SYSTEMS AND METHODS FOR ANALYZING A SAMPLE FROM A SURFACE

    公开(公告)号:US20170140912A1

    公开(公告)日:2017-05-18

    申请号:US15318846

    申请日:2015-06-16

    CPC classification number: H01J49/04 H01J49/0013 H01J49/0468 H01J49/24

    Abstract: The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.

    SAMPLE QUANTITATION WITH A MINIATURE MASS SPECTROMETER
    58.
    发明申请
    SAMPLE QUANTITATION WITH A MINIATURE MASS SPECTROMETER 审中-公开
    采用微型质谱仪进行样本量化

    公开(公告)号:US20160181077A1

    公开(公告)日:2016-06-23

    申请号:US14909269

    申请日:2014-08-06

    CPC classification number: H01J49/0031 H01J49/0013 H01J49/004 H01J49/0422

    Abstract: The invention generally relates to sample analysis with a miniature mass spectrometer. In certain embodiments, the invention provides methods that involve generating ions of a first analyte and ions of a second analyte. Those ions are transferred through a discontinuous sample introduction interface into a first ion trap of a mass spectrometer in a manner in which the discontinuous sample introduction interface remains open during the transferring. The discontinuous sample introduction interface is closed and the ions are sequentially transferred to a second ion trap of the mass spectrometer where they are sequentially analyzed.

    Abstract translation: 本发明一般涉及使用微型质谱仪的样品分析。 在某些实施方案中,本发明提供涉及产生第一分析物的离子和第二分析物的离子的方法。 这些离子以不连续的样品引入界面在转移期间保持打开的方式通过不连续的样品引入界面转移到质谱仪的第一离子阱中。 关闭不连续的样品引入界面,并将离子顺序地转移到质谱仪的第二离子阱上,在其中依次分析它们。

    Systems and methods for analyzing a sample
    60.
    发明授权
    Systems and methods for analyzing a sample 有权
    用于分析样品的系统和方法

    公开(公告)号:US09129786B2

    公开(公告)日:2015-09-08

    申请号:US14305489

    申请日:2014-06-16

    Abstract: The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides systems for analyzing a sample that include an electric source, a vacuum chamber including a conducting member, in which the conducting member is coupled to the electric source, a sample introduction member coupled to the vacuum chamber, and a mass analyzer. The system is configured such that a distal end of the sample introduction member resides within the vacuum chamber and proximate the conducting member, such that an electrical discharge may be produced between the sample introduction member and the conducting member. A neutral gas that has been introduced into the vacuum chamber interacts with the generated discharge, producing ions within the vacuum chamber that are subsequently transferred into the mass analyzer in the vacuum chamber.

    Abstract translation: 本发明一般涉及用于样品分析的系统和方法。 在某些实施例中,本发明提供了用于分析包括电源的样品,包括导电构件的真空室的系统,其中导电构件耦合到电源,耦合到真空室的样品引入构件和 质量分析仪 该系统构造成使得样品引入构件的远端位于真空室内并且靠近导电构件,使得可以在样品引入构件和导电构件之间产生放电。 已经引入真空室的中性气体与产生的排放物相互作用,在真空室内产生离子,随后将其转移到真空室中的质量分析器中。

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