 , G11C16/3459 , G11C2211/5621 , G11C2211/5641 , G11C2211/5642 , G11C2211/5643 , G11C2211/5647 , G11C2211/565
Abstract: At the data programming, plural data bit is transformed by a data transforming logic circuit into multi-value data according to the combination of bits, and the transformed data are sequentially transferred to a latch circuit connected to bit lines of a memory array. A program pulse is generated according to the latched data and is applied to a memory element at a state corresponding to the multi-value data. During data reading, the states of the memory elements are read out by changing the read voltage to intermediate values of individual threshold values and latched in a register. The original data may be restored by a data inverse transforming logic circuit based on the multi-value data stored in the register.
Abstract translation: 在数据编程中,根据比特的组合,将数据变换逻辑电路将多个数据位变换为多值数据,并将变换后的数据依次传送到与存储器阵列的位线连接的锁存电路。 根据锁存的数据产生编程脉冲,并以对应于多值数据的状态将其应用于存储元件。 在数据读取期间,通过将读取的电压改变为各个阈值的中间值并将其锁存在寄存器中来读出存储器元件的状态。 可以通过基于存储在寄存器中的多值数据的数据逆变换逻辑电路来恢复原始数据。
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公开(公告)号:US20010028576A1
公开(公告)日:2001-10-11
申请号:US09817021
申请日:2001-03-27
Inventor: Hitoshi Miwa , Hiroaki Kotani
IPC: G11C011/34
CPC classification number: G11C16/32 , G11C7/1006 , G11C11/5621 , G11C11/5628 , G11C11/5642 , G11C16/06 , G11C16/10 , G11C16/12 , G11C16/3418 , G11C16/3427 , G11C16/3431 , G11C16/3454 , G11C16/3459 , G11C2211/5621 , G11C2211/5641 , G11C2211/5642 , G11C2211/5643 , G11C2211/5647 , G11C2211/565
Abstract: At the data programming time, data of a plurality of bits are transformed by a data transforming logic circuit into data (multi-value data) according to the combination of the bits, and the transformed data are sequentially transferred to a latch circuit connected to the bit lines of a memory array. A program pulse is generated according to the data latched in the latch circuit and is applied to a memory element of a selected state correspondingly to the multi-value data. At the data reading operation, the states of the memory elements are read out by changing the read voltage to intermediate values of the individual threshold values and are transferred to and latched in a register for storing the multi-value data, so that the original data may be restored by a data inverse transforming logic circuit on the basis of the multi-value data stored in the register. As a result, the peripheral circuit scale of the memory array can be suppressed to a relatively small size, and programming operation performed in a short time can be realized.
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公开(公告)号:US20010026472A1
公开(公告)日:2001-10-04
申请号:US09867836
申请日:2001-05-30
Inventor: Eliyahou Harari , Robert D. Norman , Sanjay Mehrotra
IPC: G11C011/34
CPC classification number: G11C29/26 , G06F3/0601 , G06F3/0616 , G06F3/064 , G06F3/0652 , G06F3/0679 , G06F3/068 , G06F3/0688 , G06F11/1068 , G06F12/0246 , G06F12/0802 , G06F12/0804 , G06F12/0866 , G06F12/0875 , G06F12/123 , G06F2003/0694 , G06F2212/2022 , G06F2212/312 , G06F2212/7201 , G06F2212/7203 , G06F2212/7205 , G06F2212/7207 , G06F2212/7208 , G11C7/1039 , G11C8/12 , G11C11/5621 , G11C11/5628 , G11C11/5635 , G11C16/10 , G11C16/16 , G11C16/3436 , G11C16/344 , G11C16/3445 , G11C16/3454 , G11C16/3459 , G11C29/00 , G11C29/34 , G11C29/52 , G11C29/765 , G11C29/82 , G11C2211/5621 , G11C2211/5634 , G11C2211/5643 , G11C2216/18
Abstract: A system of Flash EEprom memory chips with controlling circuits serves as non-volatile memory such as that provided by magnetic disk drives. Improvements include selective multiple sector erase, in which any combinations of Flash sectors may be erased together. Selective sectors among the selected combination may also be de-selected during the erase operation. Another improvement is the ability to remap and replace defective cells with substitute cells. The remapping is performed automatically as soon as a defective cell is detected. When the number of defects in a Flash sector becomes large, the whole sector is remapped. Yet another improvement is the use of a write cache to reduce the number of writes to the Flash EEprom memory, thereby minimizing the stress to the device from undergoing too many write/erase cycling.
Abstract translation: 具有控制电路的闪存EEprom存储器芯片的系统用作诸如由磁盘驱动器提供的非易失性存储器。 改进包括选择性多扇区擦除,其中Flash扇区的任何组合可以一起被擦除。 所选组合中的选择扇区也可以在擦除操作期间被取消选择。 另一个改进是使用替代细胞重新映射和替换有缺陷的细胞的能力。 一旦检测到有缺陷的单元,就会自动执行重新映射。 当Flash扇区的缺陷数量变大时,整个扇区被重新映射。 另一个改进是使用写高速缓存来减少写入闪存EEPROM存储器的数量,从而最小化对器件进行过多写/擦循环的应力。
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